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This book discusses the significant aspects of thermal transient testing, the most important method of thermal characterization of electronics available today. The book presents the theoretical background of creating structure functions from the measured results with mathematical details. It then shows how the method can be used for thermal qualification, structure integrity testing, determining material parameters, and calibrating simulation models. General practical questions about measurements are discussed to help beginners carry out thermal transient testing. The particular problems and tricks of measuring with various electronic components, such as Si diodes, bipolar transistors, MOS transistors, IGBT devices, resistors, capacitors, wide bandgap materials, and LEDs, are covered in detail with the help of various use cases. This hands-on book will enable readers to accomplish thermal transient testing on any new type of electronics and provides the theoretical details needed to understand the opportunities and limitations offered by the methodology. The book will be an invaluable reference for practicing engineers, students, and researchers.
"Evaluating Measurement Accuracy" is intended for anyone who is concerned with measurements in any field of science or technology. It reflects the latest developments in metrology and offers new results, but is designed to be accessible to readers at different levels: meteorologists, engineers and experimental scientists who use measurements as tools in their professions, graduate and undergraduate students in the natural sciences and engineering, and technicians performing complex measurements in industry, quality control, and trade. The material of the book is presented from the practical perspective and offers solutions and recommendations for problems that arise in conducting real-life measurements. This inclusion is a notable and unique aspect of this title as complex measurements done in industry and trade are often neglected in metrological literature, leaving the practitioners of these measurements to devise their own ad-hoc techniques.