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This book contains an edited selection of papers presented at the International Workshop on Defect and Fault Tolerance in VLSI Systems held October 6-7, 1988 in Springfield, Massachusetts. Our thanks go to all the contributors and especially the members of the program committee for the difficult and time-consuming work involved in selecting the papers that were presented in the workshop and reviewing the papers included in this book. Thanks are also due to the IEEE Computer Society (in particular, the Technical Committee on Fault-Tolerant Computing and the Technical Committee on VLSI) and the University of Massachusetts at Amherst for sponsoring the workshop, and to the National Science Foundation for supporting (under grant number MIP-8803418) the keynote address and the distribution of this book to all workshop attendees. The objective of the workshop was to bring t. ogether researchers and practition ers from both industry and academia in the field of defect tolerance and yield en ha. ncement in VLSI to discuss their mutual interests in defect-tolerant architectures and models for integrated circuit defects, faults, and yield. Progress in this area was slowed down by the proprietary nature of yield-related data, and by the lack of appropriate forums for disseminating such information. The goal of this workshop was therefore to provide a forum for a dialogue and exchange of views. A follow-up workshop in October 1989, with C. H. Stapper from IBM and V. K. Jain from the University of South Florida as general co-chairmen, is being organized.
With the end of Dennard scaling and Moore’s law, IC chips, especially large-scale ones, now face more reliability challenges, and reliability has become one of the mainstay merits of VLSI designs. In this context, this book presents a built-in on-chip fault-tolerant computing paradigm that seeks to combine fault detection, fault diagnosis, and error recovery in large-scale VLSI design in a unified manner so as to minimize resource overhead and performance penalties. Following this computing paradigm, we propose a holistic solution based on three key components: self-test, self-diagnosis and self-repair, or “3S” for short. We then explore the use of 3S for general IC designs, general-purpose processors, network-on-chip (NoC) and deep learning accelerators, and present prototypes to demonstrate how 3S responds to in-field silicon degradation and recovery under various runtime faults caused by aging, process variations, or radical particles. Moreover, we demonstrate that 3S not only offers a powerful backbone for various on-chip fault-tolerant designs and implementations, but also has farther-reaching implications such as maintaining graceful performance degradation, mitigating the impact of verification blind spots, and improving chip yield. This book is the outcome of extensive fault-tolerant computing research pursued at the State Key Lab of Processors, Institute of Computing Technology, Chinese Academy of Sciences over the past decade. The proposed built-in on-chip fault-tolerant computing paradigm has been verified in a broad range of scenarios, from small processors in satellite computers to large processors in HPCs. Hopefully, it will provide an alternative yet effective solution to the growing reliability challenges for large-scale VLSI designs.
This book presents the state-of-the-art techniques for the modeling, simulation, testing, compilation and physical synthesis of mVLSI biochips. The authors describe a top-down modeling and synthesis methodology for the mVLSI biochips, inspired by microelectronics VLSI methodologies. They introduce a modeling framework for the components and the biochip architecture, and a high-level microfluidic protocol language. Coverage includes a topology graph-based model for the biochip architecture, and a sequencing graph to model for biochemical application, showing how the application model can be obtained from the protocol language. The techniques described facilitate programmability and automation, enabling developers in the emerging, large biochip market.
Fault-Tolerant Systems, Second Edition, is the first book on fault tolerance design utilizing a systems approach to both hardware and software. No other text takes this approach or offers the comprehensive and up-to-date treatment that Koren and Krishna provide. The book comprehensively covers the design of fault-tolerant hardware and software, use of fault-tolerance techniques to improve manufacturing yields, and design and analysis of networks. Incorporating case studies that highlight more than ten different computer systems with fault-tolerance techniques implemented in their design, the book includes critical material on methods to protect against threats to encryption subsystems used for security purposes. The text's updated content will help students and practitioners in electrical and computer engineering and computer science learn how to design reliable computing systems, and how to analyze fault-tolerant computing systems. - Delivers the first book on fault tolerance design with a systems approach - Offers comprehensive coverage of both hardware and software fault tolerance, as well as information and time redundancy - Features fully updated content plus new chapters on failure mechanisms and fault-tolerance in cyber-physical systems - Provides a complete ancillary package, including an on-line solutions manual for instructors and PowerPoint slides
This book is a collection of extremely well-articulated, insightful and unique state-ofthe-art papers presented at the Computing Conference which took place in London on June 22–23, 2023. A total of 539 papers were received out of which 193 were selected for presenting after double-blind peer-review. The book covers a wide range of scientific topics including IoT, Artificial Intelligence, Computing, Data Science, Networking, Data security and Privacy, etc. The conference was successful in reaping the advantages of both online and offline modes. The goal of this conference is to give a platform to researchers with fundamental contributions and to be a premier venue for academic and industry practitioners to share new ideas and development experiences. We hope that readers find this book interesting and valuable. We also expect that the conference and its publications will be a trigger for further related research and technology improvements in this important subject.
A practical understanding of these concepts and their application can help to reduce the chance of having device failures.
For the editors of this book, as well as for many other researchers in the area of fault-tolerant computing, Dr. William Caswell Carter is one of the key figures in the formation and development of this important field. We felt that the IFIP Working Group 10.4 at Baden, Austria, in June 1986, which coincided with an important step in Bill's career, was an appropriate occasion to honor Bill's contributions and achievements by organizing a one day "Symposium on the Evolution of Fault-Tolerant Computing" in the honor of William C. Carter. The Symposium, held on June 30, 1986, brought together a group of eminent scientists from all over the world to discuss the evolu tion, the state of the art, and the future perspectives of the field of fault-tolerant computing. Historic developments in academia and industry were presented by individuals who themselves have actively been involved in bringing them about. The Symposium proved to be a unique historic event and these Proceedings, which contain the final versions of the papers presented at Baden, are an authentic reference document.
The 1987 Princeton Workshop on Algorithm, Architecture and Technology Issues for Models of Concurrent Computation was organized as an interdisciplinary work shop emphasizing current research directions toward concurrent computing systems. With participants from several different fields of specialization, the workshop cov ered a wide variety of topics, though by no means a complete cross section of issues in this rapidly moving field. The papers included in this book were prepared for the workshop and, taken together, provide a view of the broad range of issues and alternative directions being explored. To organize the various papers, the book has been divided into five parts. Part I considers new technology directions. Part II emphasizes underlying theoretical issues. Communication issues, which are ad dressed in the majority of papers, are specifically highlighted in Part III. Part IV includes papers stressing the fault tolerance and reliability of systems. Finally, Part V includes systems-oriented papers, where the system ranges from VLSI circuits through powerful parallel computers. Much of the initial planning of the workshop was completed through an informal AT&T Bell Laboratories group consisting of Mehdi Hatamian, Vijay Kumar, Adri aan Ligtenberg, Sailesh Rao, P. Subrahmanyam and myself. We are grateful to Stuart Schwartz, both for the support of Princeton University and for his orga nizing local arrangements for the workshop, and to the members of the organizing committee, whose recommendations for participants and discussion topics were par ticularly helpful. A. Rosenberg, and A. T.