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This work presents a series of papers examining various aspects of three-dimensional imaging, optical metrology and inspection.
Topics in this volume include: structured light methods; rangefinding methods; and micromeasurements.
This textbook is designed for postgraduate studies in the field of 3D Computer Vision. It also provides a useful reference for industrial practitioners; for example, in the areas of 3D data capture, computer-aided geometric modelling and industrial quality assurance. This second edition is a significant upgrade of existing topics with novel findings. Additionally, it has new material covering consumer-grade RGB-D cameras, 3D morphable models, deep learning on 3D datasets, as well as new applications in the 3D digitization of cultural heritage and the 3D phenotyping of crops. Overall, the book covers three main areas: ● 3D imaging, including passive 3D imaging, active triangulation 3D imaging, active time-of-flight 3D imaging, consumer RGB-D cameras, and 3D data representation and visualisation; ● 3D shape analysis, including local descriptors, registration, matching, 3D morphable models, and deep learning on 3D datasets; and ● 3D applications, including 3D face recognition, cultural heritage and 3D phenotyping of plants. 3D computer vision is a rapidly advancing area in computer science. There are many real-world applications that demand high-performance 3D imaging and analysis and, as a result, many new techniques and commercial products have been developed. However, many challenges remain on how to analyse the captured data in a way that is sufficiently fast, robust and accurate for the application. Such challenges include metrology, semantic segmentation, classification and recognition. Thus, 3D imaging, analysis and their applications remain a highly-active research field that will continue to attract intensive attention from the research community with the ultimate goal of fully automating the 3D data capture, analysis and inference pipeline.
Presenting all the major stages in wafer manufacturing, from crystals to prime wafers. This book first outlines the physics, associated metrology, process modelling and quality requirements and the goes on to discuss wafer forming and wafer surface preparation techniques. The whole is rounded off with a chapter on the research and future challenges in wafer manufacturing.
Due to their speed, data density, and versatility, optical metrology tools play important roles in today's high-speed industrial manufacturing applications. Handbook of Optical Dimensional Metrology provides useful background information and practical examples to help readers understand and effectively use state-of-the-art optical metrology methods
The field of optical metrology offers a wealth of both practical and theoretical accomplishments, and can cite any number of academic papers recording such. However, while several books covering specific areas of optical metrology do exist, until the pages herein were researched, written, and compiled, the field lacked for a comprehensive handbook, one providing an overview of optical metrology that covers practical applications as well as fundamentals. Carefully designed to make information accessible to beginners without sacrificing academic rigor, the Handbook of Optical Metrology: Principles and Applications discusses fundamental principles and techniques before exploring practical applications. With contributions from veterans in the field, as well as from up-and-coming researchers, the Handbook offers 30 substantial and well-referenced chapters. In addition to the introductory matter, forward-thinking descriptions are included in every chapter that make this a valuable reference for all those involved with optical metrology.