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The NATO Advanced Research Workshop on Signal Processing and Pattern Recognition in Nondestructive Evaluation (NOE) of Materials was held August 19-22, 1987 at the Manoir St-Castin, Lac Beauport, Quebec, Canada. Modern signal processing, pattern recognition and artificial intelligence have been playing an increasingly important role in improving nondestructive evaluation and testing techniques. The cross fertilization of the two major areas can lead to major advances in NOE as well as presenting a new research area in signal processing. With this in mind, the Workshop provided a good review of progress and comparison of potential techniques, as well as constructive discussions and suggestions for effective use of modern signal processing to improve flaw detection, classification and prediction, as well as material characterization. This Proceedings volume includes most presentations given at the Workshop. This publication, like the meeting itself, is unique in the sense that it provides extensive interactions among the interrelated areas of NOE. The book starts with research advances on inverse problems and then covers different aspects of digital waveform processing in NOE and eddy current signal analysis. These are followed by four papers of pattern recognition and AI in NOE, and five papers of image processing and reconstruction in NOE. The last two papers deal with parameter estimation problems. Though the list of papers is not extensive, as the field of NOE signal processing is very new, the book has an excellent collection of both tutorial and research papers in this exciting new field.
The very significant advances in computer vision and pattern recognition and their applications in the last few years reflect the strong and growing interest in the field as well as the many opportunities and challenges it offers. The second edition of this handbook represents both the latest progress and updated knowledge in this dynamic field. The applications and technological issues are particularly emphasized in this edition to reflect the wide applicability of the field in many practical problems. To keep the book in a single volume, it is not possible to retain all chapters of the first edition. However, the chapters of both editions are well written for permanent reference. This indispensable handbook will continue to serve as an authoritative and comprehensive guide in the field.
"The book provides an up-to-date and authoritative treatment of pattern recognition and computer vision, with chapters written by leaders in the field. On the basic methods in pattern recognition and computer vision, topics range from statistical pattern recognition to array grammars to projective geometry to skeletonization, and shape and texture measures."--BOOK JACKET.
Non-Destructive Evaluation (NDE) is now playing an increasing role in our modern global economy; in security sensitive industries, for instance. The complexity of the inspection task and either large or limited lot runs now require more operator-assisted or fully- automated signal processing. This book deals with both fields of expertise: NDE and signal processing. On the signal processing side, in the particular context of NDE applications, the following topics are discussed: sensor fusion, signal knowledge representation, artificial intelligence, fuzzy logic, computer vision, integration of numeric and non-numeric informations, parallel decomposition, noise processing and calibration of sensor devices as well as reliability of detection. Some hardware considerations are introduced as well, to discuss platforms on which processing is done. On the NDE side, applications include advances in holographic interferometry, microwave resonance or shearography and also on more traditional NDE techniques such as ultrasonics, infrared techniques, X-ray, computed tomography, Eddy currents. Inverse problems are also discussed. This book is required reading for those who already have some experience in one or both fields (signal processing and/or NDE).
This volume (Parts A and B) contains the edited papers presented at the annual Review of Progress in Quantitative Nondestructive Evaluation held at Bowdoin College, Brunswick, ME on July 24-28, 1989. The Review was organized by the Center for Advanced NDE at the Ames Laboratory of the U. S. Department of Energy, in cooperation with the Office of Basic Energy Sciences, USDOE, and the Materials Laboratory at Wright-Patterson Air Force Base. The statistics for the 1989 Review of Progress in QNDE include a total of over 460 participants from the U. S. and nine foreign countries who presented some 325 papers. Over the years this conference has grown into one of the largest, most significant gatherings of NDE researchers and engineers in the world. The meeting was divided into 35 sessions, with as many as four sessions running concurrently, and covering all stages of NDE development from basic research investigations to early engineering applications and all methods of inspection science from ultrasonics to x-ray tomography. The Editors have organized the papers in the Proceedings according to topical subject headings, rather than in the original order of presentation. This rearrangement yields a more user-friendly reference work and follows a pattern now familiar to regular attendees of the Review. Some changes in the headings and their subcategories have been introduced to accommodate dynamic evolution of the field, as we observe it.
This volume is part of the Ceramic Engineering and Science Proceeding (CESP) series. This series contains a collection of papers dealing with issues in both traditional ceramics (i.e., glass, whitewares, refractories, and porcelain enamel) and advanced ceramics. Topics covered in the area of advanced ceramic include bioceramics, nanomaterials, composites, solid oxide fuel cells, mechanical properties and structural design, advanced ceramic coatings, ceramic armor, porous ceramics, and more.
Focuses on the growth and potential uses of infrared thermography as a nondestructive testing and monitoring technique. Part 1 of this monograph is an introduction to current infrared NDT theory and technology; Part 2 describes the wide range of infrared NDT and monitoring applications.