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Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 1: Foundations discusses the fundamental concepts along with recent and emerging applications. The core physics is that of photoionization, and Volume 1 addresses this topic. The foundational material is presented in part as a tutorial with extensive numerical examples and also in part as a collected reference to the relevant theoretical treatments from the literature for a range of cases. Topics are discussed with an eye to developing general quantum metrology schemes, in which full quantum state reconstruction of the photoelectron wavefunction is the goal. In many cases, code and/or additional resources are available online. Consequently, it is hoped that readers at all levels will find something of interest and that the material provides something rather different from existing textbooks.
Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 2: Applications and Advances discusses the fundamental concepts along with recent and emerging applications. Volume 2 explores the applications and development of quantum metrology schemes based on photoelectron measurements. The author begins with a brief historical background on "complete" photoionization experiments, followed by the details of state reconstruction methodologies from experimental measurements. Three specific applications of quantum metrology schemes are discussed in detail. In addition, the book provides advances, future directions, and an outlook including (ongoing) work to generalise these schemes and extend them to dynamical many-body systems. Volume 2 will be of interest to readers wishing to see the (sometimes messy) details of state reconstruction from photoelectron measurements as well as explore the future prospects for this class of metrology.
Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 1: Foundations discusses the fundamental concepts along with recent and emerging applications.
Quantum information is an emerging field which has attracted a lot of attention in the last couple of decades. It is a broad subject which extends from the most applied questions (e.g. how to build quantum computers or secure cryptographic systems) to the most theoretical problems concerning the formalism and interpretation of quantum mechanics, its complexity, and its potential to go beyond classical physics. This book is an introduction to quantum information with special emphasis on continuous-variable systems (such as light) which can be described as collections of harmonic oscillators. It covers a selection of basic concepts, focusing on their physical meaning and mathematical treatment. It starts from the very first principles of quantum mechanics, and builds up the concepts and techniques following a logical progression. This is an excellent reference for students with a full semester of standard quantum mechanics and researchers in closely related fields.
Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 2: Applications and advances discusses the fundamental concepts along with recent and emerging applications. Volume 2 explores the applications and development of quantum metrology schemes based on photoelectron measurements. The author begins with a brief historical background on 'complete' photoionization experiments, followed by the details of state reconstruction methodologies from experimental measurements. Three specific applications of quantum metrology schemes are discussed in detail. In addition, the book provides advances, future directions, and an outlook including (ongoing) work to generalise these schemes and extend them to dynamical many-body systems. Volume 2 will be of interest to readers wishing to see the (sometimes messy) details of state reconstruction from photoelectron measurements as well as explore the future prospects for this class of metrology.
From the reviews: "Haus’ book provides numerous insights on topics of wide importance, and contains much material not available elsewhere in book form. [...] an indispensable resource for those working in quantum optics or electronics." Optics & Photonics News