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Handbook of Microwave Component Measurements Second Edition is a fully updated, complete reference to this topic, focusing on the modern measurement tools, such as a Vector Network Analyzer (VNA), gathering in one place all the concepts, formulas, and best practices of measurement science. It includes basic concepts in each chapter as well as appendices which provide all the detail needed to understand the science behind microwave measurements. The book offers an insight into the best practices for ascertaining the true nature of the device-under-test (DUT), optimizing the time to setup and measure, and to the greatest extent possible, remove the effects of the measuring equipment from that result. Furthermore, the author writes with a simplicity that is easily accessible to the student or new engineer, yet is thorough enough to provide details of measurement science for even the most advanced applications and researchers. This welcome new edition brings forward the most modern techniques used in industry today, and recognizes that more new techniques have developed since the first edition published in 2012. Whilst still focusing on the VNA, these techniques are also compatible with other vendor's advanced equipment, providing a comprehensive industry reference.
Which types of validity evidence should be considered when determining whether a scale is appropriate for a given measurement situation? What about reliability evidence? Using clear explanations illustrated by examples from across the social and behavioral sciences, this engaging text prepares students to make effective decisions about the selection, administration, scoring, interpretation, and development of measurement instruments. Coverage includes the essential measurement topics of scale development, item writing and analysis, and reliability and validity, as well as more advanced topics such as exploratory and confirmatory factor analysis, item response theory, diagnostic classification models, test bias and fairness, standard setting, and equating. End-of-chapter exercises (with answers) emphasize both computations and conceptual understanding to encourage readers to think critically about the material. ÿ
This book is a valuable read for a diverse group of researchers and practitioners who analyze assessment data and construct test instruments. It focuses on the use of classical test theory (CTT) and item response theory (IRT), which are often required in the fields of psychology (e.g. for measuring psychological traits), health (e.g. for measuring the severity of disorders), and education (e.g. for measuring student performance), and makes these analytical tools accessible to a broader audience. Having taught assessment subjects to students from diverse backgrounds for a number of years, the three authors have a wealth of experience in presenting educational measurement topics, in-depth concepts and applications in an accessible format. As such, the book addresses the needs of readers who use CTT and IRT in their work but do not necessarily have an extensive mathematical background. The book also sheds light on common misconceptions in applying measurement models, and presents an integrated approach to different measurement methods, such as contrasting CTT with IRT and multidimensional IRT models with unidimensional IRT models. Wherever possible, comparisons between models are explicitly made. In addition, the book discusses concepts for test equating and differential item functioning, as well as Bayesian IRT models and plausible values using simple examples. This book can serve as a textbook for introductory courses on educational measurement, as supplementary reading for advanced courses, or as a valuable reference guide for researchers interested in analyzing student assessment data.
This book examines test validity in the behavioral, social, and educational sciences by exploring three fundamental problems: measurement, causation and meaning. Psychometric and philosophical perspectives receive attention along with unresolved issues. The authors explore how measurement is conceived from both the classical and modern perspectives. The importance of understanding the underlying concepts as well as the practical challenges of test construction and use receive emphasis throughout. The book summarizes the current state of the test validity theory field. Necessary background on test theory and statistics is presented as a conceptual overview where needed. Each chapter begins with an overview of key material reviewed in previous chapters, concludes with a list of suggested readings, and features boxes with examples that connect theory to practice. These examples reflect actual situations that occurred in psychology, education, and other disciplines in the US and around the globe, bringing theory to life. Critical thinking questions related to the boxed material engage and challenge readers. A few examples include: What is the difference between intelligence and IQ? Can people disagree on issues of value but agree on issues of test validity? Is it possible to ask the same question in two different languages? The first part of the book contrasts theories of measurement as applied to the validity of behavioral science measures.The next part considers causal theories of measurement in relation to alternatives such as behavior domain sampling, and then unpacks the causal approach in terms of alternative theories of causation.The final section explores the meaning and interpretation of test scores as it applies to test validity. Each set of chapters opens with a review of the key theories and literature and concludes with a review of related open questions in test validity theory. Researchers, practitioners and policy makers interested in test validity or developing tests appreciate the book's cutting edge review of test validity. The book also serves as a supplement in graduate or advanced undergraduate courses on test validity, psychometrics, testing or measurement taught in psychology, education, sociology, social work, political science, business, criminal justice and other fields. The book does not assume a background in measurement.
Are you a teacher or guidance counselor looking for an accessible reference guide? This revised edition of a popular 1993 anthology includes 120 tests and surveys, bringing together psychometric information about instruments developed to measure constructs in education and social sciences. Includes references to both published and unpublished instruments-scales, questionnaires, surveys, indices, and inventories-which otherwise would be painstakingly difficult for the researcher/teacher/counselor to locate.
A Comprehensive Guide to Physical Layer Test and Measurement of Digital Communication Links Today's new data communication and computer interconnection systems run at unprecedented speeds, presenting new challenges not only in the design, but also in troubleshooting, test, and measurement. This book assembles contributions from practitioners at top test and measurement companies, component manufacturers,and universities. It brings together information that has never been broadly accessible before—information that was previously buried in application notes, seminar and conference presentations, short courses, and unpublished works. Readers will gain a thorough understanding of the inner workings of digital high-speed systems, and learn how the different aspects of such systems can be tested. The editors and contributors cover key areas in test and measurement of transmitters (digital waveform and jitter analysis and bit error ratio), receivers (sensitivity, jitter tolerance, and PLL/CDR characterization), and high-speed channel characterization (in time and frequency domain). Extensive illustrations are provided throughout. Coverage includes Signal integrity from a measurement point of view Digital waveform analysis using high bandwidth real-time and sampling (equivalent time) oscilloscopes Bit error ratio measurements for both electrical and optical links Extensive coverage on the topic of jitter in high-speed networks State-of-the-art optical sampling techniques for analysis of 100 Gbit/s + signals Receiver characterization: clock recovery, phase locked loops, jitter tolerance and transfer functions, sensitivity testing, and stressed-waveform receiver testing Channel and system characterization: TDR/T and frequency domain-based alternatives Testing and measuring PC architecture communication links: PCIexpress, SATA, and FB DIMM