Download Free Uncertainty Analysis And Control Of Multiscale Process Systems Book in PDF and EPUB Free Download. You can read online Uncertainty Analysis And Control Of Multiscale Process Systems and write the review.

Microelectronic market imposes tight requirements upon thin film properties, including specific growth rate, surface roughness and thickness of the film. In the thin film deposition process, the microscopic events determine the configuration of the thin film surface while manipulating variables at the macroscopic level, such as bulk precursor mole fraction and substrate temperature, are essential to product quality. Despite the extensive body of research on control and optimization in this process, there is still a significant discrepancy between the expected performance and the actual yield that can be accomplished employing existing methodologies. This gap is mainly related to the complexities associated with the multiscale nature of the thin film deposition process, lack of practical online in-situ sensors at the fine-scale level, and uncertainties in the mechanisms and parameters of the system. The main goal of this research is developing robust control and optimization strategies for this process while uncertainty analysis is performed using power series expansion (PSE). The deposition process is a batch process where the measurements are available at the end of the batch; accordingly, optimization and control approaches that do not need to access online fine-scale measurements are required. In this research, offline optimization is performed to obtain the optimal temperature profile that results in specific product quality characteristics in the presence of model-plant mismatch. To provide a computationally tractable optimization, the sensitivities in PSEs are numerically evaluated using reduced-order lattices in the KMC models. A comparison between bounded and distributional parametric uncertainties has illustrated that inaccurate assumption for uncertainty description can lead to economic losses in the process. To accelerate the sensitivity analysis of the process, an algorithm has been presented to determine the upper and lower bounds on the outputs through distributions of the microscopic events. In this approach, the sensitivities in the series expansions of events are analytically evaluated. Current multiscale models are not available in closed-form and are computationally prohibitive for online applications. Thus, closed-form models have been developed in this research to predict the control objectives efficiently for online control applications in the presence of model-plant mismatch. The robust performance is quantified by estimates of the distributions of the controlled variables employing PSEs. Since these models can efficiently predict the controlled outputs, they can either be used as an estimator for feedback control purposes in the lack of sensors, or as a basis to design a nonlinear model predictive control (NMPC) framework. Although the recently introduced optical in-situ sensors have motivated the development of feedback control in the thin film deposition process, their application is still limited in practice. Thus, a multivariable robust estimator has been developed to estimate the surface roughness and growth rate based on the substrate temperature and bulk precursor mole fraction. To ensure that the control objective is met in the presence of model-plant mismatch, the robust estimator is designed such that it predicts the upper bound on the process output. The estimator is coupled with traditional feedback controllers to provide a robust feedback control in the lack of online measurements. In addition, a robust NMPC application for the thin film deposition process was developed. The NMPC makes use of closed-from models, which has been identified offline to predict the controlled outputs at a predefined specific probability. The shrinking horizon NMPC minimizes the final roughness, while satisfying the constraints on the control actions and film thickness at the end of the deposition process. Since the identification is performed for a fixed confidence level, hard constraints are defined for thin film properties. To improve the robust performance of NMPC using soft constraints, a closed-form model has been developed to estimate the first and second- order statistical moments of the thin film properties under uncertainty in the multiscale model parameters. Employing this model, the surface roughness and film thickness can be estimated at a desired probability limit during the deposition. Thus, an NMPC framework is devised that successfully minimizes the surface roughness at the end of the batch, while the film thickness meets a minimum specification at a desired probability. Therefore, the methods developed in this research enable accurate online control of the key properties of a multiscale system in the presence of model-plant mismatch.
This book—the first of its kind—presents general methods for feedback controller synthesis and optimization of multiscale systems, illustrating their application to thin-film growth, sputtering processes, and catalytic systems of industrial interest. The authors demonstrate the advantages of the methods presented for control and optimization through extensive simulations. Included in the work are new techniques for feedback controller design and optimization of multiscale process systems that are not included in other books. The book also contains a rich collection of new research topics and references to significant recent work.
Uncertainty Quantification in Multiscale Materials Modeling provides a complete overview of uncertainty quantification (UQ) in computational materials science. It provides practical tools and methods along with examples of their application to problems in materials modeling. UQ methods are applied to various multiscale models ranging from the nanoscale to macroscale. This book presents a thorough synthesis of the state-of-the-art in UQ methods for materials modeling, including Bayesian inference, surrogate modeling, random fields, interval analysis, and sensitivity analysis, providing insight into the unique characteristics of models framed at each scale, as well as common issues in modeling across scales.
This book introduces models and methodologies that can be employed towards making the Industry 4.0 vision a reality within the process industries, and at the same time investigates the impact of uncertainties in such highly integrated settings. Advances in computing power along with the widespread availability of data have led process industries to consider a new paradigm for automated and more efficient operations. The book presents a theoretically proven optimal solution to multi-parametric linear and mixed-integer linear programs and efficient solutions to problems such as process scheduling and design under global uncertainty. It also proposes a systematic framework for the uncertainty-aware integration of planning, scheduling and control, based on the judicious coupling of reactive and proactive methods. Using these developments, the book demonstrates how the integration of different decision-making layers and their simultaneous optimisation can enhance industrial process operations and their economic resilience in the face of uncertainty.
The application areas of uncertainty are numerous and diverse, including all fields of engineering, computer science, systems control and finance. Determining appropriate ways and methods of dealing with uncertainty has been a constant challenge. The theme for this book is better understanding and the application of uncertainty theories. This book, with invited chapters, deals with the uncertainty phenomena in diverse fields. The book is an outgrowth of the Fourth International Symposium on Uncertainty Modeling and Analysis (ISUMA), which was held at the center of Adult Education, College Park, Maryland, in September 2003. All of the chapters have been carefully edited, following a review process in which the editorial committee scrutinized each chapter. The contents of the book are reported in twenty-three chapters, covering more than . . ... pages. This book is divided into six main sections. Part I (Chapters 1-4) presents the philosophical and theoretical foundation of uncertainty, new computational directions in neural networks, and some theoretical foundation of fuzzy systems. Part I1 (Chapters 5-8) reports on biomedical and chemical engineering applications. The sections looks at noise reduction techniques using hidden Markov models, evaluation of biomedical signals using neural networks, and changes in medical image detection using Markov Random Field and Mean Field theory. One of the chapters reports on optimization in chemical engineering processes.
A modern and comprehensive treatment of tolerance intervals and regions The topic of tolerance intervals and tolerance regions has undergone significant growth during recent years, with applications arising in various areas such as quality control, industry, and environmental monitoring. Statistical Tolerance Regions presents the theoretical development of tolerance intervals and tolerance regions through computational algorithms and the illustration of numerous practical uses and examples. This is the first book of its kind to successfully balance theory and practice, providing a state-of-the-art treatment on tolerance intervals and tolerance regions. The book begins with the key definitions, concepts, and technical results that are essential for deriving tolerance intervals and tolerance regions. Subsequent chapters provide in-depth coverage of key topics including: Univariate normal distribution Non-normal distributions Univariate linear regression models Nonparametric tolerance intervals The one-way random model with balanced data The multivariate normal distribution The one-way random model with unbalanced data The multivariate linear regression model General mixed models Bayesian tolerance intervals A final chapter contains coverage of miscellaneous topics including tolerance limits for a ratio of normal random variables, sample size determination, reference limits and coverage intervals, tolerance intervals for binomial and Poisson distributions, and tolerance intervals based on censored samples. Theoretical explanations are accompanied by computational algorithms that can be easily replicated by readers, and each chapter contains exercise sets for reinforcement of the presented material. Detailed appendices provide additional data sets and extensive tables of univariate and multivariate tolerance factors. Statistical Tolerance Regions is an ideal book for courses on tolerance intervals at the graduate level. It is also a valuable reference and resource for applied statisticians, researchers, and practitioners in industry and pharmaceutical companies.
A comprehensive overview of current developments and applications in biofuels production Process Systems Engineering for Biofuels Development brings together the latest and most cutting-edge research on the production of biofuels. As the first book specifically devoted to process systems engineering for the production of biofuels, Process Systems Engineering for Biofuels Development covers theoretical, computational and experimental issues in biofuels process engineering. Written for researchers and postgraduate students working on biomass conversion and sustainable process design, as well as industrial practitioners and engineers involved in process design, modeling and optimization, this book is an indispensable guide to the newest developments in areas including: Enzyme-catalyzed biodiesel production Process analysis of biodiesel production (including kinetic modeling, simulation and optimization) The use of ultrasonification in biodiesel production Thermochemical processes for biomass transformation to biofuels Production of alternative biofuels In addition to the comprehensive overview of the subject of biofuels found in the Introduction of the book, the authors of various chapters have provided extensive discussions of the production and separation of biofuels via novel applications and techniques.