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Proceedings of the NATO Advanced Study Institute, Como, Italy, May 12--22, 1993
This 2-volume set includes extensive discussions of scattering techniques (light, neutron and X-ray) and related fluctuation and grating techniques that are at the forefront of this field. Most of the scattering techniques are Fourier space techniques. Recent advances have seen the development of powerful direct imaging methods such as atomic force microscopy and scanning probe microscopy. In addition, techniques that can be used to manipulate soft matter on the nanometer scale are also in rapid development. These include the scanning probe microscopy technique mentioned above as well as optical and magnetic tweezers.
This proceedings volume contains research data from structural investigation of materials of high industrial value.
This proceedings volume contains research data from structural investigation of materials of high industrial value.
Papers presented at the seminar held in Defence Metallurgical Research Laboratory, Hyderabad India in 2003.
High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern synchrotron sources and illustrates bulk and interface investigations of solid and liquid matter with up-to-date research examples. It presents important characteristics of the sources, experimental set-up, and new detector developments. The book also considers future exploitation of x-ray free electron lasers for diffraction applications.
This manual is a useful ready-reference guide to the analytical power of modern X-ray scattering in the field of soft matter. The author describes simple tools that can elucidate the mechanisms of structure evolution in the studied materials, and follows this up with a step-by-step guide to more advanced methods. Data analysis based on clear, unequivocal results is rendered simple and straightforward – with a stress on careful planning of experiments and adequate recording of all required data.
This volume covers the following areas — phase characterisation using diffraction methods; correction factors in powder diffraction; Rietveld method application; substructure analysis in textured materials; texture inhomogeneity and its determination; new X-ray diffraction methods; small angle scattering studies in crystalline and amorphous solids; X-Ray stress analysis; phase transitions particularly crystallography and pecularities of the reversible martensitic transformation; structure on non-crystalline materials and their crystallisation; structure and properties of new materials.
In a ?rst approximation, certainly rough, one can de?ne as non-crystalline materials those which are neither single-crystals nor poly-crystals. Within this category, we canincludedisorderedsolids,softcondensed matter,andlivesystemsamong others. Contrary to crystals, non-crystalline materials have in common that their intrinsic structures cannot be exclusively described by a discrete and periodical function but by a continuous function with short range of order. Structurally these systems have in common the relevance of length scales between those de?ned by the atomic and the macroscopic scale. In a simple ?uid, for example, mobile molecules may freely exchange their positions, so that their new positions are permutations of their old ones. By contrast, in a complex ?uid large groups of molecules may be interc- nected so that the permutation freedom within the group is lost, while the p- mutation between the groups is possible. In this case, the dominant characteristic length, which may de?ne the properties of the system, is not the molecular size but that of the groups. A central aspect of some non-crystalline materials is that they may self-organize. This is of particular importance for Soft-matter materials. Self-organization is characterized by the spontaneous creation of regular structures at different length scales which may exhibit a certain hierarchy that controls the properties of the system. X-ray scattering and diffraction have been for more than a hundred years an essential technique to characterize the structure of materials. Quite often scattering anddiffractionphenomenaexhibitedbynon-crystallinematerialshavebeenreferred to as non-crystalline diffraction.
Fifth volume of a 40 volume series on nanoscience and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about X-ray and Neutron Techniques for Nanomaterials Characterization. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.