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Covers the statistical analysis and optimization issues arising due to increased process variations in current technologies. Comprises a valuable reference for statistical analysis and optimization techniques in current and future VLSI design for CAD-Tool developers and for researchers interested in starting work in this very active area of research. Written by author who lead much research in this area who provide novel ideas and approaches to handle the addressed issues
Covers the statistical analysis and optimization issues arising due to increased process variations in current technologies. Comprises a valuable reference for statistical analysis and optimization techniques in current and future VLSI design for CAD-Tool developers and for researchers interested in starting work in this very active area of research. Written by author who lead much research in this area who provide novel ideas and approaches to handle the addressed issues
Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and efficient modeling or characterization of variations from the device to the architecture level have become imperative for the successful design of VLSI chips. This book provides readers with tools for variation-aware design methodologies and computer-aided design (CAD) of VLSI systems, in the presence of process variations at the nanometer scale. It presents the latest developments for modeling and analysis, with a focus on statistical interconnect modeling, statistical parasitic extractions, statistical full-chip leakage and dynamic power analysis considering spatial correlations, statistical analysis and modeling for large global interconnects and analog/mixed-signal circuits. Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits; Helps chip designers understand the potential and limitations of their design tools, improving their design productivity; Presents analysis of each algorithm with practical applications in the context of real circuit design; Includes numerical examples for the quantitative analysis and evaluation of algorithms presented. Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits; Helps chip designers understand the potential and limitations of their design tools, improving their design productivity; Presents analysis of each algorithm with practical applications in the context of real circuit design; Includes numerical examples for the quantitative analysis and evaluation of algorithms presented.
Recent years have seen rapid strides in the level of sophistication of VLSI circuits. On the performance front, there is a vital need for techniques to design fast, low-power chips with minimum area for increasingly complex systems, while on the economic side there is the vastly increased pressure of time-to-market. These pressures have made the use of CAD tools mandatory in designing complex systems. Timing Analysis and Optimization of Sequential Circuits describes CAD algorithms for analyzing and optimizing the timing behavior of sequential circuits with special reference to performance parameters such as power and area. A unified approach to performance analysis and optimization of sequential circuits is presented. The state of the art in timing analysis and optimization techniques is described for circuits using edge-triggered or level-sensitive memory elements. Specific emphasis is placed on two methods that are true sequential timing optimizations techniques: retiming and clock skew optimization. Timing Analysis and Optimization of Sequential Circuits covers the following topics: Algorithms for sequential timing analysis Fast algorithms for clock skew optimization and their applications Efficient techniques for retiming large sequential circuits Coupling sequential and combinational optimizations. Timing Analysis and Optimization of Sequential Circuits is written for graduate students, researchers and professionals in the area of CAD for VLSI and VLSI circuit design.
This volume features the refereed proceedings of the 17th International Workshop on Power and Timing Modeling, Optimization and Simulation. Papers cover high level design, low power design techniques, low power analog circuits, statistical static timing analysis, power modeling and optimization, low power routing optimization, security and asynchronous design, low power applications, modeling and optimization, and more.
This book constitutes the thoroughly refereed post-conference proceedings of 19th International Workshop on Power and Timing Modeling, Optimization and Simulation, PATMOS 2009, featuring Integrated Circuit and System Design, held in Delft, The Netherlands during September 9-11, 2009. The 26 revised full papers and 10 revised poster papers presented were carefully reviewed and selected from numerous submissions. The papers are organized in topical sections on variability & statistical timing, circuit level techniques, power management, low power circuits & technology, system level techniques, power & timing optimization techniques, self-timed circuits, low power circuit analysis & optimization, and low power design studies.
This book constitutes the thoroughly refereed post-conference proceedings of 19th International Workshop on Power and Timing Modeling, Optimization and Simulation, PATMOS 2009, featuring Integrated Circuit and System Design, held in Delft, The Netherlands during September 9-11, 2009. The 26 revised full papers and 10 revised poster papers presented were carefully reviewed and selected from numerous submissions. The papers are organized in topical sections on variability & statistical timing, circuit level techniques, power management, low power circuits & technology, system level techniques, power & timing optimization techniques, self-timed circuits, low power circuit analysis & optimization, and low power design studies.
This volume is the first complete overview of VLSI design methods that use statistical techniques for dealing with the random phenomena that are inherent in all VLSI manufacturing processes. VLSI design today cannot be performed without taking into account economic-related issues such as yield, cost and performance oriented tradeoffs. The book includes practical methods relevant to real life applications. It contains edited papers by top industrial and academic specialists in the field. These papers describe all three categories of CAD tools employed for statistical design: IC performance optimization tools, process simulation tools and tools for characterization of process fluctuations. In each category both practical approaches and more theoretical approaches are presented.