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This volume treats new materials (nanotubes and quantum dots) and new techniques (synchrotron radiation scattering and cavity confined scattering). In the past five years, Raman and Brillouin scattering have taken a place among the most important research and characterization methods for carbon nanotubes. Among the novel techniques discussed in this volume are those employing synchrotron radiation as a light source.
With contributions by numerous experts
With contributions by numerous experts
With contributions by numerous experts
This is the sixth volume of a well-established and popular series in which expert practitioners discuss topical aspects of light scattering in solids. This volume discusses recent results of Raman spectroscopy of high Tc superconductors, organic polymers, rare earth compounds, semimagnetic superconductors, and silver halides, as well as developments in the rapidly growing field of time-resolved Raman spectroscopy. Emphasis is placed on obtaining information about elementary excitations, the basic properties of materials, and the use of Raman spectroscopy as an analytical tool. This volume may be regarded as an encyclopedia of condensed matter physics from the viewpoint of the Raman spectroscopist. It will be useful to advanced students and to all researchers who apply Raman spectroscopy in their work.
Just over 25 years ago the first laser-excited Raman spectrum of any crystal was obtained. In November 1964, Hobden and Russell reported the Raman spectrum of GaP and later, in June 1965, Russell published the Si spectrum. Then, in July 1965, the forerunner of a series of meetings on light scattering in solids was held in Paris. Laser Raman spectroscopy of semiconductors was at the forefront in new developments at this meeting. Similar meetings were held in 1968 (New York), 1971 (Paris) and 1975 (Campinas). Since then, and apart from the multidisciplinary biennial International Conference on Raman Spectroscopy there has been no special forum for experts in light scattering spectroscopy of semiconductors to meet and discuss latest developments. Meanwhile, technological advances in semiconductor growth have given rise to a veritable renaissance in the field of semiconductor physics. Light scattering spectroscopy has played a crucial role in the advancement of this field, providing valuable information about the electronic, vibrational and structural properties both of the host materials, and of heterogeneous composite structures. On entering a new decade, one in which technological advances in lithography promise to open even broader horirons for semiconductor physics, it seemed to us to be an ideal time to reflect on the achievements of the past decade, to be brought up to date on the current state-of-the-art, and to catch some glimpses of where the field might be headed in the 1990s.
The classical phenomenon of light scattering is one of the most studied t- ics in light-matter interaction and, even today, involves some controversial issues. A present focus of interest for many researchers is the possibility of obtaining information about microstructures, for example surface roughness, and the size, shape and optical properties of particles by means of a n- invasive technique such as the illumination of these objects with light. One of their main tasks is to extract the relevant information from a detailed study of the scattered radiation. This includes: measurement of the light intensity in di erent directions, analysis of its polarization, determination of its stat- tics,etc. Contributionstoresolvingthisproblemareimportantnotonlyfrom the point of view of increasing basic knowledge but also in their applications to several elds of industry and technology. Consider, for example, the pos- bility of distinguishing between di erent types of atmospheric contaminants, biological contaminants in our blood, the detection of microdefects in the manufacturing of semiconductors, magnetic discs and optical components, or the development of biological sensors. During the period September 11-13, 1998, we brought together a group of international experts on light scattering at the Summer School of Laredo at the University of Cantabria. In a series of one-hour lectures, they discussed currentaspectsoflightscatteringfrommicrostructureswithspecialemphasis on recent applications. The present book condenses those lectures into ve parts.
The International Conference on Light Scattering Spectra of Solids was held at New York University on September 3, 4, 5, 6, 1968. The Conference received financial support from the U. S. Army Research Office (Durham), The New York State Science and Technology Foundation, the U. S. Office of Naval Research, and The Graduate School of Arts and Sciences of New York University. Co-sponsoring the Conference was the International Union of Pure and Applied Physics. The initial conception for the Light Scattering Conference arose from informal discussions held by Professor Eli Burstein, Professor Marvin Silver (representing the U. S. Army Research Office) and Professor Joseph Birman, late in 1966. In early discussions a format was put forth for a meeting to be held the following year, re viewing the state of the art, and emphasizing novel developments which had 9ccurred since the 1965 International Colloquium on Scattering Spectra of Crystals held in Paris (proceedings published in Le Journal de Physique, Volume 26, November 1965).