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While the effects of spontaneous ordering or composition modulation on the properties of semiconductors and optoelectronic devices have been studied with great interest over the past several years, an understanding of the physics and chemistry of these two related phenomena is still in its infancy. This book brings together researchers from around the world to address issues concerning the physics, chemistry and growth parameters for spontaneous ordering and composition modulation. Developments in the use of artificial patterning to obtain new structured materials on a microscopic scale are featured. Advances in characterization techniques are also presented. Topics include: spontaneous ordering; self-assembled structures and quantum dots; self-organized epitaxial structures; composition modulation studies and optoelectronic materials.
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
The field of material analysis has seen explosive growth during the past decades. Almost all the textbooks on materials analysis have a section devoted to the Fourier transform theory. For this reason, the book focuses on the material analysis based on Fourier transform theory. The book chapters are related to FTIR and the other methods used for analyzing different types of materials. It is hoped that this book will provide the background, reference and incentive to encourage further research and results in this area as well as provide tools for practical applications. It provides an applications-oriented approach to materials analysis written primarily for physicist, Chemists, Agriculturalists, Electrical Engineers, Mechanical Engineers, Signal Processing Engineers, and the Academic Researchers and for the Graduate Students who will also find it useful as a reference for their research activities.
Organic (opto)electronic materials have received considerable attention due to their applications in perovskite and flexible electronics, OPVs and OLEDs and many others. Reflecting the rapid growth in research and development of organic (opto)electronic materials over the last few decades, World Scientific Handbook of Organic Optoelectronic Devices provides a comprehensive coverage of the state-of-the-art in an accessible format. It presents the most widely recognized fundamentals, principles, and mechanisms along with representative examples, key experimental data, and over 200 illustrative figures.
This book reflects the excitement in the scientific community about III-V nitrides. Based on papers presented at the First International Symposium on Gallium Nitride and Related Materials (ISGN-1), it reveals the large amount of work that has taken place since the field exploded with the announcement of commercial blue-light-emitting devices. The compound semiconductors in the III-V nitride systems are of increasing interest for high-performance optoelectronic and electronic device applications. These wide-bandgap semiconductor materials are also of great fundamental scientific interest because of their unique structural, electrical and optical properties. From the advances in the technologies for the heteroepitaxial growth of these materials, leading to improved quality and device performance, it is expected that III-V nitrides will soon be of significant practical and commercial interest. Topics include: crystal growth - substrates and early stages; molecular beam growth techniques; chemical vapor phase and alloys and novel growth techniques; structural properties; electronic properties; optical properties; point defects; hydrogen, etching and other materials processes; surfaces and metal contacts and devices.
Organic (opto)electronic materials have received considerable attention due to their applications in perovskite and flexible electronics, OPVs and OLEDs and many others. Reflecting the rapid growth in research and development of organic (opto)electronic materials over the last few decades, this book provides a comprehensive coverage of the state of the art in an accessible format. It presents the most widely recognized fundamentals, principles, and mechanisms along with representative examples, key experimental data, and over 200 illustrative figures.
Perovskite Materials and Devices A comprehensive overview of the important scientific and technological advances in commercialization of this important mineral Perovskite has held much interest for scientists and industrialists, as the mineral is abundantly available in nature. Due to the intriguing and unusual physical properties of perovskite materials—the high-absorption coefficient, low exciton-binding energy, and high dielectric constant, for example—there has been substantial focus on perovskite’s potential in applications. In particular, they have been of great use in sensors and catalyst electrodes, certain types of fuel cells, solar cells, lasers, memory devices, and spintronics, and as a result hold exciting opportunities for physicists, chemists, and material scientists alike. Perovskite Materials and Devices comprehensively covers all the milestone work in perovskites research, systematically introducing the properties, methods, and technologies associated with the mineral from fundamentals to promising applications to commercialization issues. The book focuses on traditional and novel electronic operations, such as solar cells, LEDs, lasing, photodetectors, X-ray detectors, transistors, and more. It also investigates ways to make the use of such materials more environmentally friendly, which in turn can make perovskite minerals more commercially viable. Perovskite Materials and Devices readers will also find Summaries of the latest state-of-the-art developments and technologies, such as perovskite nanocrystals and novel electronic devices Detailed discussion of organic/inorganic hybrid perovskites, all-inorganic perovskite CsPbX3, and lead-free halide perovskites Investigation of the photovoltaic applications, namely single-crystal devices, tandem cells, integrated devices, semi-transparent devices, and flexible devices Description of large-area module fabrication and stability investigating Perovskite Materials and Devices is a useful reference for materials scientists, solid state physicists and chemists, surface physicists and chemists, and electronic engineers. It is also an ideal resource for libraries that supply these fields.
Significant advances have been made towards understanding the properties of materials through theoretical approaches. These approaches are based either on first-principles quantum mechanical formulations or semi-empirical formulations, and have benefitted from increases in computational power. The advent of parallel computing has propelled the theoretical approaches to a new level of realism in modelling physical systems of interest. The theoretical methods and simulation techniques that are cur- rently under development are certain to become powerful tools in understanding, exploring and predicting the properties of existing and novel materials. This book discusses critically current developments in computations and simulational approaches specifically aimed at addressing real materials problems, with an emphasis on parallel computing and shows the most successful applications of computational and simulational work to date. Topics include: advances in computational methods; parallel algorithms and applications; fracture, brittle/ductile behavior and large-scale defects; thermodynamic stability of materials; surfaces and interfaces of materials; and complex materials simulations.
The fabrication of Si- and compound semiconductor-based devices involves a number of steps ranging from material growth to pattern definition by lithography, and ultimately, pattern transfer by etching/deposition. The key to device manufacturing, however, is reproducibility, low cost and high yield. Diagnostic techniques allow correlation between processing and actual device performance to be established. Researchers from universities, industry and government come together in this book to examine the advances in diagnostic techniques that provide critical information on structural, optical and electrical properties of semiconductor devices, as well as monitoring techniques for equipment/processes for control and feedback. The overriding goal is for rapid, accurate materials characterization, both in situ and ex situ. Topics include: in situ diagnostics; proximal probe microscopies; optical probes of devices and device properties; spectroscopic ellipsometry/structural diagnostics; and material analysis - X-ray techniques, strain measurements and passivation.