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Surveys the wide range of meters and techniques for calibrating and intercomparing the power of radio frequencies and microwaves in the range 1MHz to 200 GHz, a procedure necessary in many branches of science and technology. The reader is assumed to be at least a graduate level electrical engineer or physicist. Considers the fundamentals; calorimetry, which is the basis for most measurement; the various types of non-calorimeter power meters, including thermistor, thermoelectric, and diode types, and force-operated and other types; calibration and intercomparison methods; pulsed power measurements; related voltage and current measurement; and the international intercomparison of standards. Annotation copyrighted by Book News, Inc., Portland, OR
A comprehensive, hands-on review of the most up-to-date techniques in RF and microwave measurement, including practical advice on deployment challenges.
This comprehensive, hands-on review of the most up-to-date techniques in RF and microwave measurement combines microwave circuit theory and metrology, in-depth analysis of advanced modern instrumentation, methods and systems, and practical advice for professional RF and microwave engineers and researchers. Topics covered include microwave instrumentation, such as network analyzers, real-time spectrum analyzers and microwave synthesizers; linear measurements, such as VNA calibrations, noise figure measurements, time domain reflectometry and multiport measurements; and non-linear measurements, such as load- and source-pull techniques, broadband signal measurements, and non-linear NVAs. Each technique is discussed in detail and accompanied by state-of-the-art solutions to the unique technical challenges associated with its use. With each chapter written by internationally recognised experts in the field, this is an invaluable resource for researchers and professionals involved with microwave measurements.
This book is a comprehensive exposition of FET modeling, and is a must-have resource for seasoned professionals and new graduates in the RF and microwave power amplifier design and modeling community. In it, you will find descriptions of characterization and measurement techniques, analysis methods, and the simulator implementation, model verification and validation procedures that are needed to produce a transistor model that can be used with confidence by the circuit designer. Written by semiconductor industry professionals with many years' device modeling experience in LDMOS and III-V technologies, this was the first book to address the modeling requirements specific to high-power RF transistors. A technology-independent approach is described, addressing thermal effects, scaling issues, nonlinear modeling, and in-package matching networks. These are illustrated using the current market-leading high-power RF technology, LDMOS, as well as with III-V power devices.
Provides practical information on microwave and wireless metrology, from typical metrology parameters to building your own measurement benches.
*** "This book is a ready reference on RF & microwave measurements - a balance of theory, mathematics, applications and measurement techniques - all at one place. Coming from a true engineer, RF & μWave Measurements is a timeless desktop reference for every practicener." Prof. V.D. Vankar, Adjunct Professor Netaji Subhas University of Technology New Delhi & Ex. Professor Indian Institute of Technology Delhi *** "Shiv Prasad Tripathy knows his subject well. I am delighted he is summarizing his knowledge in the form of a book RF & μWave Measurements that shall benefit professionals as well as students." Arpit Mittal, Senior Engineer, Qualcomm *** ........... can be read selectively as a ready-reference but the reader is recommended to go through the complete book when reading it first time. The book is useful to anyone who works on RF & microwave ............ [from book Foreword] RF & μWave Measurements covers concepts, applications, and measurement techniques for widely used RF measurement parameters. The contents follow a top-down approach and are introduced within a measurement framework that provides a structure, orderliness and coherence to this vast subject. RF & μWave Measurements covers signal properties & modulation, linear & non-linear device models, measurement techniques, plus instrument families; all with a balanced mix of theory and practical information, ample illustrations, mathematical treatment and practical examples. The book is organized as follows: Chapter 1 RF & μWave Overview Chapter 2 Measurement Framework Chapter 3 Measurement Insights - I Chapter 4 Measurement Insights - II Chapter 5 Signal Measurement & Analysis Chapter 6 Signal Sources Chapter 7 Network Characterization Chapter 8 Measurement of Power Chapter 9 Time Domain Measurements Chapter 10 Measurement Solutions Appendix - Smith Chart Further Reading More than 30 measurement parameters are covered that include AM-AM, sensitivity, passive intermodulation, crosstalk, isolation, harmonic distortion, gain compression, noise figure, directivity, PAE, IP2, IQ modulation, power gain, phase noise, AM-PM, phase delay, IP3, load pull, permittivity, TDR, plus many other regularly encountered by RF engineers. Instrumentation discussion includes theory of operation, measurement principles and features for signal sourcing, signal analysis, network characterization and power measurements. Techniques for 50+ measurement scenarios are provided that cover frequency and time domain measurements. Measurement solutions are exemplified to encourage reader to build their own test solutions. RF & μWave Measurements is a much-needed bridge between conventional textbooks and reference handbooks and is a useful desktop ready-reference for engineers, researchers, product organizations and educators. Shiv Prasad Tripathy is a hands-on engineering practitioner, who provides consulting & knowledge services to people in the academics and industry. More information about him is on the author's page.
Generation of laboratory signals -- Detection of microwave power -- Measurement of microwave power -- Impedance concepts at microwave frequencies -- Measurement of impedance -- Representation and measurement of microwave circuits -- Measurement of wavelength -- Measurement of frequency -- Resonant-cavity characteristics : measurement of Q -- Resonant-cavity characteristics : measurement of R0/Q0 -- Measurement of attenuation -- Appendix A. Field configurations and cutoff wavelengths for common waveguides -- Appendix B. Formulas and constants.
Handbook of Microwave Component Measurements Second Edition is a fully updated, complete reference to this topic, focusing on the modern measurement tools, such as a Vector Network Analyzer (VNA), gathering in one place all the concepts, formulas, and best practices of measurement science. It includes basic concepts in each chapter as well as appendices which provide all the detail needed to understand the science behind microwave measurements. The book offers an insight into the best practices for ascertaining the true nature of the device-under-test (DUT), optimizing the time to setup and measure, and to the greatest extent possible, remove the effects of the measuring equipment from that result. Furthermore, the author writes with a simplicity that is easily accessible to the student or new engineer, yet is thorough enough to provide details of measurement science for even the most advanced applications and researchers. This welcome new edition brings forward the most modern techniques used in industry today, and recognizes that more new techniques have developed since the first edition published in 2012. Whilst still focusing on the VNA, these techniques are also compatible with other vendor's advanced equipment, providing a comprehensive industry reference.
The book covers the following areas: microwave measurement.
This is a one-stop guide for circuit designers and system/device engineers, covering everything from CAD to reliability.