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Monomolecular assemblies on substrates, now termed Langmuir-Blodgett (LB) films, have been studied for over half a century. Their development can be viewed in three stages. Following the pioneering work of Irving Langmuir and Katharine Blodgett in the late 1930s there was a brief flurry of activity just before and just after the Second World War. Many years later Hans Kuhn published his stimulating work on energy transfer. This German contribution to the field, made in the mid-1960s, can be regarded as laying the foundation for studies of artificial systems of cooperat ing molecules on solid substrates. However, the resurgence of activity in academic and industrial laboratories, which has resulted in four large international con ferences, would not have occurred but for British and French groups highlighting the possible applications of LB films in thefield of electronics. Many academic and industrial establishments involved in high technology are now active in or maintaining a watching brief on the field. Nevertheless this impor tant area of solid state science is still perhaps largely unfamiliar to many involved in materials or electronic device research. The richness of the variety of organic molecular materials suitable for LB film deposition offers enormous scope for those interested in their basic properties or their practical applications. LB films are now an integral part of the field of molecular electronics. It seems inevitable that they will play some role in replacing inorganic materials in certain areas of application.
Owing to the increased availability of synchrotron sources, surface X-ray scattering is a rapidly expanding technique with important applications to surface structures and surface phase transitions, roughening of surfaces and interfaces, and the structure of liquid surfaces, including polymers, liquid crystals, and organic films. Surface studies with neutrons, on the other hand provide important information on liquid andmagnetic films. The contributions to this volume, written by active researchers in the field, provide an up-to-date overview of the highly sophisticated techniques and their applications.
Characterization of Materials (formerly Methods in Materials Research) provides comprehensive up-to-date coverage of materials characterization techniques including computational and theoretical methods as well as crystallography, mechanical testing, thermal analysis, optical imaging and spectroscopy, and more. Editor-in-Chief, Elton Kaufmann, Ph.D. is Associate Director of the Strategic Planning Group at the Argonne National Laboratory and has published approximately 100 technical papers in refereed journals and books. Dr. Kaufmann has assembled leading experts from academia, government, and industry to provide: A comprehensive up-to-date collection of methods used in the characterization of materials Articles on various methods from standard to cutting edge Periodic online updates to keep pace with latest developments A user-friendly format that is easy and simple to search and navigate Characterization of Materials is a collection of characterization methods that is widely applicable in the wide and diverse field of materials research irrespective of discipline or ultimate application and with which researchers, engineers, and educators must have familiarity. Methods covered include: General Vacuum Techniques X-Ray Powder Diffraction High Strain Rate Testing Deep Level Transient Spectroscopy Cyclic Voltammetry Extended X-Ray Absorption Fine Structure Low Energy Electron Diffraction Thermogravimetric Analysis Magnetometry Transmission Electron Microscopy Ultraviolet Photoelectron Spectroscopy This reference work is also available as a convenient online edition. For information regarding the online edition, please visit: www.mrw.interscience.wiley.com/com
The X-ray standing wave (XSW) technique is an X-ray interferometric method combining diffraction with a multitude of spectroscopic techniques. It is extremely powerful for obtaining information about virtually all properties of surfaces and interfaces on the atomic scale. However, as with any other technique, it has strengths and limitations. The proper use and necessary understanding of this method requires knowledge in quite different fields of physics and technology. This volume presents comprehensively the theoretical background, technical requirements and distinguished experimental highlights of the technique. Containing contributions from the most prominent experts of the technique, such as Andre Authier, Boris Batterman, Michael J Bedzyk, Jene Golovchenko, Victor Kohn, Michail Kovalchuk, Gerhard Materlik and D Phil Woodruff, the book equips scientists with all the necessary information and knowledge to understand and use the XSW technique in practically all applications.