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Focuses on the growth and potential uses of infrared thermography as a nondestructive testing and monitoring technique. Part 1 of this monograph is an introduction to current infrared NDT theory and technology; Part 2 describes the wide range of infrared NDT and monitoring applications.
This proceedings book presents a collection of research papers from the 10th International Conference on Robotics, Vision, Signal Processing & Power Applications (ROVISP 2018), which serves as a platform for researchers, scientists, engineers, academics and industrial professionals from around the globe to share their research findings and development activities. The book covers various topics of interest, including, but not limited to: •Robotics, Control, Mechatronics and Automation•Vision, Image, and Signal Processing•Artificial Intelligence and Computer Applications•Electronic Design and Applications•Biomedical, Bioengineering and Applications•RF, Antenna Applications and Telecommunication Systems•Power Systems, High Voltage and Renewable Energy•Electrical Machines, Drives and Power Electronics•Devices, Circuits and Embedded Systems•Sensors and Sensing Techniques
Non-Destructive Evaluation (NDE) is now playing an increasing role in our modern global economy; in security sensitive industries, for instance. The complexity of the inspection task and either large or limited lot runs now require more operator-assisted or fully- automated signal processing. This book deals with both fields of expertise: NDE and signal processing. On the signal processing side, in the particular context of NDE applications, the following topics are discussed: sensor fusion, signal knowledge representation, artificial intelligence, fuzzy logic, computer vision, integration of numeric and non-numeric informations, parallel decomposition, noise processing and calibration of sensor devices as well as reliability of detection. Some hardware considerations are introduced as well, to discuss platforms on which processing is done. On the NDE side, applications include advances in holographic interferometry, microwave resonance or shearography and also on more traditional NDE techniques such as ultrasonics, infrared techniques, X-ray, computed tomography, Eddy currents. Inverse problems are also discussed. This book is required reading for those who already have some experience in one or both fields (signal processing and/or NDE).
With national trade barriers falling, causing the expansion of the com petitive global market, the question of quality control has become an essential issue for the 1990s. The time where the promise was to replace a product if it does not work seems to have passed; what is more impor tant now is not so much a reduction in what is going wrong but an increase of what is going right the first time (Feigenbaum 1990). This new trend is sometimes referred to as total quality. Among the many advantages ofthis zero-defect manufacturing policy, we can enumerate (Laurin 1990): superior marketability of wholly de pendable products, enormous gain in productivity, elimination of waste ful cost in replacing poor quality work and retrofitting rejected products from the field. Although total quality is a relatively new and attractive concept for mass products such as cars, consumer electronics and per sonal computers, in many fields, mainly aerospace and military, it has been the rule for years because of security reasons.
Advanced ceramic composites are the focus of intense research and development today because these materials offer a unique mix of properties that make them useful and economical for major engineering applications. As part of this R&D effort, new tools for characterization, evaluation and testing have been developed and are in current use. This book brings together leading materials researchers to report on these developments. In-depth reports cover evaluation and test methods as they relate to the design of specific advanced ceramic composite materials and their applications. The reports are supplemented with extensive test result data and illustrated with numerous micrographs and schematics.