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Star-formation is one of the key processes that shape the current state and evolution of galaxies. This volume provides a comprehensive presentation of the different methods used to measure the intensity of recent or on-going star-forming activity in galaxies, discussing their advantages and complications in detail. It includes a thorough overview of the theoretical underpinnings of star-formation rate indicators, including topics such as stellar evolution and stellar spectra, the stellar initial mass function, and the physical conditions in the interstellar medium. The authors bring together in one place detailed and comparative discussions of traditional and new star-formation rate indicators, star-formation rate measurements in different spatial scales, and comparisons of star-formation rate indicators probing different stellar populations, along with the corresponding theoretical background. This is a useful reference for students and researchers working in the field of extragalactic astrophysics and studying star-formation in local and higher-redshift galaxies.
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The paradigm of a dark energy- and dark matter-dominated Universe, with the hierarchical merger scenario for the formation of galaxies, has scored impressive successes in matching the observed Universe. However, the theory fails to explain the difficulty in generating ordinary disk galaxies such as the Milky Way, suggesting that some important physics must be missing in current models. IAU Symposium 254 was organized to address this question, gathering researchers from an unusually broad range of fields, from cosmology to interstellar matter, and the formation and evolution of stars. High-class reviews, lectures and posters combine to define the frontiers in the field and point the way to new avenues of research. This volume presents a unique set of succinct overviews illuminating the full range of topics in this very active field. It also honors Danish astrophysicist Bengt Strömgren (1908-1987), who laid much of the foundation for this entire field.
June issues, 1941-44 and Nov. issue, 1945, include a buyers' guide section.
In 1993, the first edition of The Electrical Engineering Handbook set a new standard for breadth and depth of coverage in an engineering reference work. Now, this classic has been substantially revised and updated to include the latest information on all the important topics in electrical engineering today. Every electrical engineer should have an opportunity to expand his expertise with this definitive guide. In a single volume, this handbook provides a complete reference to answer the questions encountered by practicing engineers in industry, government, or academia. This well-organized book is divided into 12 major sections that encompass the entire field of electrical engineering, including circuits, signal processing, electronics, electromagnetics, electrical effects and devices, and energy, and the emerging trends in the fields of communications, digital devices, computer engineering, systems, and biomedical engineering. A compendium of physical, chemical, material, and mathematical data completes this comprehensive resource. Every major topic is thoroughly covered and every important concept is defined, described, and illustrated. Conceptually challenging but carefully explained articles are equally valuable to the practicing engineer, researchers, and students. A distinguished advisory board and contributors including many of the leading authors, professors, and researchers in the field today assist noted author and professor Richard Dorf in offering complete coverage of this rapidly expanding field. No other single volume available today offers this combination of broad coverage and depth of exploration of the topics. The Electrical Engineering Handbook will be an invaluable resource for electrical engineers for years to come.
Diffuse X-ray scattering is a rich (virtually untapped) source of local structural information over and above that obtained by conventional crystal structure determination (crystallography). The main aim in the book is to show how computer simulation of a model crystal provides a general method by which diffuse scattering of all kinds and from all types of materials can be interpreted and analysed. Part I of the book gives a description of the experimental methods used to obtain diffuse scattering data. Part II describes a number of simple stochastic models of disorder, which allows various concepts to be established and enables simple examples to be generated to illustrate key principles. Part III describes example studies of a wide variety of real materials. These examples not only document the development of computer simulation methods for investigating and analysing disorder problems but also provide a resource for helping future researchers recognise the kinds of effects which can occur and for pointing the way to tackling new problems which are encountered.