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The state of the art in optical characterization of materials is advancing rapidly. New insights into the theoretical foundations of this research field have been gained and exciting practical developments have taken place, both driven by novel applications that are constantly emerging. This book presents latest research results in the domain of Characterization of Materials by spectral characteristics of UV (240 nm) to IR (14 μm), multispectral image analysis, X-Ray, polarimetry and microscopy.
The state of the art in the optical characterization of materials is advancing rapidly. New insights have been gained into the theoretical foundations of this research and exciting developments have been made in practice, driven by new applications and innovative sensor technologies that are constantly evolving. The great success of past conferences proves the necessity of a platform for presentation, discussion and evaluation of the latest research results in this interdisciplinary field.
The state of the art in the optical characterization of materials is advancing rapidly. New insights have been gained into the theoretical foundations of this research and exciting developments have been made in practice, driven by new applications and innovative sensor technologies that are constantly evolving.
This introductory, yet in-depth, book explains the physical principles of electronic imaging and sensing and provides the reader with the information necessary to understand the design, operation, and practical applications of contemporary electronic imaging and sensing systems. The text has strong practical focus and contains examples of biomedical applications of optical electronic imaging and sensing. Each chapter draws upon the authors’ extensive research, teaching, and industrial experience and provides a useful resource for undergraduate and graduate students, as well as a convenient reference for scientists and engineers working in the field of electronic imaging and sensing.