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Compilation of various summaries, overviews and reports on recent advances in high-technology science research in Japan.
Please note this is a Short Discount publication. Advanced Materials in Japan: Source Book 1992 offers the reader news of all the developments which have taken place over the last year. The Source Book is divided into chapters based on the divisions of news in New Materials in Japan – Metals & Alloys; Ceramics; Composites; Electronic & Optoelectronic Materials; Magnetic Materials; Plastics; Materials & The Environment; Medical Materials and Textiles, each introduced by an expert in these particular areas and discussing the implications of the information to non–Japanese industry. In addition, the Source Book includes a chapter devoted to business/market information – company mergers acquisitions etc., together with an overview of the Japanese approach to advanced materials and highlighting all major research initiatives, research programmes etc.
Analytical electron microscopy is one of the most powerful tools today for characterization of the advanced materials that support the nanotechnology of the twenty-first century. In this book the authors clearly explain both the basic principles and the latest developments in the field. In addition to a fundamental description of the inelastic scattering process, an explanation of the constituent hardware is provided. Standard quantitative analytical techniques employing electron energy-loss spectroscopy and energy-dispersive X-ray spectroscopy are also explained, along with elemental mapping techniques. Included are sections on convergent beam electron diffraction and electron holography utilizing the field emission gun. With generous use of illustrations and experimental data, this book is a valuable resource for anyone concerned with materials characterization, electron microscopy, materials science, crystallography, and instrumentation.
High-resolution electron microscopy (HREM) has become a most powerful method for investigating the internal structure of materials on an atomic scale of around 0.1 nm. The authors clearly explain both the theory and practice of HREM for materials science. In addition to a fundamental formulation of the imaging process of HREM, there is detailed explanation of image simulationindispensable for interpretation of high-resolution images. Essential information on appropriate imaging conditions for observing lattice images and structure images is presented, and methods for extracting structural information from these observations are clearly shown, including examples in advanced materials. Dislocations, interfaces, and surfaces are dealt with, and materials such as composite ceramics, high-Tc superconductors, and quasicrystals are also considered. Included are sections on the latest instruments and techniques, such as the imaging plate and quantitative HREM.
Since a formulated concept of functionally graded materials (FGMs) was proposed in 1984 as a means of preparing thermal barrier materials, a coordinated research has been developed since 1986. The 125 papers presented here present state of the art research results and developments on FGM from the past decade.A wide spectra of topics are covered including design and modeling, fracture analysis, powder metallurgical processes, deposition and spray processes, reaction forming processes, novel processes, material evaluation for structural applications, organic and intelligent materials. Three reviews associated with national research programs on FGMs promoted in Japan and Germany, and the historical perspective of FGM research in Europe are presented as well.The resulting work is recommended to researchers, engineers and graduate school students in the fields of materials science and engineering, mechanical and medical engineering.