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Spacecraft depend on electronic components that must perform reliably over missions measured in years and decades. Space radiation is a primary source of degradation, reliability issues, and potentially failure for these electronic components. Although simulation and modeling are valuable for understanding the radiation risk to microelectronics, there is no substitute for testing, and an increased use of commercial-off-the- shelf parts in spacecraft may actually increase requirements for testing, as opposed to simulation and modeling. Testing at the Speed of Light evaluates the nation's current capabilities and future needs for testing the effects of space radiation on microelectronics to ensure mission success and makes recommendations on how to provide effective stewardship of the necessary radiation test infrastructure for the foreseeable future.
This wide-ranging book summarizes the current knowledge of radiation defects in semiconductors, outlining the shortcomings of present experimental and modelling techniques and giving an outlook on future developments. It also provides information on the application of sensors in nuclear power plants.
The subject of this volume in the Astrophysics and Space Science Library is Electro magnetic Radiation in Space. It is essentially based on the lectures given at the third ESRO Summer School which was held from 19 July to 13 August, 1965, in Alpbach, Austria. Fifty-eight selected students attended the courses representing the following countries: Austria (2), Belgium (1), Denmark (1), France (12), Germany (10), Italy (7), Netherlands (2), Spain (4), Sweden (6), Switzerland (3), United Kingdom (9), United States (1). Thirteen lectures courses and nine seminars were given by sixteen different scientists in total. In this book the courses and seminars have been classified in three parts according to the kind of radiation which they mainly deal with: Ultraviolet Radiation, X Radiation and Cosmic Radiation. These parts can be broken down further in theo retical and observational aspects, whereas in the first and second part solar as well as stellar ultraviolet- and X-radiation can be distinguished. * Due to various reasons the publication of this volume had to be delayed; it was therefore judged appropriate to bring the text up to date. The various lecturers have been asked to revise the manuscripts and to eventually add new information which has been acquired in this rapidly evolving field of space astrophysics. Most authors have responded positively to this request, some even have completely rewritten the manuscript.
During their occupational activities in space, astronauts are exposed to ionising radiation from natural radiation sources present in this environment. They are, however, not usually classified as being occupationally exposed in the sense of the general ICRP system for radiation protection of workers applied on Earth. The exposure assessment and risk-related approach described in this report is clearly restricted to the special situation in space, and should not be applied to any other exposure situation on Earth. The report describes the terms and methods used to assess the radiation exposure of astronauts, and provides data for the assessment of organ doses.
This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metalOCooxideOCosemiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level. Contents: Single Event Effects in Avionics and on the Ground (E Normand); Soft Errors in Commercial Integrated Circuits (R C Baumann); System Level Single Event Upset Mitigation Strategies (W F Heidergott); Space Radiation Effects in Optocouplers (R A Reed et al.); The Effects of Space Radiation Exposure on Power MOSFETs: A Review (K Shenai et al.); Total Dose Effects in Linear Bipolar Integrated Circuits (H J Barnaby); Hardness Assurance for Commercial Microelectronics (R L Pease); Switching Oxide Traps (T R Oldham); Online and Realtime Dosimetry Using Optically Stimulated Luminescence (L Dusseau & J Gasiot); and other articles. Readership: Practitioners, researchers, managers and graduate students in electrical and electronic engineering, semiconductor science and technology, and microelectronics."
As part of the Vision for Space Exploration (VSE), NASA is planning for humans to revisit the Moon and someday go to Mars. An important consideration in this effort is protection against the exposure to space radiation. That radiation might result in severe long-term health consequences for astronauts on such missions if they are not adequately shielded. To help with these concerns, NASA asked the NRC to further the understanding of the risks of space radiation, to evaluate radiation shielding requirements, and recommend a strategic plan for developing appropriate mitigation capabilities. This book presents an assessment of current knowledge of the radiation environment; an examination of the effects of radiation on biological systems and mission equipment; an analysis of current plans for radiation protection; and a strategy for mitigating the risks to VSE astronauts.
This concise primer introduces the non-specialist reader to the physics of solar energetic particles (SEP) and systematically reviews the evidence for the two main mechanisms which lead to the so-called impulsive and gradual SEP events. More specifically, the timing of the onsets, the longitude distributions, the high-energy spectral shapes, the correlations with other solar phenomena (e.g. coronal mass ejections), as well as the all-important elemental and isotopic abundances of SEPs are investigated. Impulsive SEP events are related to magnetic reconnection in solar flares and jets. The concept of shock acceleration by scattering on self-amplified Alfvén waves is introduced, as is the evidence of reacceleration of impulsive-SEP material in the seed population accessed by the shocks in gradual events. The text then develops processes of transport of ions out to an observer. Finally, a new technique to determine the source plasma temperature in both impulsive and gradual events is demonstrated. Last but not least the role of SEP events as a radiation hazard in space is mentioned and a short discussion of the nature of the main particle telescope designs that have contributed to most of the SEP measurements is given.
This book reevaluates the health risks of ionizing radiation in light of data that have become available since the 1980 report on this subject was published. The data include new, much more reliable dose estimates for the A-bomb survivors, the results of an additional 14 years of follow-up of the survivors for cancer mortality, recent results of follow-up studies of persons irradiated for medical purposes, and results of relevant experiments with laboratory animals and cultured cells. It analyzes the data in terms of risk estimates for specific organs in relation to dose and time after exposure, and compares radiation effects between Japanese and Western populations.