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The Fifth International Congress on X-Ray Optics and Microanalysis was organized by the Institute of Applied Physics at Tübingen University in Western Germany from September 9th through 14th, 1968. Since 1956, when the First Conference was arranged in Cambridge, England by one of the pioneers in this field, V. E. CossLETT, the experts in the fields of X-Ray Optics and Microanalysis have met every third year to exchange their scientific experiences. Later meetings were held at Uppsala, Sweden in 1959, at Stanford, California in 1962, and at Orsay, Francein 1965. The participants in the 1968 Conference came from the following countries: Germany 140, France 60, Great Britain 55, USA 20, Netherlands 16, Switzerland 12, Austria 9, Sweden 7, Belgium 6, Japan 5, Italy 4, two each from Israel, Yugoslavia, Canada, Norway, Hungary and one each from Argentine, Poland, South Africa. As at the latest congress in Paris the following central topics were treated: General problems of X-ray optics, physical bases of electron beam microanalysis, quantitative problems of X-ray microanalysis, instrumentation, microdiffraction, applications to metal lurgy, mineralogy, and biology. An exhibition showing some of the most modern instruments formed an important part of the conference. The Springer-Verlag, Heidelberg, deserves thanks for the careful and speedy work they have performed in printing these conference proceedings. We are further indebted to all contributors of this volume for their kind cooperation. Tübingen, August 1969 G. MöLLENSTEDT and K. H.
This book was triggered by the success story of sector field mass spectrometry in elemental and isotopic analysis from the early days when the first mass spectrum of Ne was presented a hundred years ago. The outstanding and unique features of sector field mass spectrometry - high sensitivity, high mass resolution and simultaneous multiple ion detection - paved the way for its successful and increasing application in different fields of science. Written, compiled and edited by worldwide renowned experts with profound expertise in sector field mass spectrometry related to elemental and isotopic analysis, this book is intended to provide deep insight into the topic along with fundamental knowledge about elemental and isotopic analysis. Aimed at scientists in the field of natural and life sciences, instrument manufacturers, practitioners and graduate students, this book provides solid information about the methodological background and analytical capabilities of sector field mass spectrometry. A detailed description of peculiarities and an overview of the most relevant applications making use of specific techniques using sector field mass analysers (ICP-MS, GDMS, TIMS, SIMS and IRMS) are given, including a presentation of the currently available commercial instruments. This approach guarantees that readers are thoroughly introduced to and familiarized with the fascinating inter- and transdisciplinary field of sector field mass spectrometry.
This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide rapid assimilation of the presented topics that include neutron and x-ray scatter, refraction, diffraction, and reflection and their potential application. - Contributions from leading authorities - Informs and updates on all the latest developments in the field
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First multi-year cumulation covers six years: 1965-70.