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Solid-State Imaging with Charge-Coupled Devices covers the complete imaging chain: from the CCD's fundamentals to the applications. The book is divided into four main parts: the first deals with the basics of the charge-coupled devices in general. The second explains the imaging concepts in close relation to the classical television application. Part three goes into detail on new developments in the solid-state imaging world (light sensitivity, noise, device architectures), and part four rounds off the discussion with a variety of applications and the imager technology. The book is a reference work intended for all who deal with one or more aspects of solid- state imaging: the educational, scientific and industrial world. Graduates, undergraduates, engineers and technicians interested in the physics of solid-state imagers will find the answers to their imaging questions. Since each chapter concludes with a short section `Worth Memorizing', reading this short summary allows readers to continue their reading without missing the main message from the previous section.
Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.
This new edition features numerous updates and additions. Especially 4 new chapters on Fiber Optics, Integrated Optics, Frequency Combs and Interferometry reflect the changes since the first edition. In addition, major complete updates for the chapters: Optical Materials and Their Properties, Optical Detectors, Nanooptics, and Optics far Beyond the Diffraction Limit. Features Contains over 1000 two-color illustrations. Includes over 120 comprehensive tables with properties of optical materials and light sources. Emphasizes physical concepts over extensive mathematical derivations. Chapters with summaries, detailed index Delivers a wealth of up-to-date references.
These proceedings reflect the work presented at the conference "Interferometry in Speckle Light: Theory and Applications", held at the Ecole Polytechnique Federale de Lausanne, (EPFL), the Swiss Federal Institute of Technology in Lausanne, Switzerland. The event took place from September 25 to September 28, 2000. Thanks to the diligence of the authors, this book has been published just in time for the conference. Writing this preface in July, in anticipation of the conference, we have tried to envisage how this book will benefit the quality of discourse between authors and attendees. "Interferometry in Speckle Light: Theory and Applications" results from a bottom-up approach and is original in several ways. This conference is not part of a series; on the contrary, it is a single event. The idea of gathering scientists and engineers for a general discussion on the theory and the practice of interferometry, involving rough, non-optically polished objects, was "in the air". An opportunity of this sort was not provided by any of the conferences scheduled when the present one was conceived. For this reason, it was easy to convince a small number of renowned researchers, all of them active in the field of holographic and speckle interferometry, to organize a conference. To be specific, they are the people listed below as members of the scientific and local committees. At the same time, a particular circumstance, namely the retirement of Professor L. Pflug, helped to detennine the location of the meeting.
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