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Springer Handbook of Condensed Matter and Materials Data provides a concise compilation of data and functional relationships from the fields of solid-state physics and materials in this 1200 page volume. The data, encapsulated in 914 tables and 1025 illustrations, have been selected and extracted primarily from the extensive high-quality data collection Landolt-Börnstein and also from other systematic data sources and recent publications of physical and technical property data. Many chapters are authored by Landolt-Börnstein editors, including the prominent Springer Handbook editors, W. Martienssen and H. Warlimont themselves. The Handbook is designed to be useful as a desktop reference for fast and easy retrieval of essential and reliable data in the lab or office. References to more extensive data sources are also provided in the book and by interlinking to the relevant sources on the enclosed CD-ROM. Physicists, chemists and engineers engaged in fields of solid-state sciences and materials technologies in research, development and application will appreciate the ready access to the key information coherently organized within this wide-ranging Handbook. From the reviews: "...this is the most complete compilation I have ever seen... When I received the book, I immediately searched for data I never found elsewhere..., and I found them rapidly... No doubt that this book will soon be in every library and on the desk of most solid state scientists and engineers. It will never be at rest." -Physicalia Magazine
The second edition of this well-received handbook is the most concise yet comprehensive compilation of materials data. The chapters provide succinct descriptions and summarize essential and reliable data for various types of materials. The information is amply illustrated with 900 tables and 1050 figures selected primarily from well-established data collections, such as Landolt-Börnstein, which is now part of the SpringerMaterials database. The new edition of the Springer Handbook of Materials Data starts by presenting the latest CODATA recommended values of the fundamental physical constants and provides comprehensive tables of the physical and physicochemical properties of the elements. 25 chapters collect and summarize the most frequently used data and relationships for numerous metals, nonmetallic materials, functional materials and selected special structures such as liquid crystals and nanostructured materials. Along with careful updates to the content and the inclusion of timely and extensive references, this second edition includes new chapters on polymers, materials for solid catalysts and low-dimensional semiconductors. This handbook is an authoritative reference resource for engineers, scientists and students engaged in the vast field of materials science.
Springer Handbook of Condensed Matter and Materials Data provides a concise compilation of data and functional relationships from the fields of solid-state physics and materials in this 1200 page volume. The data, encapsulated in 914 tables and 1025 illustrations, have been selected and extracted primarily from the extensive high-quality data collection Landolt-Börnstein and also from other systematic data sources and recent publications of physical and technical property data. Many chapters are authored by Landolt-Börnstein editors, including the prominent Springer Handbook editors, W. Martienssen and H. Warlimont themselves. The Handbook is designed to be useful as a desktop reference for fast and easy retrieval of essential and reliable data in the lab or office. References to more extensive data sources are also provided in the book and by interlinking to the relevant sources on the enclosed CD-ROM. Physicists, chemists and engineers engaged in fields of solid-state sciences and materials technologies in research, development and application will appreciate the ready access to the key information coherently organized within this wide-ranging Handbook. From the reviews: "...this is the most complete compilation I have ever seen... When I received the book, I immediately searched for data I never found elsewhere..., and I found them rapidly... No doubt that this book will soon be in every library and on the desk of most solid state scientists and engineers. It will never be at rest." -Physicalia Magazine
This comprehensive, handbook-style survey of diffusion in condensed matter gives detailed insight into diffusion as the process of particle transport due to stochastic movement. It is understood and presented as a phenomenon of crucial relevance for a large variety of processes and materials. In this book, all aspects of the theoretical fundamentals, experimental techniques, highlights of current developments and results for solids, liquids and interfaces are presented.
The first reference of its kind in the rapidly emerging field of computational approachs to materials research, this is a compendium of perspective-providing and topical articles written to inform students and non-specialists of the current status and capabilities of modelling and simulation. From the standpoint of methodology, the development follows a multiscale approach with emphasis on electronic-structure, atomistic, and mesoscale methods, as well as mathematical analysis and rate processes. Basic models are treated across traditional disciplines, not only in the discussion of methods but also in chapters on crystal defects, microstructure, fluids, polymers and soft matter. Written by authors who are actively participating in the current development, this collection of 150 articles has the breadth and depth to be a major contributor toward defining the field of computational materials. In addition, there are 40 commentaries by highly respected researchers, presenting various views that should interest the future generations of the community. Subject Editors: Martin Bazant, MIT; Bruce Boghosian, Tufts University; Richard Catlow, Royal Institution; Long-Qing Chen, Pennsylvania State University; William Curtin, Brown University; Tomas Diaz de la Rubia, Lawrence Livermore National Laboratory; Nicolas Hadjiconstantinou, MIT; Mark F. Horstemeyer, Mississippi State University; Efthimios Kaxiras, Harvard University; L. Mahadevan, Harvard University; Dimitrios Maroudas, University of Massachusetts; Nicola Marzari, MIT; Horia Metiu, University of California Santa Barbara; Gregory C. Rutledge, MIT; David J. Srolovitz, Princeton University; Bernhardt L. Trout, MIT; Dieter Wolf, Argonne National Laboratory.
Comprises a comprehensive reference source that unifies the entire fields of atomic molecular and optical (AMO) physics, assembling the principal ideas, techniques and results of the field. 92 chapters written by about 120 authors present the principal ideas, techniques and results of the field, together with a guide to the primary research literature (carefully edited to ensure a uniform coverage and style, with extensive cross-references). Along with a summary of key ideas, techniques, and results, many chapters offer diagrams of apparatus, graphs, and tables of data. From atomic spectroscopy to applications in comets, one finds contributions from over 100 authors, all leaders in their respective disciplines. Substantially updated and expanded since the original 1996 edition, it now contains several entirely new chapters covering current areas of great research interest that barely existed in 1996, such as Bose-Einstein condensation, quantum information, and cosmological variations of the fundamental constants. A fully-searchable CD- ROM version of the contents accompanies the handbook.
This Springer Handbook of Metrology and Testing presents the principles of Metrology – the science of measurement – and the methods and techniques of Testing – determining the characteristics of a given product – as they apply to chemical and microstructural analysis, and to the measurement and testing of materials properties and performance, including modelling and simulation. The principal motivation for this Handbook stems from the increasing demands of technology for measurement results that can be used globally. Measurements within a local laboratory or manufacturing facility must be able to be reproduced accurately anywhere in the world. The book integrates knowledge from basic sciences and engineering disciplines, compiled by experts from internationally known metrology and testing institutions, and academe, as well as from industry, and conformity-assessment and accreditation bodies. The Commission of the European Union has expressed this as there is no science without measurements, no quality without testing, and no global markets without standards.
This Handbook compiles advanced methods for materials measurement and characterization from the macroscopic to the nano-scale. Materials professionals need not only handbooks of materials data but clear guidelines and standards for how to measure the full spectrum of materials characteristics of new materials ans systems. Since materials science forms a bridge between the more traditonal fields of physics, engineering, and chemistry, unifying the varying perspectives and covering the full gamut of properties also serves a useful purpose. This handbook is the first dedicated to these practical and important considerations.
Electronic structure and physical properties of strongly correlated materials containing elements with partially filled 3d, 4d, 4f and 5f electronic shells is analyzed by Dynamical Mean-Field Theory (DMFT). DMFT is the most universal and effective tool used for the theoretical investigation of electronic states with strong correlation effects. In the present book the basics of the method are given and its application to various material classes is shown. The book is aimed at a broad readership: theoretical physicists and experimentalists studying strongly correlated systems. It also serves as a handbook for students and all those who want to be acquainted with fast developing filed of condensed matter physics.
Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.