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The aim of the current work was the analysis of temperatures in the milling process in order to understand causal and statistical relationships between process parameters and thermal state variables. The first step included fundamental empirical investigations in the form of orthogonal cuts in order to estimate the heat partitioning depending on the process parameters. Based on the empirical data from the orthogonal cuts temperature fields in the milling process were modelled analytically and validated.
Overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves.
Includes its Annual report.
A survey of current dolphin research.
This practical volume does not intend to replace a mentor, but acts as a readily accessible guide to the basic tools of lithic analysis. The book was awarded the 2005 SAA Award for Excellence in Archaeological Analysis. Some focuses of the manual include: history of stone tool research; procurement, manufacture and function; assemblage variability. It is an incomparable source for academic archaeologists, cultural resource and heritage management archaeologists, government heritage agencies, and upper-level undergraduate and graduate students of archaeology focused on the prehistoric period.
Includes bibliographical references and index.
Electron Microscopy and Analysis 1997 celebrates the centenary anniversary of the discovery of the electron by J.J. Thomson in Cambridge and the fiftieth anniversary of this distinguished Institute group. The book includes papers on the early history of electron microscopy (from P. Hawkes), the development of the scanning electron microscope at Cambridge (from K. Smith), electron energy loss spectroscopy (from L.M. Brown), imaging methods (from J. Spence), and the future of electron microscopy (from C. Humphreys). Covering a wide range of applications of advanced techniques, it discusses electron imaging, electron energy-loss and x-ray analysis, and scanning probe and electron beam microscopies. This volume is a handy reference for professionals using microscopes in all areas of physics, materials science, metallurgy, and surface science to gain an overview of developments in our understanding of materials microstructure and of advances in microscope interrogation techniques.