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Large system complexities and operation under tight timing constraints in rapidly shrinking technologies have made it extremely important to ensure correct temporal behavior of modern-day digital circuits, both before and after fabrication. Research in (pre-fabrication) timing verification and (post-fabrication) delay fault testing has evolved along largely disjoint lines in spite of the fact that they share many basic concepts. A Unified Approach for Timing Verification and Delay Fault Testing applies concepts developed in the context of delay fault testing to path sensitization, which allows an accurate timing analysis mechanism to be developed. This path sensitization strategy is further applied for efficient delay fault diagnosis and delay fault coverage estimation. A new path sensitization strategy called Signal Stabilization Time Analysis (SSTA) has been developed based on the fact that primitive PDFs determine the stabilization time of the circuit outputs. This analysis has been used to develop a feasible method of identifying the primitive PDFs in a general multi-level logic circuit. An approach to determine the maximum circuit delay using this primitive PDF identification mechanism is also presented. The Primitive PDF Identification-based Timing Analysis (PITA) approach is proved to determine the maximum floating mode circuit delay exactly under any component delay model, and provides several advantages over previously floating mode timing analyzers. A framework for the diagnosis of circuit failures caused by distributed path delay faults is also presented. A metric to quantify the diagnosability of a path delay fault for a test is also proposed. Finally, the book presents a very realistic metric for delay fault coverage which accounts for delay fault size distributions and is applicable to any delay fault model. A Unified Approach for Timing Verification and Delay Fault Testing will be of interest to university and industry researchers in timing analysis and delay fault testing as well as EDA tool development engineers and design verification engineers dealing with timing issues in ULSI circuits. The book should also be of interest to digital designers and others interested in knowing the state of the art in timing verification and delay fault testing.
The quest for higher performance digital systems for applications such as gen eral purpose computing, signal/image processing, and telecommunications and an increasing cost consciousness have led to a major thrust for high speed VLSI systems implemented in inexpensive and widely available technologies such as CMOS. This monograph, based on the first author's doctoral dissertation, con centrates on the technique of wave pipelining as one method toward achieving this goal. The primary focus of this monograph is to provide a coherent pre sentation of the theory of wave pipelined operation of digital circuits and to discuss practical design techniques for the realization of wave pipelined circuits in the CMOS technology. Wave pipelining can be applied to a variety of cir cuits for increased performance. For example, many architectures that support systolic computation lend themselves to wave pipelined realization. Also, the wave pipeline design methodology emphasizes the role of controlled clock skew in extracting enhanced performance from circuits that are not deeply pipelined. Wave pipelining (also known as maximal rate pipelining) is a timing method ology used in digital systems to increase the number of effective pipeline stages without increasing the number of physical registers in the pipeline. Using this technique, new data is applied to the inputs of a combinational logic block be fore the outputs due to previous inputs are available thus effectively pipelining the combinational logic and maximizing the utilization of the logic.
Issues for 1973- cover the entire IEEE technical literature.
In the early days of digital design, we were concerned with the logical correctness of circuits. We knew that if we slowed down the clock signal sufficiently, the circuit would function correctly. With improvements in the semiconductor process technology, our expectations on speed have soared. A frequently asked question in the last decade has been how fast can the clock run. This puts significant demands on timing analysis and delay testing. Fueled by the above events, a tremendous growth has occurred in the research on delay testing. Recent work includes fault models, algorithms for test generation and fault simulation, and methods for design and synthesis for testability. The authors of this book, Angela Krstic and Tim Cheng, have personally contributed to this research. Now they do an even greater service to the profession by collecting the work of a large number of researchers. In addition to expounding such a great deal of information, they have delivered it with utmost clarity. To further the reader's understanding many key concepts are illustrated by simple examples. The basic ideas of delay testing have reached a level of maturity that makes them suitable for practice. In that sense, this book is the best x DELAY FAULT TESTING FOR VLSI CIRCUITS available guide for an engineer designing or testing VLSI systems. Tech niques for path delay testing and for use of slower test equipment to test high-speed circuits are of particular interest.
This book is a definitive introduction to models of computation for the design of complex, heterogeneous systems. It has a particular focus on cyber-physical systems, which integrate computing, networking, and physical dynamics. The book captures more than twenty years of experience in the Ptolemy Project at UC Berkeley, which pioneered many design, modeling, and simulation techniques that are now in widespread use. All of the methods covered in the book are realized in the open source Ptolemy II modeling framework and are available for experimentation through links provided in the book. The book is suitable for engineers, scientists, researchers, and managers who wish to understand the rich possibilities offered by modern modeling techniques. The goal of the book is to equip the reader with a breadth of experience that will help in understanding the role that such techniques can play in design.