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This book focuses on the history and development of Si(Li) X-Ray Detectors, while providing an up-to-date review of the principles, practical applications, and state of the art of semiconductor x-ray detectors. It describes many of the facets of x-ray detection and measurement using semiconductors, from manufacture to implementation. The initial chapters summarize relevant background physics, materials science, and engineering aspects. Later chapters compare and contrast the manufacture and physical properties of systems and materials currently employed, enabling readers to fully understand the materials and scope for applications.
Hardbound. This book covers the topics essential to gamma- and x-ray spectrometry as it is now practiced with semiconductor detectors in the energy range from 5keV to 3MeV. This includes useful physical and mathematical background information, the components of a standard photon spectrometer, spectrum analysis procedures, the energy and efficiency calibration, energy and emission-rate measurement methods and some application examples.
Choice Recommended Title, July 2020 Bringing together material scattered across many disciplines, Semiconductor Radiation Detectors provides readers with a consolidated source of information on the properties of a wide range of semiconductors; their growth, characterization and the fabrication of radiation sensors with emphasis on the X- and gamma-ray regimes. It explores the promise and limitations of both the traditional and new generation of semiconductors and discusses where the future in semiconductor development and radiation detection may lie. The purpose of this book is two-fold; firstly to serve as a text book for those new to the field of semiconductors and radiation detection and measurement, and secondly as a reference book for established researchers working in related disciplines within physics and engineering. Features: The only comprehensive book covering this topic Fully up-to-date with new developments in the field Provides a wide-ranging source of further reference material
For many applications, compound semiconductors are now viable competitors to elemental semiconductors because of their wide range of physical properties. This book describes all aspects of radiation detection and measurement using compound semiconductors, including crystal growth, detector fabrication, contacting, and spectroscopic performance (with particular emphasis on the X- and gamma-ray regimes). A concentrated reference for researchers in various disciplines as well as graduate students in specialized courses, the text outlines the potential and limitations of semiconductor detectors.
Semiconductor Radiation Detection Systems addresses the state-of-the-art in the design of semiconductor detectors and integrated circuit design, in the context of medical imaging using ionizing radiation. It addresses exciting new opportunities in X-ray detection, Computer Tomography (CT), bone dosimetry, and nuclear medicine (PET, SPECT). In addition to medical imaging, the book explores other applications of semiconductor radiation detection systems in security applications such as luggage scanning, dirty bomb detection, and border control. Features a chapter written by well-known Gamma-Ray Imaging authority Tadayuki Takahashi Assembled by a combination of top industrial experts and academic professors, this book is more than just a product manual. It is practical enough to provide a solid explanation of presented technologies, incorporating material that offers an optimal balance of scientific and academic theory. With less of a focus on math and physical details, the author concentrates more on exploring exactly how technologies are being used. With its combined coverage of new materials and innovative new system approaches, as well as a succinct overview of recent developments, this book is an invaluable tool for any engineer, professional, or student working in electronics or an associated field.
The handbook centers on detection techniques in the field of particle physics, medical imaging and related subjects. It is structured into three parts. The first one is dealing with basic ideas of particle detectors, followed by applications of these devices in high energy physics and other fields. In the last part the large field of medical imaging using similar detection techniques is described. The different chapters of the book are written by world experts in their field. Clear instructions on the detection techniques and principles in terms of relevant operation parameters for scientists and graduate students are given.Detailed tables and diagrams will make this a very useful handbook for the application of these techniques in many different fields like physics, medicine, biology and other areas of natural science.
Semiconductor sensors patterned at the micron scale combined with custom-designed integrated circuits have revolutionized semiconductor radiation detector systems. Designs covering many square meters with millions of signal channels are now commonplace in high-energy physics and the technology is finding its way into many other fields, ranging from astrophysics to experiments at synchrotron light sources and medical imaging. This book is the first to present a comprehensive discussion of the many facets of highly integrated semiconductor detector systems, covering sensors, signal processing, transistors and circuits, low-noise electronics, and radiation effects. The diversity of design approaches is illustrated in a chapter describing systems in high-energy physics, astronomy, and astrophysics. Finally a chapter "Why things don't work" discusses common pitfalls. Profusely illustrated, this book provides a unique reference in a key area of modern science.
Starting from basic principles, this book describes the rapidly growing field of modern semiconductor detectors used for energy and position measurement radiation. The author, whose own contributions to these developments have been significant, explains the working principles of semiconductor radiation detectors in an intuitive way. Broad coverage is also given to electronic signal readout and to the subject of radiation damage.
X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques as an essential feedback method for crystal growth, including compositional and thickness determination of thin layers. The methods have been developed to reveal very detailed structural information concerning material quality, interface structure, relaxation, defects, surface damage, and more.
Spectral, Photon Counting Computed Tomography is a comprehensive cover of the latest developments in the most prevalent imaging modality (x-ray computed tomography (CT)) in its latest incarnation: Spectral, Dual-Energy, and Photon Counting CT. Disadvantages of the conventional single-energy technique used by CT technology are that different materials cannot be distinguished and that the noise is larger. To address these problems, a novel spectral CT concept has been proposed. Spectral Dual-Energy CT (DE-CT) acquires two sets of spectral data, and Spectral Photon Counting CT (PC-CT) detects energy of x-ray photons to reveal additional material information of objects by using novel energy-sensitive, photon-counting detectors. The K-edge imaging may be a gateway for functional or molecular CT. The book covers detectors and electronics, image reconstruction methods, image quality assessments, a simulation tool, nanoparticle contrast agents, and clinical applications for spectral CT.