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Who has not noticed, on one o~casion or another, those intriguing geometric patterns which appear at the intersection Of repetitive structures such as two far picket fences on a hill, the railings on both sides of a bridge, superposed layers of fabric, or folds of a nylon curtain? This fascinating phenomenon, known as the moire effect, has found useful applications in several fields of science and technology, such as metrology, strain analysis or even document authentication and anti-counterfeiting. However, in other situations moire patterns may have an unwanted, adverse effect. This is the case in the printing world, and, in particular, in the field of colour reproduction: moire patterns which may be caused by the dot-screens used for colour printing may severely deteriorate the image quality and tum into a real printer's nightmare. The starting point of the work on which this book is based was, indeed, in the research of moire phenomena in the context of the colour printing process. The initial aim of this research was to understand the nature and the causes of the superposition moire patterns between regular screens in order to find how to avoid, or at least minimize, their adverse effect on colour printing. This interesting research led us, after all, to a much more far reaching mathematical understanding of the moire phenomenon, whose interest stands in its own right, independently of any particular application.
Since the first edition of this book was published several new developments have been made in the field of the moiré theory. The most important of these concern new results that have recently been obtained on moiré effects between correlated aperiodic (or random) structures, a subject that was completely absent in the first edition, and which appears now for the first time in a second, separate volume. This also explains the change in the title of the present volume, which now includes the subtitle “Volume I: Periodic Layers”. This subtitle has been added to clearly distinguish the present volume from its new companion, which is subtitled “Volume II: Aperiodic Layers”. It should be noted, however, that the new subtitle of the present volume may be somewhat misleading, since this book also treats (in Chapters 10 and 11) moiré effects between repetitive layers, which are, in fact, geometric transformations of periodic layers, that are generally no longer periodic in themselves. The most suitable subtitle for the present volume would therefore have been “Periodic or Repetitive Layers”, but in the end we have decided on the shorter version.
Since the first edition of this book was published several new developments have been made in the field of the moiré theory. The most important of these concern new results that have recently been obtained on moiré effects between correlated aperiodic (or random) structures, a subject that was completely absent in the first edition, and which appears now for the first time in a second, separate volume. This also explains the change in the title of the present volume, which now includes the subtitle “Volume I: Periodic Layers”. This subtitle has been added to clearly distinguish the present volume from its new companion, which is subtitled “Volume II: Aperiodic Layers”. It should be noted, however, that the new subtitle of the present volume may be somewhat misleading, since this book also treats (in Chapters 10 and 11) moiré effects between repetitive layers, which are, in fact, geometric transformations of periodic layers, that are generally no longer periodic in themselves. The most suitable subtitle for the present volume would therefore have been “Periodic or Repetitive Layers”, but in the end we have decided on the shorter version.
Moiré Fringes in Strain Analysis provides a comprehensive description of the entire spectrum of techniques and methods using the moiré fringe phenomenon for the measurement of strains in engineering structures and in deformed bodies. This book presents several examples of applications of each technique to particular metrological problems. Organized into 12 chapters, this book begins with an overview of the interference fringes between two beams of monochromatic light. This text then discusses the theory of moiré patterns developed by various types of gratings based on the indicial representation method. Other chapters consider the experimental and theoretical investigation of the properties of moiré fringes that was primarily confined to moiré fringes formed by the interference of two-line gratings. This book discusses as well the major requisite for the application of moiré methods in the field of strain analysis. The final chapter deals with the advantages of the moiré methods. This book is a valuable resource for engineers, students and researchers.
This monograph explores the close relationship of variouswell-known pattern recognition problems that have so far beenconsidered independent. These relationships became apparent with thediscovery of formal procedures for addressing known problems and theirgeneralisations. The generalised problem formulations were analysedmathematically and unified algorithms were found. The main scientificcontribution of this book is the unification of two main streams inpattern recognition - the statistical one and the structuralone. The material is presented in the form of ten lectures, each ofwhich concludes with a discussion with a student."Audience: " The book is intended for both researchers and studentswho work in knowledge management and organisation, machine learning, statistics, and symbolic and algebraic manipulations. It provides newviews and numerous original results in their field. Written in aneasily accessible style, it introduces the basic building blocks ofpattern recognition, demonstrates the beauty and the pitfalls ofscientific research, and encourages good habits in readingmathematical text.
This one volume treatise presents a comprehensive discussion of moire metrology analysis. The authors work from a new point of view, treating the gratings used in moire analysis as an artificial analog to electromagnetic waves, thereby comparing moire analysis with conventional optical methods based on wave properties such as interferometry. It is shown that for every interferometric technique in metrology, there is an analogous technique in moire metrology and vice versa, and that scientists involved in optical metrology have a real choice between interferometric and moire methods.
Explanation of optical art, an artistic development in the 1960s, and how it achieved its singular effects
The companion title, Linear Algebra, has sold over 8,000 copies The writing style is very accessible The material can be covered easily in a one-year or one-term course Includes Noah Snyder's proof of the Mason-Stothers polynomial abc theorem New material included on product structure for matrices including descriptions of the conjugation representation of the diagonal group
This book presents the proceedings of the 2018 International Conference on Security with Intelligent Computing and Big-data Services (SICBS 2018). With the proliferation of security with intelligent computing and big-data services, the issues of information security, big data, intelligent computing, blockchain technology, and network security have attracted a growing number of researchers. Discussing topics in areas including blockchain technology and applications; multimedia security; information processing; network, cloud and IoT security; cryptography and cryptosystems; as well as learning and intelligent computing and information hiding, the book provides a platform for researchers, engineers, academics and industrial professionals from around the globe to present their work in security-related areas. It not only introduces novel and interesting ideas, but also stimulates discussions and inspires new ideas.
Optical Methods of Measurement: Wholefield Techniques, Second Edition provides a comprehensive collection of wholefield optical measurement techniques for engineering applications. Along with the reorganization of contents, this edition includes a new chapter on optical interference, new material on nondiffracting and singular beams and their applications, and updated bibliography and additional reading sections. The book explores the propagation of laser beams, metrological applications of phase-singular beams, various detectors such as CCD and CMOS devices, and recording materials. It also covers interference, diffraction, and digital fringe pattern measurement techniques, with special emphasis on phase measurement interferometry and algorithms. The remainder of the book focuses on theory, experimental arrangements, and applications of wholefield techniques. The author discusses digital hologram interferometry, digital speckle photography, digital speckle pattern interferometry, Talbot interferometry, and holophotoelasticity. This updated book compiles the major wholefield methods of measurement in one volume. It provides a solid understanding of the techniques by describing the physics behind them. In addition, the examples given illustrate how the techniques solve measurement problems.