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Statistical pattern recognition is a very active area of study andresearch, which has seen many advances in recent years. New andemerging applications - such as data mining, web searching,multimedia data retrieval, face recognition, and cursivehandwriting recognition - require robust and efficient patternrecognition techniques. Statistical decision making and estimationare regarded as fundamental to the study of pattern recognition. Statistical Pattern Recognition, Second Edition has been fullyupdated with new methods, applications and references. It providesa comprehensive introduction to this vibrant area - with materialdrawn from engineering, statistics, computer science and the socialsciences - and covers many application areas, such as databasedesign, artificial neural networks, and decision supportsystems. * Provides a self-contained introduction to statistical patternrecognition. * Each technique described is illustrated by real examples. * Covers Bayesian methods, neural networks, support vectormachines, and unsupervised classification. * Each section concludes with a description of the applicationsthat have been addressed and with further developments of thetheory. * Includes background material on dissimilarity, parameterestimation, data, linear algebra and probability. * Features a variety of exercises, from 'open-book' questions tomore lengthy projects. The book is aimed primarily at senior undergraduate and graduatestudents studying statistical pattern recognition, patternprocessing, neural networks, and data mining, in both statisticsand engineering departments. It is also an excellent source ofreference for technical professionals working in advancedinformation development environments. For further information on the techniques and applicationsdiscussed in this book please visit ahref="http://www.statistical-pattern-recognition.net/"www.statistical-pattern-recognition.net/a
This book is concerned with important problems of robust (stable) statistical pat tern recognition when hypothetical model assumptions about experimental data are violated (disturbed). Pattern recognition theory is the field of applied mathematics in which prin ciples and methods are constructed for classification and identification of objects, phenomena, processes, situations, and signals, i. e. , of objects that can be specified by a finite set of features, or properties characterizing the objects (Mathematical Encyclopedia (1984)). Two stages in development of the mathematical theory of pattern recognition may be observed. At the first stage, until the middle of the 1970s, pattern recogni tion theory was replenished mainly from adjacent mathematical disciplines: mathe matical statistics, functional analysis, discrete mathematics, and information theory. This development stage is characterized by successful solution of pattern recognition problems of different physical nature, but of the simplest form in the sense of used mathematical models. One of the main approaches to solve pattern recognition problems is the statisti cal approach, which uses stochastic models of feature variables. Under the statistical approach, the first stage of pattern recognition theory development is characterized by the assumption that the probability data model is known exactly or it is esti mated from a representative sample of large size with negligible estimation errors (Das Gupta, 1973, 1977), (Rey, 1978), (Vasiljev, 1983)).
This book is concerned with important problems of robust (stable) statistical pat tern recognition when hypothetical model assumptions about experimental data are violated (disturbed). Pattern recognition theory is the field of applied mathematics in which prin ciples and methods are constructed for classification and identification of objects, phenomena, processes, situations, and signals, i. e. , of objects that can be specified by a finite set of features, or properties characterizing the objects (Mathematical Encyclopedia (1984)). Two stages in development of the mathematical theory of pattern recognition may be observed. At the first stage, until the middle of the 1970s, pattern recogni tion theory was replenished mainly from adjacent mathematical disciplines: mathe matical statistics, functional analysis, discrete mathematics, and information theory. This development stage is characterized by successful solution of pattern recognition problems of different physical nature, but of the simplest form in the sense of used mathematical models. One of the main approaches to solve pattern recognition problems is the statisti cal approach, which uses stochastic models of feature variables. Under the statistical approach, the first stage of pattern recognition theory development is characterized by the assumption that the probability data model is known exactly or it is esti mated from a representative sample of large size with negligible estimation errors (Das Gupta, 1973, 1977), (Rey, 1978), (Vasiljev, 1983)).
Computer vision systems attempt to understand a scene and its components from mostly visual information. The geometry exhibited by the real world, the influence of material properties on scattering of incident light, and the process of imaging introduce constraints and properties that are key to solving some of these tasks. In the presence of noisy observations and other uncertainties, the algorithms make use of statistical methods for robust inference. In this paper, we highlight the role of geometric constraints in statistical estimation methods, and how the interplay of geometry and statistics leads to the choice and design of algorithms. In particular, we illustrate the role of imaging, illumination, and motion constraints in classical vision problems such as tracking, structure from motion, metrology, activity analysis and recognition, and appropriate statistical methods used in each of these problems.
This book constitutes the proceedings of the Joint IAPR International Workshop on Structural Syntactic, and Statistical Pattern Recognition, S+SSPR 2016, consisting of the International Workshop on Structural and Syntactic Pattern Recognition SSPR, and the International Workshop on Statistical Techniques in Pattern Recognition, SPR. The 51 full papers presented were carefully reviewed and selected from 68 submissions. They are organized in the following topical sections: dimensionality reduction, manifold learning and embedding methods; dissimilarity representations; graph-theoretic methods; model selection, classification and clustering; semi and fully supervised learning methods; shape analysis; spatio-temporal pattern recognition; structural matching; text and document analysis.
This book constitutes the refereed proceedings of the 12th International Workshop on Structural and Syntactic Pattern Recognition, SSPR 2008 and the 7th International Workshop on Statistical Techniques in Pattern Recognition, SPR 2008, held jointly in Orlando, FL, USA, in December 2008 as a satellite event of the 19th International Conference of Pattern Recognition, ICPR 2008. The 56 revised full papers and 42 revised poster papers presented together with the abstracts of 4 invited papers were carefully reviewed and selected from 175 submissions. The papers are organized in topical sections on graph-based methods, probabilistic and stochastic structural models for PR, image and video analysis, shape analysis, kernel methods, recognition and classification, applications, ensemble methods, feature selection, density estimation and clustering, computer vision and biometrics, pattern recognition and applications, pattern recognition, as well as feature selection and clustering.
This edited volume explores several issues relating to parametric segmentation including robust operations, model selection criteria and automatic model selection, plus 2D and 3D scene segmentation. Emphasis is placed on robust model selection with techniques such as robust Mallows Cp, least K-th order statistical model fitting (LKS), and robust regression receiving much attention. With contributions from leading researchers, this is a valuable resource for researchers and graduated students working in computer vision, pattern recognition, image processing and robotics.
Here is a brief, well-organized, and easy-to-follow introduction and overview of robust statistics. Huber focuses primarily on the important and clearly understood case of distribution robustness, where the shape of the true underlying distribution deviates slightly from the assumed model (usually the Gaussian law). An additional chapter on recent developments in robustness has been added and the reference list has been expanded and updated from the 1977 edition.
Why are We Writing This Book? Visual data (graphical, image, video, and visualized data) affect every aspect of modern society. The cheap collection, storage, and transmission of vast amounts of visual data have revolutionized the practice of science, technology, and business. Innovations from various disciplines have been developed and applied to the task of designing intelligent machines that can automatically detect and exploit useful regularities (patterns) in visual data. One such approach to machine intelligence is statistical learning and pattern analysis for visual data. Over the past two decades, rapid advances have been made throughout the ?eld of visual pattern analysis. Some fundamental problems, including perceptual gro- ing,imagesegmentation, stereomatching, objectdetectionandrecognition,and- tion analysis and visual tracking, have become hot research topics and test beds in multiple areas of specialization, including mathematics, neuron-biometry, and c- nition. A great diversity of models and algorithms stemming from these disciplines has been proposed. To address the issues of ill-posed problems and uncertainties in visual pattern modeling and computing, researchers have developed rich toolkits based on pattern analysis theory, harmonic analysis and partial differential eq- tions, geometry and group theory, graph matching, and graph grammars. Among these technologies involved in intelligent visual information processing, statistical learning and pattern analysis is undoubtedly the most popular and imp- tant approach, and it is also one of the most rapidly developing ?elds, with many achievements in recent years. Above all, it provides a unifying theoretical fra- work for intelligent visual information processing applications.