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This book addresses the basic physical phenomenon of small-angle scattering (SAS) of neutrons, x-rays or light from complex hierarchical nano- and micro-structures. The emphasis is on developing theoretical models for the material structure containing self-similar or fractal clusters. Within the suggested framework, key approaches for extracting structural information from experimental scattering data are investigated and presented in detail. The range of parameters which can be obtained pave the road towards a better understanding of the correlations between geometrical and various physical properties (electrical, magnetic, mechanical, optical, dynamical, transport etc.) in fractal nano- and micro-materials.
Comprehensive overview of the spectroscopic, mineralogical, and geochemical techniques used in planetary remote sensing.
This book is devoted to a simple practical approach to neutron, X-ray and light scattering experiments, involving model calculation of the scattering and mathematical transformation. It is intended to attract colloid and polymer scientists using scattering methods in their laboratory or at common research facilities. The primary objective is to explain the current methodology of elastic and quasi-elastic scattering techniques (avoiding both under and over-exploitation of data) rather than a general course on colloids and polymers. Basic information on data interpretation, on the complementarity of the different types of radiation, as well as information on recent applications and developments are presented.
This book provides a comprehensive and up-to-date introduction to the fundamental theory and applications of slow-neutron scattering.
- Up-to-date account of the principles and practice of inelastic and spectroscopic methods available at neutron and synchrotron sources - Multi-technique approach set around a central theme, rather than a monograph on one technique - Emphasis on the complementarity of neutron spectroscopy and X-ray spectroscopy which are usually treated in separate books
This 2-volume set includes extensive discussions of scattering techniques (light, neutron and X-ray) and related fluctuation and grating techniques that are at the forefront of this field. Most of the scattering techniques are Fourier space techniques. Recent advances have seen the development of powerful direct imaging methods such as atomic force microscopy and scanning probe microscopy. In addition, techniques that can be used to manipulate soft matter on the nanometer scale are also in rapid development. These include the scanning probe microscopy technique mentioned above as well as optical and magnetic tweezers.
This book presents a compilation of findings, review and original works, on the tectonic evolution and structural detail of several terrains in India. It captures the tectonic diversity of the Indian terrain, including tectonics of India's coastal areas, the tectonic evolution of Gondwana and Proterozoic (Purana) basins. It also describes the research results of the Indian craton's geo-history, Tertiary Bengal basin, and also the Himalayan collisional zone. Thus the book covers the deformation history of Indian terrain involving strike slip, compressional and extensional tectonics, and ductile and brittle shear deformations.
Small-angle scattering of X rays and neutrons is a widely used diffraction method for studying the structure of matter. This method of elastic scattering is used in various branches of science and technology, includ ing condensed matter physics, molecular biology and biophysics, polymer science, and metallurgy. Many small-angle scattering studies are of value for pure science and practical applications. It is well known that the most general and informative method for investigating the spatial structure of matter is based on wave-diffraction phenomena. In diffraction experiments a primary beam of radiation influences a studied object, and the scattering pattern is analyzed. In principle, this analysis allows one to obtain information on the structure of a substance with a spatial resolution determined by the wavelength of the radiation. Diffraction methods are used for studying matter on all scales, from elementary particles to macro-objects. The use of X rays, neutrons, and electron beams, with wavelengths of about 1 A, permits the study of the condensed state of matter, solids and liquids, down to atomic resolution. Determination of the atomic structure of crystals, i.e., the arrangement of atoms in a unit cell, is an important example of this line of investigation.
Crystallography may be described as the science of the structure of materi als, using this word in its widest sense, and its ramifications are apparent over a broad front of current scientific endeavor. It is not surprising, therefore, to find that most universities offer some aspects of crystallography in their undergraduate courses in the physical sciences. It is the principal aim of this book to present an introduction to structure determination by X-ray crystal lography that is appropriate mainly to both final-year undergraduate studies in crystallography, chemistry, and chemical physics, and introductory post graduate work in this area of crystallography. We believe that the book will be of interest in other disciplines, such as physics, metallurgy, biochemistry, and geology, where crystallography has an important part to play. In the space of one book, it is not possible either to cover all aspects of crystallography or to treat all the subject matter completely rigorously. In particular, certain mathematical results are assumed in order that their applications may be discussed. At the end of each chapter, a short bibliog raphy is given, which may be used to extend the scope of the treatment given here. In addition, reference is made in the text to specific sources of information. We have chosen not to discuss experimental methods extensively, as we consider that this aspect of crystallography is best learned through practical experience, but an attempt has been made to simulate the interpretive side of experimental crystallography in both examples and exercises.
Besides its coverage of the four important aspects of synchrotron sources, materials and material processes, measuring techniques, and applications, this ready reference presents both important method types: diffraction and tomography. Following an introduction, a general section leads on to methods, while further sections are devoted to emerging methods and industrial applications. In this way, the text provides new users of large-scale facilities with easy access to an understanding of both the methods and opportunities offered by different sources and instruments.