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Written by world-renowned authors, this unique compendium presents the most updated progress in pattern recognition and computer vision (PRCV), fully reflecting the strong international research interests in the artificial intelligence arena.Machine learning has been the key to current developments in PRCV. This useful comprehensive volume complements the previous five editions of the book. It places great emphasis on the use of deep learning in many aspects of PRCV applications, not readily available in other reference text.
This volume contains all papers presented at SSPR 2002 and SPR 2002 hosted by the University of Windsor, Windsor, Ontario, Canada, August 6-9, 2002. This was the third time these two workshops were held back-to-back. SSPR was the ninth International Workshop on Structural and Syntactic Pattern Recognition and the SPR was the fourth International Workshop on Statis- cal Techniques in Pattern Recognition. These workshops have traditionally been held in conjunction with ICPR (International Conference on Pattern Recog- tion), and are the major events for technical committees TC2 and TC1, resp- tively, of the International Association of Pattern Recognition (IAPR). The workshops were held in parallel and closely coordinated. This was an attempt to resolve the dilemma of how to deal, in the light of the progressive specialization of pattern recognition, with the need for narrow-focus workshops without further fragmenting the ?eld and introducing yet another conference that would compete for the time and resources of potential participants. A total of 116 papers were received from many countries with the submission and reviewingprocesses beingcarried out separately for each workshop. A total of 45 papers were accepted for oral presentation and 35 for posters. In addition four invited speakers presented informative talks and overviews of their research. They were: Tom Dietterich, Oregon State University, USA Sven Dickinson, the University of Toronto, Canada Edwin Hancock, University of York, UK Anil Jain, Michigan State University, USA SSPR 2002 and SPR 2002 were sponsored by the IAPR and the University of Windsor.
Statistical pattern recognition relates to the use of statistical techniques for analysing data measurements in order to extract information and make justified decisions. It is a very active area of study and research, which has seen many advances in recent years. Applications such as data mining, web searching, multimedia data retrieval, face recognition, and cursive handwriting recognition, all require robust and efficient pattern recognition techniques. This third edition provides an introduction to statistical pattern theory and techniques, with material drawn from a wide range of fields, including the areas of engineering, statistics, computer science and the social sciences. The book has been updated to cover new methods and applications, and includes a wide range of techniques such as Bayesian methods, neural networks, support vector machines, feature selection and feature reduction techniques.Technical descriptions and motivations are provided, and the techniques are illustrated using real examples. Statistical Pattern Recognition, 3rd Edition: Provides a self-contained introduction to statistical pattern recognition. Includes new material presenting the analysis of complex networks. Introduces readers to methods for Bayesian density estimation. Presents descriptions of new applications in biometrics, security, finance and condition monitoring. Provides descriptions and guidance for implementing techniques, which will be invaluable to software engineers and developers seeking to develop real applications Describes mathematically the range of statistical pattern recognition techniques. Presents a variety of exercises including more extensive computer projects. The in-depth technical descriptions make the book suitable for senior undergraduate and graduate students in statistics, computer science and engineering. Statistical Pattern Recognition is also an excellent reference source for technical professionals. Chapters have been arranged to facilitate implementation of the techniques by software engineers and developers in non-statistical engineering fields. www.wiley.com/go/statistical_pattern_recognition
This monograph is intended to cover several major applications of pattern recognition. After a brief introduction to pattern recognition in Chapter 1, the two major approaches, statistical approach and syntactic approach, are reviewed in Chapter 2, and 3, respectively. Other topics include the application of pattern recognition to seismic wave interpretation, to system reliability problems, to medical data analysis, as well as character and speech recognition.
The 1985 Amsterdam conference brought together researchers active in pattern recognition methodology and the development of practical applications. The first part of the book covers various methodological aspects of image processing, knowledge based and model driven image understanding systems, 3-D reconstruction methods, and application oriented papers. Part II deals with aspects of statistical pattern recognition, the problem of population classification, and topics common to both pattern recognition and artificial intelligence.
The Wiley-Interscience Paperback Series consists of selected books that have been made more accessible to consumers in an effort to increase global appeal and general circulation. With these new unabridged softcover volumes, Wiley hopes to extend the lives of these works by making them available to future generations of statisticians, mathematicians, and scientists. "For both applied and theoretical statisticians as well as investigators working in the many areas in which relevant use can be made of discriminant techniques, this monograph provides a modern, comprehensive, and systematic account of discriminant analysis, with the focus on the more recent advances in the field." –SciTech Book News ". . . a very useful source of information for any researcher working in discriminant analysis and pattern recognition." –Computational Statistics Discriminant Analysis and Statistical Pattern Recognition provides a systematic account of the subject. While the focus is on practical considerations, both theoretical and practical issues are explored. Among the advances covered are regularized discriminant analysis and bootstrap-based assessment of the performance of a sample-based discriminant rule, and extensions of discriminant analysis motivated by problems in statistical image analysis. The accompanying bibliography contains over 1,200 references.
This book is the outcome of the successful NATO Advanced Study Institute on Pattern Recognition Theory and Applications, held at St. Anne's College, Oxford, in April 1981., The aim of the meeting was to review the recent advances in the theory of pattern recognition and to assess its current and future practical potential. The theme of the Institute - the decision making aspects of pattern recognition with the emphasis on the novel hybrid approaches - and its scope - a high level tutorial coverage of pattern recognition methodologies counterpointed with contrib uted papers on advanced theoretical topics and applications - are faithfully reflected by the volume. The material is divided into five sections: 1. Methodology 2. Image Understanding and Interpretation 3. Medical Applications 4. Speech Processing and Other Applications 5. Panel Discussions. The first section covers a broad spectrum of pattern recognition methodologies, including geometric, statistical, fuzzy set, syntactic, graph-theoretic and hybrid approaches. Its cove,r age of hybrid methods places the volume in a unique position among existing books on pattern recognition. The second section provides an extensive treatment of the topical problem of image understanding from both the artificial intelligence and pattern recognition points of view. The two application sections demonstrate the usefulness of the novel methodologies in traditional pattern 'recognition application areas. They address the problems of hardware/software implementation and of algorithm robustness, flexibility and general reliability. The final section reports on a panel discussion held during the Institute.
1. Introduction to pattern classification. 1.1. Pattern classification. 1.2. Induction algorithms. 1.3. Rule induction. 1.4. Decision trees. 1.5. Bayesian methods. 1.6. Other induction methods -- 2. Introduction to ensemble learning. 2.1. Back to the roots. 2.2. The wisdom of crowds. 2.3. The bagging algorithm. 2.4. The boosting algorithm. 2.5. The AdaBoost algorithm. 2.6. No free lunch theorem and ensemble learning. 2.7. Bias-variance decomposition and ensemble learning. 2.8. Occam's razor and ensemble learning. 2.9. Classifier dependency. 2.10. Ensemble methods for advanced classification tasks -- 3. Ensemble classification. 3.1. Fusions methods. 3.2. Selecting classification. 3.3. Mixture of experts and meta learning -- 4. Ensemble diversity. 4.1. Overview. 4.2. Manipulating the inducer. 4.3. Manipulating the training samples. 4.4. Manipulating the target attribute representation. 4.5. Partitioning the search space. 4.6. Multi-inducers. 4.7. Measuring the diversity -- 5. Ensemble selection. 5.1. Ensemble selection. 5.2. Pre selection of the ensemble size. 5.3. Selection of the ensemble size while training. 5.4. Pruning - post selection of the ensemble size -- 6. Error correcting output codes. 6.1. Code-matrix decomposition of multiclass problems. 6.2. Type I - training an ensemble given a code-matrix. 6.3. Type II - adapting code-matrices to the multiclass problems -- 7. Evaluating ensembles of classifiers. 7.1. Generalization error. 7.2. Computational complexity. 7.3. Interpretability of the resulting ensemble. 7.4. Scalability to large datasets. 7.5. Robustness. 7.6. Stability. 7.7. Flexibility. 7.8. Usability. 7.9. Software availability. 7.10. Which ensemble method should be used?
This book constitutes the refereed proceedings of the 12th International Workshop on Structural and Syntactic Pattern Recognition, SSPR 2008 and the 7th International Workshop on Statistical Techniques in Pattern Recognition, SPR 2008, held jointly in Orlando, FL, USA, in December 2008 as a satellite event of the 19th International Conference of Pattern Recognition, ICPR 2008. The 56 revised full papers and 42 revised poster papers presented together with the abstracts of 4 invited papers were carefully reviewed and selected from 175 submissions. The papers are organized in topical sections on graph-based methods, probabilistic and stochastic structural models for PR, image and video analysis, shape analysis, kernel methods, recognition and classification, applications, ensemble methods, feature selection, density estimation and clustering, computer vision and biometrics, pattern recognition and applications, pattern recognition, as well as feature selection and clustering.