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Recrystallization is a phenomenon moderately well documented in the geological and metallurgical literature. This book provides a timely overview of the latest research and methods in a variety of fields where recrystallization is studied and is an important factor. The main advantage of a new look at these fields is the rapid increase in modern techniques, such as TEM, spectrometers and modeling capabilities, all of which are providing us with far better images and analysis than ever previously possible. This book will be invaluable to a wide range of research scientists; metallurgists looking to improve properties of alloys, those interested in how the latest equipment may be used to image grains and to all those who work with frozen aqueous solutions where recrystallization may be a problem.
Recrystallization shows selected results obtained during the last few years by scientists who work on recrystallization-related issues. These scientists offer their knowledge from the perspective of a range of scientific disciplines, such as geology and metallurgy. The authors emphasize that the progress in this particular field of science is possible today thanks to the coordinated action of many research groups that work in materials science, chemistry, physics, geology, and other sciences. Thus, it is possible to perform a comprehensive analysis of the scientific problem. The analysis starts from the selection of appropriate techniques and methods of characterization. It is then combined with the development of new tools in diagnostics, and it ends with modeling of phenomena.
This thesis presents a series of mechanical test methods and comprehensively investigates the deformation and damage behavior of Cu/Pb-free solder joints under different loading conditions. The fracture behavior of Pb-free joint interfaces induced by stress, deformation of solder and substrate are shown, the shear fracture strength of the Cu6Sn5 IMC is measured experimentally for the first time, and the dynamic damage process and microstructure evolution behavior of Pb-free solder joints are revealed intuitively. The thesis puts forward the argument that the local cumulative damage is the major cause of failure in solder joints. The research results provide the experimental and theoretical basis for improving the reliability of solder joints.
Presenting papers from the 2013 annual meeting of The Minerals, Metals & Materials Society (TMS), this volume covers developments in all aspects of high temperature electrochemistry, from the fundamental to the empirical and from the theoretical to the applied.
This book provides a comprehensive overview of important aspects of solder materials including solderability and soldering reaction, physical metallurgy, mechanical properties, electromigration, and reliability of solder joint. The scope of this book covers mainly, but not limited to, the important research achievements of all the subjects having been disclosed and discussed in the literatures. It is a very informative book for those who are interested in learning the material properties of solders, carrying out fundamental research, and in carrying out practical applications. This book is an important resource for the various important subjects relating to solder materials.
Interfaces between dissimilar materials are met everywhere in microelectronics and microsystems. In order to ensure faultless operation of these highly sophisticated structures, it is mandatory to have fundamental understanding of materials and their interactions in the system. In this difficult task, the “traditional” method of trial and error is not feasible anymore; it takes too much time and repeated efforts. In Interfacial Compatibility in Microelectronics, an alternative approach is introduced. In this revised method four fundamental disciplines are combined: i) thermodynamics of materials ii) reaction kinetics iii) theory of microstructures and iv) stress and strain analysis. The advantages of the method are illustrated in Interfacial Compatibility in Microelectronics which includes: solutions to several common reliability issues in microsystem technology, methods to understand and predict failure mechanisms at interfaces between dissimilar materials and an approach to DFR based on deep understanding in materials science, rather than on the use of mechanistic tools, such as FMEA. Interfacial Compatibility in Microelectronics provides a clear and methodical resource for graduates and postgraduates alike.
Digital materials are integral to the modern design methods for industrial components and structures, allowing mechanical properties to be predicted from a description of the microstructure and behavior laws of the constituent parts. This book examines a wide range of material properties, from transport phenomena to the mechanics of materials and microstructure changes in physical metallurgy. The fundamental mechanisms of deformation, annealing and damage to materials involve complex atomic processes; these have been explored and studied by numerical simulations, such as molecular dynamics. In contrast to this minutely detailed approach, Digital Materials explores how these mechanisms can instead be integrated into an approach that considers the continuum of the physics and mechanics of materials at the mesoscopic scale. The book thus focuses on the mechanics of continuous media and the continuum thermodynamics of irreversible processes. The models displayed take the myriad properties of different materials into account, in particular their polycrystalline and/or composite natures; this becomes an intermediate step toward establishing effective laws for engineers in the processes of structure calculation and manufacturing.
The Handbook of Silicon Based MEMS Materials and Technologies, Second Edition, is a comprehensive guide to MEMS materials, technologies, and manufacturing that examines the state-of-the-art with a particular emphasis on silicon as the most important starting material used in MEMS. The book explains the fundamentals, properties (mechanical, electrostatic, optical, etc.), materials selection, preparation, manufacturing, processing, system integration, measurement, and materials characterization techniques, sensors, and multi-scale modeling methods of MEMS structures, silicon crystals, and wafers, also covering micromachining technologies in MEMS and encapsulation of MEMS components. Furthermore, it provides vital packaging technologies and process knowledge for silicon direct bonding, anodic bonding, glass frit bonding, and related techniques, shows how to protect devices from the environment, and provides tactics to decrease package size for a dramatic reduction in costs. - Provides vital packaging technologies and process knowledge for silicon direct bonding, anodic bonding, glass frit bonding, and related techniques - Shows how to protect devices from the environment and decrease package size for a dramatic reduction in packaging costs - Discusses properties, preparation, and growth of silicon crystals and wafers - Explains the many properties (mechanical, electrostatic, optical, etc.), manufacturing, processing, measuring (including focused beam techniques), and multiscale modeling methods of MEMS structures - Geared towards practical applications rather than theory
Even though the effect of lead contamination on human health has been known for decades, very little attention has been paid to lead-based solders used in electronics until recently. This comprehensive book examines all the important issues associated with lead-free electronic solder. It collects the work of researchers recognized for their significant scientific contributions in the area.
Interfaces between dissimilar materials are met everywhere in microelectronics and microsystems. In order to ensure faultless operation of these highly sophisticated structures, it is mandatory to have fundamental understanding of materials and their interactions in the system. In this difficult task, the “traditional” method of trial and error is not feasible anymore; it takes too much time and repeated efforts. In Interfacial Compatibility in Microelectronics, an alternative approach is introduced. In this revised method four fundamental disciplines are combined: i) thermodynamics of materials ii) reaction kinetics iii) theory of microstructures and iv) stress and strain analysis. The advantages of the method are illustrated in Interfacial Compatibility in Microelectronics which includes: solutions to several common reliability issues in microsystem technology, methods to understand and predict failure mechanisms at interfaces between dissimilar materials and an approach to DFR based on deep understanding in materials science, rather than on the use of mechanistic tools, such as FMEA. Interfacial Compatibility in Microelectronics provides a clear and methodical resource for graduates and postgraduates alike.