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Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.
These proceedings reflect the work presented at the conference "Interferometry in Speckle Light: Theory and Applications", held at the Ecole Polytechnique Federale de Lausanne, (EPFL), the Swiss Federal Institute of Technology in Lausanne, Switzerland. The event took place from September 25 to September 28, 2000. Thanks to the diligence of the authors, this book has been published just in time for the conference. Writing this preface in July, in anticipation of the conference, we have tried to envisage how this book will benefit the quality of discourse between authors and attendees. "Interferometry in Speckle Light: Theory and Applications" results from a bottom-up approach and is original in several ways. This conference is not part of a series; on the contrary, it is a single event. The idea of gathering scientists and engineers for a general discussion on the theory and the practice of interferometry, involving rough, non-optically polished objects, was "in the air". An opportunity of this sort was not provided by any of the conferences scheduled when the present one was conceived. For this reason, it was easy to convince a small number of renowned researchers, all of them active in the field of holographic and speckle interferometry, to organize a conference. To be specific, they are the people listed below as members of the scientific and local committees. At the same time, a particular circumstance, namely the retirement of Professor L. Pflug, helped to detennine the location of the meeting.
This book is for those who have some knowledge of optics, but little or no previous experience in interferometry. Accordingly, the carefully designed presentation helps readers easily find and assimilate the interferometric techniques they need for precision measurements. Mathematics is held to a minimum, and the topics covered are also summarized in capsule overviews at the beginning and end of each chapter. Each chapter also contains a set of worked problems that give a feel for numbers.The first five chapters present a clear tutorial review of fundamentals. Chapters six and seven discuss the types of lasers and photodetectors used in interferometry. The next eight chapters describe key applications of interferometry: measurements of length, optical testing, studies of refractive index fields, interference microscopy, holographic and speckle interferometry, interferometric sensors, interference spectroscopy, and Fourier-transform spectroscopy. The final chapter offers suggestions on choosing and setting up an interferometer.
This practical reference offers state-of-the-art coverage of speckle metrology and its value as a measuring technique in industry.;Examing every important aspect of the field, Speckle Metrology: surveys the origin of speckle displacement and decorrelation; presents procedures for deformation analysis and shape measurement of rough objects; explains particle image velocimetry (PIV), the processing of PIV records, and the design requirements of PIV equipment; discusses the applications of white light speckle methods and the production of artificial speckles; describes the measurement of surface roughness with laser speckles and polychromatic speckles; illustrates semiautomatic and automatic methods for the analysis of Young's fringes; calculates the variation of Young's fringes with the change in the microrelief of the rough surface; and explicates hololenses for imaging and provides design details with aberration corrections for hololense systems.;With over 1500 literature citations, tables, figures and display equations, Speckle Metrology is a resource for students and professionals in the fields of optical, mechanical, electrical and electronics engineering; applied physics; and stress analysis.
Holographic and speckle interferometry are optical techniques which use lasers to make non-contracting field view measurements at a sensitivity of the wavelength of light on optically rough (i.e. non-mirrored) surfaces. They may be used to measure static or dynamic displacements, the shape of objects, and refractive index variations of transparent media. As such, these techniques have been applied to the solution of a wide range of problems in strain and vibrational analysis, non-destructive testing (NDT), component inspection and design analysis and fluid flow visualisation. This book provides a self-contained, unified, theoretical analysis of the basic principles and associated opto-electronic techniques (for example Electronic Speckle Pattern Interferometry). In addition, a detailed discussion of experimental design and practical application to the solution of physical problems is presented. In this new edition, the authors have taken the opportunity to include a much more coherent description of more than twenty individual case studies that are representative of the main uses to which the techniques are put. The Bibliography has also been brought up to date.
In this volume on the mechanics of fracture of Portland cement concrete, the general theme is the connection between microstructural phenomena and macroscopic models. The issues addressed include techniques for observation over a wide range of scales, the influence of .microcracking on common measures of strength and de formability , and ultimately, the relationship between microstructural changes in concrete under load and its resistance to cracking. It is now commonly accepted that, in past attempts to force-fit the behavior of concrete into the rules of linear elastic fracture mechanics, proper attention has not been paid to scale effects. Clearly, the relationships among specimen size, crack length and opening, and characteristic material fabric dimensions have been, in comparison to their counterparts in metals, ceramics, and rocks, abused in concrete. Without a fundamental understanding of these relationships, additional testing in search of the elusive, single measure of fracture toughness has spawned additional confusion and frustration. No one is in a better position to document this observation than Professor Mindess.
Steinchen and Yang, for whom credentials are not cited, present the principle and procedure of the technique and its application in nondestructive testing, strain measurement, and vibration analysis. Aiming to meet the requirements of both beginning and experienced researchers, they emphasize the quantitative evaluation of shearographic interferograms, and offer examples of applications using it in quantifying heat flow rate, and analyzing deviations. Annotation (c)2003 Book News, Inc., Portland, OR (booknews.com).
Thirty-five papers were presented at the International Symposium on Photoelasticity, Tokyo, 1986, representing fifty-five authors. Eighteen of these papers were presented by Japanese photoelasticians and seventeen by leading foreign authorities from eleven countries (Austria, Canada, Czechoslovakia, F.R. of Germany, France, Greece, India, Switzerland, UK, USA and USSR) • This is the first symposium on photoelasticity of international scope held in Japan. The primary objectives of this symposium are to help bridge the gap between photoelastic researchers around the world, to promote mutual understanding and communications and to facilitate exchange of newly acquired knowledge in theories and techniques. In addition, it is important that these valuable results are communicated effectively to engineers who can apply them in practice in industry. The papers presented at this symposium cover all branches of photo elasticity in a broad sense, including, in addition to long estab lished photoelasticity, newly developed moire, interferometric, and holographic photoelasticity, caustics and speckle. Therefore, from an optical stress analysis pe~spective, this volume is the latest compre hensive collection of photoelastic expertises.