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Successful transmission electron microscopy in all of its manifestations depends on the quality of the specimens examined. Biological specimen preparation protocols have usually been more rigorous and time consuming than those in the physical sciences. For this reason, there has been a wealth of scienti?c literature detailing speci?c preparation steps and numerous excellent books on the preparation of b- logical thin specimens. This does not mean to imply that physical science specimen preparation is trivial. For the most part, most physical science thin specimen pre- ration protocols can be executed in a matter of a few hours using straightforward steps. Over the years, there has been a steady stream of papers written on various aspects of preparing thin specimens from bulk materials. However, aside from s- eral seminal textbooks and a series of book compilations produced by the Material Research Society in the 1990s, no recent comprehensive books on thin spe- men preparation have appeared until this present work, ?rst in French and now in English. Everyone knows that the data needed to solve a problem quickly are more imp- tant than ever. A modern TEM laboratory with supporting SEMs, light microscopes, analytical spectrometers, computers, and specimen preparation equipment is an investment of several million US dollars. Fifty years ago, electropolishing, chemical polishing, and replication methods were the principal specimen preparation me- ods.
Scanning electr on microscopy (SEM) and x-ray microanalysis can produce magnified images and in situ chemical information from virtually any type of specimen. The two instruments generally operate in a high vacuum and a very dry environment in order to produce the high energy beam of electrons needed for imaging and analysis. With a few notable exceptions, most specimens destined for study in the SEM are poor conductors and composed of beam sensitive light elements containing variable amounts of water. In the SEM, the imaging system depends on the specimen being sufficiently electrically conductive to ensure that the bulk of the incoming electrons go to ground. The formation of the image depends on collecting the different signals that are scattered as a consequence of the high energy beam interacting with the sample. Backscattered electrons and secondary electrons are generated within the primary beam-sample interactive volume and are the two principal signals used to form images. The backscattered electron coefficient ( ? ) increases with increasing atomic number of the specimen, whereas the secondary electron coefficient ( ? ) is relatively insensitive to atomic number. This fundamental diff- ence in the two signals can have an important effect on the way samples may need to be prepared. The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.
This book provides a solid overview of the important metallurgical concepts related to the microstructures of irons and steels, and it provides detailed guidelines for the proper metallographic techniques used to reveal, capture, and understand microstructures. This book provides clearly written explanations of important concepts, and step-by-step instructions for equipment selection and use, microscopy techniques, specimen preparation, and etching. Dozens of concise and helpful “metallographic tips” are included in the chapters on laboratory practices and specimen preparation. The book features over 500 representative microstructures, with discussions of how the structures can be altered by heat treatment and other means. A handy index to these images is provided, so the book can also be used as an atlas of iron and steel microstructures.
This book contains all the necessary information and advice for anyone wishing to obtain electron micrographs showing the most accurate ultrastructural detail in thin sections of any type of biological specimen. The guidelines for the choice of preparative methods are based on an extensive survey of current laboratory practice. For the first time, in a textbook of this kind, the molecular events occurring during fixation and embedding are analysed in detail. The reasons for choosing particular specimen preparation methods are explained and guidance is given on how to modify established techniques to suit individual requirements. All the practical methods advocated are clearly described, with accompanying tables and the results obtainable are illustrated with many electron micrographs. Portland Press Series: Practical Methods in Electron Microscopy, Volume 17, Audrey M. Glauert, Editor Originally published in 1999. The Princeton Legacy Library uses the latest print-on-demand technology to again make available previously out-of-print books from the distinguished backlist of Princeton University Press. These editions preserve the original texts of these important books while presenting them in durable paperback and hardcover editions. The goal of the Princeton Legacy Library is to vastly increase access to the rich scholarly heritage found in the thousands of books published by Princeton University Press since its founding in 1905.
The microanalytical technique of atom probe tomography (APT) permits the spatial coordinates and elemental identities of the individual atoms within a small volume to be determined with near atomic resolution. Therefore, atom probe tomography provides a technique for acquiring atomic resolution three dimensional images of the solute distribution within the microstructures of materials. This monograph is designed to provide researchers and students the necessary information to plan and experimentally conduct an atom probe tomography experiment. The techniques required to visualize and to analyze the resulting three-dimensional data are also described. The monograph is organized into chapters each covering a specific aspect of the technique. The development of this powerful microanalytical technique from the origins offield ion microscopy in 1951, through the first three-dimensional atom probe prototype built in 1986 to today's commercial state-of-the-art three dimensional atom probe is documented in chapter 1. A general introduction to atom probe tomography is also presented in chapter 1. The various methods to fabricate suitable needle-shaped specimens are presented in chapter 2. The procedure to form field ion images of the needle-shaped specimen is described in chapter 3. In addition, the appearance of microstructural features and the information that may be estimated from field ion microscopy are summarized. A brief account of the theoretical basis for processes of field ionization and field evaporation is also included.
The importance of accurate sample preparation techniques cannot be overstated--meticulous sample preparation is essential. Often overlooked, it is the midway point where the analytes from the sample matrix are transformed so they are suitable for analysis. Even the best analytical techniques cannot rectify problems generated by sloppy sample pretreatment. Devoted entirely to teaching and reinforcing these necessary pretreatment steps, Sample Preparation Techniques in Analytical Chemistry addresses diverse aspects of this important measurement step. These include: * State-of-the-art extraction techniques for organic and inorganic analytes * Sample preparation in biological measurements * Sample pretreatment in microscopy * Surface enhancement as a sample preparation tool in Raman and IR spectroscopy * Sample concentration and clean-up methods * Quality control steps Designed to serve as a text in an undergraduate or graduate level curriculum, Sample Preparation Techniques in Analytical Chemistry also provides an invaluable reference tool for analytical chemists in the chemical, biological, pharmaceutical, environmental, and materials sciences.
Successful transmission electron microscopy in all of its manifestations depends on the quality of the specimens examined. Biological specimen preparation protocols have usually been more rigorous and time consuming than those in the physical sciences. For this reason, there has been a wealth of scienti c literature detailing speci c preparation steps and numerous excellent books on the preparation of b- logical thin specimens. This does not mean to imply that physical science specimen preparation is trivial. For the most part, most physical science thin specimen pre- ration protocols can be executed in a matter of a few hours using straightforward steps. Over the years, there has been a steady stream of papers written on various aspects of preparing thin specimens from bulk materials. However, aside from s- eral seminal textbooks and a series of book compilations produced by the Material Research Society in the 1990s, no recent comprehensive books on thin specimen preparation have appeared until this present work, rst in French and now in English. Everyone knows that the data needed to solve a problem quickly are more imp- tant than ever. A modern TEM laboratory with supporting SEMs, light microscopes, analytical spectrometers, computers, and specimen preparation equipment is an investment of several million US dollars. Fifty years ago, electropolishing, chemical polishing, and replication methods were the principal specimen preparation me- ods.
Analytical Sample Preparation With Nano- and Other High-Performance Materials covers advanced sample treatment techniques and the new materials that can be used to boost their performance. The evolution of sample treatment over the last two decades has resulted in the development of new techniques and application of new materials. This is a must-have resource for those studying advanced analytical techniques and the role of high-performance materials in analytical chemistry. The book explains the underlying principles needed to properly understand sample preparation, and also examines the latest materials - including nanomaterials - that result in greater sensitivity and specificity. The book begins with a section devoted to all the various sample preparation techniques and then continues with sections on high-performance sorbents and high-performance solvents. - Combines basic, fundamental principles and advanced concepts and applications for a comprehensive treatment of sample preparation with new materials - Defines nano- and other high-performance materials in this context, including carbon nanoparticles, inorganic nanoparticles, ionic liquids, supramolecular solvents, and more - Includes discussion of all the latest advancements and new findings in both techniques and materials used for proper sample preparation