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Issues in Analysis, Measurement, Monitoring, Imaging, and Remote Sensing Technology: 2011 Edition is a ScholarlyEditions™ eBook that delivers timely, authoritative, and comprehensive information about Analysis, Measurement, Monitoring, Imaging, and Remote Sensing Technology. The editors have built Issues in Analysis, Measurement, Monitoring, Imaging, and Remote Sensing Technology: 2011 Edition on the vast information databases of ScholarlyNews.™ You can expect the information about Analysis, Measurement, Monitoring, Imaging, and Remote Sensing Technology in this eBook to be deeper than what you can access anywhere else, as well as consistently reliable, authoritative, informed, and relevant. The content of Issues in Analysis, Measurement, Monitoring, Imaging, and Remote Sensing Technology: 2011 Edition has been produced by the world’s leading scientists, engineers, analysts, research institutions, and companies. All of the content is from peer-reviewed sources, and all of it is written, assembled, and edited by the editors at ScholarlyEditions™ and available exclusively from us. You now have a source you can cite with authority, confidence, and credibility. More information is available at http://www.ScholarlyEditions.com/.
Derived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research. Topics include: * Stationary Beam Methods: Transmission Electron Microscopy/ Electron Energy Loss Spectroscopy/ Convergent Electron Beam Diffraction/ Low Energy Electron Microscopy/ Electron Holographic Methods * Scanning Beam Methods: Scanning Transmission Electron Microscopy/ Scanning Auger and XPS Microscopy/ Scanning Microanalysis/ Imaging Secondary Ion Mass Spectrometry * Magnetic Microscopy: Scanning Electron Microscopy with Polarization Analysis/ Spin Polarized Low Energy Electron Microscopy Materials scientists as well as any surface scientist will find this book an invaluable source of information for the principles of electron microscopy.
This book presents photoelectron spectroscopy as a valuable method for studying the electronic structures of various solid materials in the bulk state, on surfaces, and at buried interfaces. This second edition introduces the advanced technique of high-resolution and high-efficiency spin- and momentum-resolved photoelectron spectroscopy using a novel momentum microscope, enabling high-precision measurements down to a length scale of some tens of nanometers. The book also deals with fundamental concepts and approaches to applying this and other complementary techniques, such as inverse photoemission, photoelectron diffraction, scanning tunneling spectroscopy, as well as photon spectroscopy based on (soft) x-ray absorption and resonance inelastic (soft) x-ray scattering. This book is the ideal tool to expand readers’ understanding of this marvelously versatile experimental method, as well as the electronic structures of metals and insulators.
Since the early 20th century, X-ray and electron scattering has provided a powerful means by which the location of atoms can be identified in gas-phase molecules and condensed matter with sub-atomic spatial resolution. Scattering techniques can also provide valuable observables of the fundamental properties of electrons in matter such as an electron’s spin and its energy. In recent years, significant technological developments in both X-ray and electron scattering have paved the way to time-resolved analogues capable of capturing real-time snapshots of transient structures undergoing a photochemical reaction. Structural Dynamics with X-ray and Electron Scattering is a two-part book that firstly introduces the fundamental background to scattering theory and photochemical phenomena of interest. The second part discusses the latest advances and research results from the application of ultrafast scattering techniques to imaging the structure and dynamics of gas-phase molecules and condensed matter. This book aims to provide a unifying platform for X-ray and electron scattering.
This book focuses on X-ray spectroscopy for chemical state analysis covering X-ray physics, spectroscopic characteristics used for functional and toxic materials, and the author's ideas related to X-ray experiments. This book also provides novel theoretical interpretations of X-ray spectra along with experimental techniques needed for both synchrotron radiation users and laboratory experimentalists. Presenting not only practical information, this book also covers basic knowledge of commercially available spectrometers and the basic physics of optics and electromagnetism related to X-rays. Furthermore, the author introduces the forgotten history of X-ray physics in the beginning of twentieth century. This book is of use for researchers studying catalysts, charge-transfer materials, surface characterization, and toxic trace elements via X-ray spectroscopy for chemical state analysis as well as quantitative analysis.
This timely text covers the theory and practice of surface and nanostructure determination by low-energy electron diffraction (LEED) and surface X-ray diffraction (SXRD): it is the first book on such quantitative structure analysis in over 30 years. It provides a detailed description of the theory, including cutting-edge developments and tested experimental methods. The focus is on quantitative techniques, while the qualitative interpretation of the LEED pattern without quantitative I(V) analysis is also included. Topics covered include the future study of nanoparticles, quasicrystals, thermal parameters, disorder and modulations of surfaces with LEED, with introductory sections enabling the non-specialist to follow all the concepts and applications discussed. With numerous colour figures throughout, this text is ideal for undergraduate and graduate students and researchers, whether experimentalists or theorists, in the fields of surface science, nanoscience and related technologies. It can serve as a textbook for graduate-level courses of one or two semesters.
Nanoalloys, Second Edition, provides a self-contained reference on the physics and chemistry of nanoscale alloys, dealing with all important aspects that range from the theoretical concepts and the practical synthesis methods to the characterization tools. The book also covers modern applications of nanoalloys in materials science, catalysis or nanomedicine and discusses their possible toxicity. - Covers fundamentals and applicative aspects of nanoalloys in a balanced presentation, including theoretical and experimental perspectives - Describes physical and chemical approaches, synthesis and characterization tools - Illustrates the potential benefit of alloying on various applications ranging from materials science to energy production and nanomedicine - Updates and adds topics not fully developed at the time of the 1st edition, such as toxicity and energy applications
This book is structured by two-level presentation including a simple descriptive treatment and slightly more in-depth discussions of specific topics. The first-level treatment covers the notions, terminology and techniques that are required to use a synchrotron facility. The book is therefore an ideal first step for all those beginning to use synchrotron light for their work or are considering it. The treated topics include the basic functioning mechanisms of synchrotrons and free electron lasers a description of sychrotron-based techniques in x-ray imaging and radiology, spectroscopy, microscopy and spectromicroscopy, EXAFS, crystallography and scattering, and microfabrication.