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A basic skill in probability is practically demanded nowadays in many bran ches of optics, especially in image science. On the other hand, there is no text presently available that develops probability, and its companion fields stochastic processes and statistics, from the optical perspective. [Short of a book, a chapter was recently written for this purpose; see B. R. Frieden (ed. ): The Computer in Optical Research, Topics in Applied Physics, Vol. 41 (Springer, Berlin, Heidelberg, New York 1980) Chap. 3] Most standard texts either use illustrative examples and problems from electrical engineering or from the life sciences. The present book is meant to remedy this situation, by teaching probability with the specific needs of the optical researcher in mind. Virtually all the illustrative examples and applications of the theory are from image science and other fields of optics. One might say that photons have replaced electrons in nearly all considera tions here. We hope, in this manner, to make the learning of probability a pleasant and absorbing experience for optical workers. Some of the remaining applications are from information theory, a con cept which complements image science in particular. As will be seen, there are numerous tie-ins between the two concepts. Students will be adequately prepared for the material in this book if they have had a course in calculus, and know the basics of matrix manipulation.
This new edition incorporates corrections of all known typographical errors in the first edition, as well as some more substantive changes. Chief among the latter is the addition of Chap. 17, on methods of estimation. As with the rest of the text, most applications and examples cited in the new chapter are from the optical perspective. The intention behind this new chapter is to empower the optical researcher with a yet broader range of research tools. Certainly a basic knowledge of estimation methods should be among these. In particular, the sections on likelihood theory and Fisher information prepare readers for the problems of optical parameter estimation and probability law estimation. Physicists and optical scientists might find this material particularly useful, since the subject of Fisher information is generally not covered in standard physical science curricula. Since the words "statistical optics" are prominent in the title of this book, their meaning needs to be clarified. There is a general tendency to overly emphasize the statistics of photons as the sine qua non of statistical optics. In view is taken, which equally emphasizes the random medium this text a wider that surrounds the photon, be it a photographic emulsion, the turbulent atmo sphere, a vibrating lens holder, etc. Also included are random interpretations of ostensibly deterministic phenomena, such as the Hurter-Driffield (H and D) curve of photography. Such a "random interpretation" sometimes breaks new ground, as in Chap.
Winner of the 2006 Joseph W. Goodman Book Writing Award! A comprehensive treatment of the principles, mathematics, and statistics of image science In today's visually oriented society, images play an important role in conveying messages. From seismic imaging to satellite images to medical images, our modern society would be lost without images to enhance our understanding of our health, our culture, and our world. Foundations of Image Science presents a comprehensive treatment of the principles, mathematics, and statistics needed to understand and evaluate imaging systems. The book is the first to provide a thorough treatment of the continuous-to-discrete, or CD, model of digital imaging. Foundations of Image Science emphasizes the need for meaningful, objective assessment of image quality and presents the necessary tools for this purpose. Approaching the subject within a well-defined theoretical and physical context, this landmark text presents the mathematical underpinnings of image science at a level that is accessible to graduate students and practitioners working with imaging systems, as well as well-motivated undergraduate students. Destined to become a standard text in the field, Foundations of Image Science covers: Mathematical Foundations: Examines the essential mathematical foundations of image science Image Formation–Models and Mechanisms: Presents a comprehensive and unified treatment of the mathematical and statistical principles of imaging, with an emphasis on digital imaging systems and the use of SVD methods Image Quality: Provides a systematic exposition of the methodology for objective or task-based assessment of image quality Applications: Presents detailed case studies of specific direct and indirect imaging systems and provides examples of how to apply the various mathematical tools covered in the book Appendices: Covers the prerequisite material necessary for understanding the material in the main text, including matrix algebra, complex variables, and the basics of probability theory
Fundamentals of Photonics A complete, thoroughly updated, full-color third edition Fundamentals of Photonics, Third Edition is a self-contained and up-to-date introductory-level textbook that thoroughly surveys this rapidly expanding area of engineering and applied physics. Featuring a blend of theory and applications, coverage includes detailed accounts of the primary theories of light, including ray optics, wave optics, electromagnetic optics, and photon optics, as well as the interaction of light and matter. Presented at increasing levels of complexity, preliminary sections build toward more advanced topics, such as Fourier optics and holography, photonic-crystal optics, guided-wave and fiber optics, LEDs and lasers, acousto-optic and electro-optic devices, nonlinear optical devices, ultrafast optics, optical interconnects and switches, and optical fiber communications. The third edition features an entirely new chapter on the optics of metals and plasmonic devices. Each chapter contains highlighted equations, exercises, problems, summaries, and selected reading lists. Examples of real systems are included to emphasize the concepts governing applications of current interest. Each of the twenty-four chapters of the second edition has been thoroughly updated.
Along with a review of general developments relating to bivariate distributions, this volume also covers copulas, a subject which has grown immensely in recent years. In addition, it examines conditionally specified distributions and skewed distributions.
The first edition of this book has enjoyed a gratifying existence. 1s sued in 1965, it found its intended place as a research reference and as a graduate-Ievel text. Research laboratories and universities reported broad use. Published reviews-some twenty-five in number-were universally kind. Subsequently the book was translated and published in Russian (Svyaz; Moscow, 1968) and Spanish (Gredos, S.A.; Madrid, 1972). Copies of the first edition have been exhausted for several years, but demand for the material continues. At the behest of the publisher, and with the encouragement of numerous colleagues, a second edition was begun in 1970. The aim was to retain the original format, but to expand the content, especially in the areas of digital communications and com puter techniques for speech signal processing. As before, the intended audience is the graduate-Ievel engineer and physicist, but the psycho physicist, phonetician, speech scientist and linguist should find material of interest.
The aim of this book is to outline the physics of image formation, electron specimen interactions and image interpretation in transmission electron mic roscopy. The book evolved from lectures delivered at the University of Munster and is a revised version of the first part of my earlier book Elek tronenmikroskopische Untersuchungs- und Priiparationsmethoden, omitting the part which describes specimen-preparation methods. In the introductory chapter, the different types of electron microscope are compared, the various electron-specimen interactions and their applications are summarized and the most important aspects of high-resolution, analytical and high-voltage electron microscopy are discussed. The optics of electron lenses is discussed in Chapter 2 in order to bring out electron-lens properties that are important for an understanding of the function of an electron microscope. In Chapter 3, the wave optics of elec trons and the phase shifts by electrostatic and magnetic fields are introduced; Fresnel electron diffraction is treated using Huygens' principle. The recogni tion that the Fraunhofer-diffraction pattern is the Fourier transform of the wave amplitude behind a specimen is important because the influence of the imaging process on the contrast transfer of spatial frequencies can be described by introducing phase shifts and envelopes in the Fourier plane. In Chapter 4, the elements of an electron-optical column are described: the electron gun, the condenser and the imaging system. A thorough understanding of electron-specimen interactions is essential to explain image contrast.
Polarized Light and Optical Systems presents polarization optics for undergraduate and graduate students in a way which makes classroom teaching relevant to current issues in optical engineering. This curriculum has been developed and refined for a decade and a half at the University of Arizona’s College of Optical Sciences. Polarized Light and Optical Systems provides a reference for the optical engineer and optical designer in issues related to building polarimeters, designing displays, and polarization critical optical systems. The central theme of Polarized Light and Optical Systems is a unifying treatment of polarization elements as optical elements and optical elements as polarization elements. Key Features Comprehensive presentation of Jones calculus and Mueller calculus with tables and derivations of the Jones and Mueller matrices for polarization elements and polarization effects Classroom-appropriate presentations of polarization of birefringent materials, thin films, stress birefringence, crystal polarizers, liquid crystals, and gratings Discussion of the many forms of polarimeters, their trade-offs, data reduction methods, and polarization artifacts Exposition of the polarization ray tracing calculus to integrate polarization with ray tracing Explanation of the sources of polarization aberrations in optical systems and the functional forms of these polarization aberrations Problem sets to build students’ problem-solving capabilities.
Using information and scale as central themes, this comprehensive survey explains how to handle real problems in astronomical data analysis through a modern arsenal of powerful techniques. The coverage includes chapters or appendices on: detection and filtering; image compression; multichannel, multiscale, and catalog data analytical methods; wavelets transforms, Picard iteration, and software tools.