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Examines how solar and terrestrial space phenomena affect sophisticated technological systems Contemporary society relies on sophisticated technologies to manage electricity distribution, communication networks, transportation safety, and myriad other systems. The successful design and operation of both ground-based and space-based systems must consider solar and terrestrial space phenomena and processes. Space Weather Effects and Applications describes the effects of space weather on various present-day technologies and explores how improved instrumentation to measure Earth's space environment can be used to more accurately forecast changes and disruptions. Volume highlights include: Damage and disruption to orbiting satellite equipment by solar particles and cosmic rays Effects of space radiation on aircraft at high altitudes and latitudes Response of radio and radar-based systems to solar bursts Disturbances to the propagation of radio waves caused by space weather How geomagnetic field changes impact ground-based systems such as pipelines Impacts of human exposure to the space radiation environment The American Geophysical Union promotes discovery in Earth and space science for the benefit of humanity. Its publications disseminate scientific knowledge and provide resources for researchers, students, and professionals. Find out more about the Space Physics and Aeronomy collection in this Q&A with the Editors in Chief
Spacecraft depend on electronic components that must perform reliably over missions measured in years and decades. Space radiation is a primary source of degradation, reliability issues, and potentially failure for these electronic components. Although simulation and modeling are valuable for understanding the radiation risk to microelectronics, there is no substitute for testing, and an increased use of commercial-off-the- shelf parts in spacecraft may actually increase requirements for testing, as opposed to simulation and modeling. Testing at the Speed of Light evaluates the nation's current capabilities and future needs for testing the effects of space radiation on microelectronics to ensure mission success and makes recommendations on how to provide effective stewardship of the necessary radiation test infrastructure for the foreseeable future.
The subject of this volume in the Astrophysics and Space Science Library is Electro magnetic Radiation in Space. It is essentially based on the lectures given at the third ESRO Summer School which was held from 19 July to 13 August, 1965, in Alpbach, Austria. Fifty-eight selected students attended the courses representing the following countries: Austria (2), Belgium (1), Denmark (1), France (12), Germany (10), Italy (7), Netherlands (2), Spain (4), Sweden (6), Switzerland (3), United Kingdom (9), United States (1). Thirteen lectures courses and nine seminars were given by sixteen different scientists in total. In this book the courses and seminars have been classified in three parts according to the kind of radiation which they mainly deal with: Ultraviolet Radiation, X Radiation and Cosmic Radiation. These parts can be broken down further in theo retical and observational aspects, whereas in the first and second part solar as well as stellar ultraviolet- and X-radiation can be distinguished. * Due to various reasons the publication of this volume had to be delayed; it was therefore judged appropriate to bring the text up to date. The various lecturers have been asked to revise the manuscripts and to eventually add new information which has been acquired in this rapidly evolving field of space astrophysics. Most authors have responded positively to this request, some even have completely rewritten the manuscript.
This wide-ranging book summarizes the current knowledge of radiation defects in semiconductors, outlining the shortcomings of present experimental and modelling techniques and giving an outlook on future developments. It also provides information on the application of sensors in nuclear power plants.
This book reevaluates the health risks of ionizing radiation in light of data that have become available since the 1980 report on this subject was published. The data include new, much more reliable dose estimates for the A-bomb survivors, the results of an additional 14 years of follow-up of the survivors for cancer mortality, recent results of follow-up studies of persons irradiated for medical purposes, and results of relevant experiments with laboratory animals and cultured cells. It analyzes the data in terms of risk estimates for specific organs in relation to dose and time after exposure, and compares radiation effects between Japanese and Western populations.
This volume provides an extensive overview of radiation effects on integrated circuits, offering major guidelines for coping with radiation effects on components. It contains a set of chapters based on the tutorials presented at the International School on Effects of Radiation on Embedded Systems for Space Applications (SERESSA) that was held in Manaus, Brazil, November 20-25, 2005.
New edition of this practical and educational handbook for engineer-designers and other professionals. It describes the electronic technology of the new millennium and the complex physical and engineering problems that occur when such equipment is exposed to radiation. The authors have an accumulated joint combined experience in the field of about 75 years, giving a broader blend of experience than any existing book in the field.
This publication presents the proceedings of ICPMSE-6, the sixth international conference on Protection of Materials and Structures from Space Environment, held in Toronto May 1-3, 2002. The ICPMSE series of meetings became an important part of the LEO space community since it was started in 1991. Since then, the meeting has grown steadily, attracting a large number of engineers, researchers, managers, and scientists from industrial companies, scientific institutions and government agencies in Canada, U. S. A. , Asia, and Europe, thus becoming a true international event. This year’s meeting is gaining even stronger importance with the resumption of the ISS and other space projects in LEO, GEO and Deep Space. To reflect on these activities, the topics in the program have been extended to include protection of materials in GEO and Deep Space. The combination of a broad selection of technical and scientific topics addressed by internationally known speakers with the charm of Toronto and the hospitality of the organizers brings participants back year after year. The conference was hosted and organized by Integrity Testing Laboratory Inc. (ITL), and held at the University of Toronto’s Institute for Aerospace Studies (UTIAS). The meeting was sponsored by the Materials and Manufacturing Ontario (MMO) and the CRESTech, two Ontario Centres of Excellence; Air Force Office of Scientific Research (AFOSR/NL); MD Robotics; EMS Technologies; The Integrity Testing Laboratory (ITL); and the UTIAS.
Space applications, nuclear physics, military operations, medical imaging, and especially electronics (modern silicon processing) are obvious fields in which radiation damage can have serious consequences, i.e., degradation of MOS devices and circuits. Zeroing in on vital aspects of this broad and complex topic, Radiation Effects in Semiconductors addresses the ever-growing need for a clear understanding of radiation effects on semiconductor devices and circuits to combat potential damage it can cause. Features a chapter authored by renowned radiation authority Lawrence T. Clark on Radiation Hardened by Design SRAM Strategies for TID and SEE Mitigation This book analyzes the radiation problem, focusing on the most important aspects required for comprehending the degrading effects observed in semiconductor devices, circuits, and systems when they are irradiated. It explores how radiation interacts with solid materials, providing a detailed analysis of three ways this occurs: Photoelectric effect, Compton effect, and creation of electron-positron pairs. The author explains that the probability of these three effects occurring depends on the energy of the incident photon and the atomic number of the target. The book also discusses the effects that photons can have on matter—in terms of ionization effects and nuclear displacement Written for post-graduate researchers, semiconductor engineers, and nuclear and space engineers with some electronics background, this carefully constructed reference explains how ionizing radiation is creating damage in semiconducting devices and circuits and systems—and how that damage can be avoided in areas such as military/space missions, nuclear applications, plasma damage, and X-ray-based techniques. It features top-notch international experts in industry and academia who address emerging detector technologies, circuit design techniques, new materials, and innovative system approaches.