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The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
As engineering materials and structures often contain a metal or metallic alloy bonded to a ceramic, the resultant interface must be able to sustain mechanical forces without failure. They also play an important role in oxidation or reduction of materials. The workshop on 'Bonding, Structure and Mechanical Properties of Metal/Ceramic Interfaces' was held in January 1989 within the Acta/Scripta Metallurgica conference series. It drew together an international collection of 70 scientists who discussed a wide range of issues related to metal-ceramic interfaces. The sessions were divided into 7 categories: structure and bonding, chemistry at interfaces, formation of interfaces, structure of interfaces, thermodynamics/atomistics of interface fracture, mechanics of interface cracks, and fracture resistance of bimaterial interfaces. Within these headings attention was paid to grain boundaries, the influence of chemical processes on the behaviour of interfaces, diffusion bonding, characterization of fracture, and crack propagation by fatigue and by stress corrosion. The book presents a useful reference source for materials scientists, physicists, chemists, and mechanical engineers who are concerned with the roles and properties of interfaces.
The book "Interfaces of Ceramic-Matrix Composites" demonstrates the definition, function and type of the interface of ceramic-matrix composites and gives comprehensive investigations on the interface design, interface characterization, interface assessment, and interface damage law of both C/SiC and SiC/SiC ceramic-matrix composites subjected to tensile and fatigue loading at different testing conditions. Thereby, it helps material designers and engineers to better design ceramic-matrix composite components for applications.
Materials that possess low-weight, high-temperature strength and stability in corrosive environments are required for many advanced applications. Among competing materials, ceramic matrix composites (CMCs) are the leading candidates. As with all composite systems, ceramic composites are composed of two of more constituents that must maintain identity and properties in the final structure. In fact, it is the combination of constituent properties that produces the desired mechanical response in these advanced structural materials. This book from MRS focuses on ceramic matrix composites, and offers an interdisciplinary perspective on the many unique challenges in design, processing, characterization and testing that they present. Topics include: reinforcements and matrices; matrix materials and processing; composite processing and properties; testing and design; modeling of interfacial behavior; interface test methodologies; chemical vapor infiltration; experimental verification of interface behavior; modification and control of interface properties; and environmental effects.
The dynamic nature of the microelectronics industry, in particular within the area of packaging, requires a continuous updating and revision of priorities. In an effort to communicate these priorities to researchers and engineers in the field, the National Technology Road Map was developed. This proceedings volume, the eighth in a series on electronic packaging, focuses on the materials research, development and processing issues identified in the road map. Topics include: an overview of the National Technology Road Map for Semiconductors; institutional and industrial perspectives; impact on materials needs and materials science issues; and research responses. Technical subtopics include polymers, ceramics, solder and composites.
This long-standing proceedings series is highly regarded as a premier forum for the discussion of microelectronics reliability issues. In this fifth book, emphasis is on the fundamental understanding of failure phenomena in thin-film materials. Special attention is given to electromigration and mechanical stress effects. The reliability of thin dielectrics and hot carrier degradation of transistors are also featured. Topics include: modeling and simulation of failure mechanisms; reliability issues for submicron IC technologies and packaging; stresses in thin films/lines; gate oxides; barrier layers; electromigration mechanisms; reliability issues for Cu metallizations; electromigration and microstructure; electromigration and stress voiding in circuit interconnects; and resistance measurements of electromigration damage.
Wafer cleaning, microcontamination and surface passivation are the key focus of this proceedings volume, the 3rd in a successful series from MRS. It is a field in which control of surface chemistry and surface morphology, as well as particle and molecular contamination removal, are of critical importance. This volume expands the scope of the topic to include ultraclean technology in a broader sense, emphasizing the identification and characterization of trace contamination, strategies for removal, and equipment considerations, as well as critical limits for impact on devices. Novel processes, such as chemical mechanical polishing (CMP), and their ramifications for contamination removal are also addressed.
A collection of Papers Presented at the 28th International Conference and Exposition on Advanced Ceramics and Composites held in conjunction with the 8th International Symposium on Ceramics in Energy Storage and Power Conversion Systems.
An interdisciplinary discussion of key materials issues and controversies in strained layer epitaxy is presented in this new volume from MRS. Research involving GeSi alloys and Si:C alloys are well represented. In the case of GeSi alloys, utilizing both strained and relaxed structures appears to be a strong component of the current research. Applications, devices and synthesis of improved relaxed and strained materials are featured. Special efforts to integrate the III-V and IV communities were also made during this symposium, and those efforts are reflected in the proceedings volume as well. Results on compositional graded layers in both the GeSi and III-V materials systems are presented. Topics include: general issues; ordering/low dimensional structures; characterization; device applications; growth of Si-based materials; and growth of compound semiconductors.