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Pozar's new edition of Microwave Engineering includes more material on active circuits, noise, nonlinear effects, and wireless systems. Chapters on noise and nonlinear distortion, and active devices have been added along with the coverage of noise and more material on intermodulation distortion and related nonlinear effects. On active devices, there's more updated material on bipolar junction and field effect transistors. New and updated material on wireless communications systems, including link budget, link margin, digital modulation methods, and bit error rates is also part of the new edition. Other new material includes a section on transients on transmission lines, the theory of power waves, a discussion of higher order modes and frequency effects for microstrip line, and a discussion of how to determine unloaded.
This edition reflects the latest networking technologies with a special emphasis on wireless networking, including 802.11, 802.16, Bluetooth, and 3G cellular, paired with fixed-network coverage of ADSL, Internet over cable, gigabit Ethernet, MPLS, and peer-to-peer networks. It incorporates new coverage on 3G mobile phone networks, Fiber to the Home, RFID, delay-tolerant networks, and 802.11 security, in addition to expanded material on Internet routing, multicasting, congestion control, quality of service, real-time transport, and content distribution.
This book is an introduction to the language and standard proof methods of mathematics. It is a bridge from the computational courses (such as calculus or differential equations) that students typically encounter in their first year of college to a more abstract outlook. It lays a foundation for more theoretical courses such as topology, analysis and abstract algebra. Although it may be more meaningful to the student who has had some calculus, there is really no prerequisite other than a measure of mathematical maturity.
This text is designed for graduate-level courses in real analysis. Real Analysis, 4th Edition, covers the basic material that every graduate student should know in the classical theory of functions of a real variable, measure and integration theory, and some of the more important and elementary topics in general topology and normed linear space theory. This text assumes a general background in undergraduate mathematics and familiarity with the material covered in an undergraduate course on the fundamental concepts of analysis.
This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.