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This textbook provides readers with a comprehensive introduction to various noise sources that significantly reduce performance and reliability in nanometer-scale integrated circuits. The author covers different types of noise, such as crosstalk noise caused by signal switching of adjacent wires, power supply noise or IR voltage drop in the power line due to simultaneous buffer / gate switching events, substrate coupling noise, radiation-induced transients, thermally induced noise and noise due to process and environmental Coverages also includes the relationship between some of these noise sources, as well as compound effects, and modeling and mitigation of noise mechanisms.
This edition provides an important contemporary view of a wide range of analog/digital circuit blocks, the BSIM model, data converter architectures, and more. The authors develop design techniques for both long- and short-channel CMOS technologies and then compare the two.
Nanotechnology: An Introduction, Second Edition, is ideal for the newcomer to nanotechnology, someone who also brings a strong background in one of the traditional disciplines, such as physics, mechanical or electrical engineering, or chemistry or biology, or someone who has experience working in microelectromechanical systems (MEMS) technology. This book brings together the principles, theory, and practice of nanotechnology, giving a broad, yet authoritative, introduction to the possibilities and limitations of this exciting and rapidly developing field. The book's author, Prof Ramsden, also discusses design, manufacture, and applications and their impact on a wide range of nanotechnology areas. - Provides an overview of the rapidly growing and developing field of nanotechnology - Focuses on key essentials, and structured around a robust anatomy of the subject - Brings together the principles, theory, and practice of nanotechnology, giving a broad, yet authoritative, introduction to the possibilities and limitations of this exciting and rapidly developing field
Learn the basic properties and designs of modern VLSI devices, as well as the factors affecting performance, with this thoroughly updated second edition. The first edition has been widely adopted as a standard textbook in microelectronics in many major US universities and worldwide. The internationally renowned authors highlight the intricate interdependencies and subtle trade-offs between various practically important device parameters, and provide an in-depth discussion of device scaling and scaling limits of CMOS and bipolar devices. Equations and parameters provided are checked continuously against the reality of silicon data, making the book equally useful in practical transistor design and in the classroom. Every chapter has been updated to include the latest developments, such as MOSFET scale length theory, high-field transport model and SiGe-base bipolar devices.
Gain an intuitive understanding of jitter and phase noise with this authoritative guide. Leading researchers provide expert insights on a wide range of topics, from general theory and the effects of jitter on circuits and systems, to key statistical properties and numerical techniques. Using the tools provided in this book, you will learn how and when jitter and phase noise occur, their relationship with one another, how they can degrade circuit performance, and how to mitigate their effects - all in the context of the most recent research in the field. Examine the impact of jitter in key application areas, including digital circuits and systems, data converters, wirelines, and wireless systems, and learn how to simulate it using the accompanying Matlab code. Supported by additional examples and exercises online, this is a one-stop guide for graduate students and practicing engineers interested in improving the performance of modern electronic circuits and systems.
Designed for advanced undergraduate or first-year graduate courses in semiconductor or microelectronic fabrication, the third edition of Fabrication Engineering at the Micro and Nanoscale provides a thorough and accessible introduction to all fields of micro and nano fabrication.
This timely and exhaustive study offers a much-needed examination of the scope and consequences of the electronic counterfeit trade. The authors describe a variety of shortcomings and vulnerabilities in the electronic component supply chain, which can result in counterfeit integrated circuits (ICs). Not only does this book provide an assessment of the current counterfeiting problems facing both the public and private sectors, it also offers practical, real-world solutions for combatting this substantial threat. · Helps beginners and practitioners in the field by providing a comprehensive background on the counterfeiting problem; · Presents innovative taxonomies for counterfeit types, test methods, and counterfeit defects, which allows for a detailed analysis of counterfeiting and its mitigation; · Provides step-by-step solutions for detecting different types of counterfeit ICs; · Offers pragmatic and practice-oriented, realistic solutions to counterfeit IC detection and avoidance, for industry and government.
This book provides some recent advances in design nanometer VLSI chips. The selected topics try to present some open problems and challenges with important topics ranging from design tools, new post-silicon devices, GPU-based parallel computing, emerging 3D integration, and antenna design. The book consists of two parts, with chapters such as: VLSI design for multi-sensor smart systems on a chip, Three-dimensional integrated circuits design for thousand-core processors, Parallel symbolic analysis of large analog circuits on GPU platforms, Algorithms for CAD tools VLSI design, A multilevel memetic algorithm for large SAT-encoded problems, etc.
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