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With the fast advancement of CMOS fabrication technology, more and more signal-processing functions are implemented in the digital domain for a lower cost, lower power consumption, higher yield, and higher re-configurability. This has recently generated a great demand for low-power, low-voltage A/D converters that can be realized in a mainstream deep-submicron CMOS technology. However, the discrepancies between lithography wavelengths and circuit feature sizes are increasing. Lower power supply voltages significantly reduce noise margins and increase variations in process, device and design parameters. Consequently, it is steadily more difficult to control the fabrication process precisely enough to maintain uniformity. The inherent randomness of materials used in fabrication at nanoscopic scales means that performance will be increasingly variable, not only from die-to-die but also within each individual die. Parametric variability will be compounded by degradation in nanoscale integrated circuits resulting in instability of parameters over time, eventually leading to the development of faults. Process variation cannot be solved by improving manufacturing tolerances; variability must be reduced by new device technology or managed by design in order for scaling to continue. Similarly, within-die performance variation also imposes new challenges for test methods. In an attempt to address these issues, Low-Power High-Resolution Analog-to-Digital Converters specifically focus on: i) improving the power efficiency for the high-speed, and low spurious spectral A/D conversion performance by exploring the potential of low-voltage analog design and calibration techniques, respectively, and ii) development of circuit techniques and algorithms to enhance testing and debugging potential to detect errors dynamically, to isolate and confine faults, and to recover errors continuously. The feasibility of the described methods has been verified by measurements from the silicon prototypes fabricated in standard 180nm, 90nm and 65nm CMOS technology.
One of the main trends of microelectronics is toward design for integrated systems, i.e., system-on-a-chip (SoC) or system-on-silicon (SoS). Due to this development, design techniques for mixed-signal circuits become more important than before. Among other devices, analog-to-digital and digital-to-analog converters are the two bridges between the analog and the digital worlds. Besides, low-power design technique is one of the main issues for embedded systems, especially for hand-held applications. Modular Low-Power, High-Speed CMOS Analog-to-Digital Converter for Embedded Systems aims at design techniques for low-power, high-speed analog-to-digital converter processed by the standard CMOS technology. Additionally this book covers physical integration issues of A/D converter integrated in SoC, i.e., substrate crosstalk and reference voltage network design.
This book is a step-by-step tutorial on how to design a low-power, high-resolution (not less than 12 bit), and high-speed (not less than 200 MSps) integrated CMOS analog-to-digital (AD) converter, to respond to the challenge from the rapid growth of IoT. The discussion includes design techniques on both the system level and the circuit block level. In the architecture level, the power-efficient pipelined AD converter, the hybrid AD converter and the time-interleaved AD converter are described. In the circuit block level, the reference voltage buffer, the opamp, the comparator, and the calibration are presented. Readers designing low-power and high-performance AD converters won’t want to miss this invaluable reference. Provides an in-depth introduction to the newest design techniques for the power-efficient, high-resolution (not less than 12 bit), and high-speed (not less than 200 MSps) AD converter; Presents three types of power-efficient architectures of the high-resolution and high-speed AD converter; Discusses the relevant circuit blocks (i.e., the reference voltage buffer, the opamp, and the comparator) in two aspects, relaxing the requirements and improving the performance.
System Design; Digital to Analog Converters; Sensors; Time-Based Measurements; Output Control Methods; Solenoids, Relays, and Other Analog Outputs; Motors; EMI; High Precision Applications; Standard Interfaces.
Pipelined architecture analog-to-digital converters (ADCs) have become the architecture of choice for high speed and moderate to high resolution devices. Subsequently, different techniques of the fault diagnosis by built in self-test (BIST) system have been developed. This book gives a rigorous, theoretical and mathematical analysis for the design of pipelined ADCs, along with detailed practical aspects of implementing it in very large-scale integration (VLSI). In each chapter a unique fault diagnosis technique for pipelined ADC has been proposed. Chapter 1 discusses a 1.8V 10-bit 500 mega samples-per-second parallel pipelined ADC, describing the design of high speed, low power, low voltage ADC in CMOS technology. Chapter 2 introduces a BIST system where both the circuit and its diagnosis tool are implemented on the same chip. Chapter 3 examines the design of an oscillation-based BIST system for a 1.8V 8-bit 125-mega samples per second pipelined ADC. Chapter 4 focuses on the evaluation of dynamic parameters of a pipelined ADC with an oscillation-based BIST. Chapter 5 covers reconfigurable BIST architecture for pipelined ADCs. The book is an ideal reference for graduate students and researchers within electrical, electronics and computer engineering.
This comprehensive new handbook is a one-stop engineering reference covering data converter fundamentals, techniques, and applications. Beginning with the basic theoretical elements necessary for a complete understanding of data converters, the book covers all the latest advances made in this changing field. Details are provided on the design of high-speec ADCs, high accuracy DACs and ADCs, sample-and-hold amplifiers, voltage sources and current reference,noise-shaping coding, sigma-delta converters, and much more.
This book is based on the 18 tutorials presented during the 24th workshop on Advances in Analog Circuit Design. Expert designers present readers with information about a variety of topics at the frontier of analog circuit design, including low-power and energy-efficient analog electronics, with specific contributions focusing on the design of efficient sensor interfaces and low-power RF systems. This book serves as a valuable reference to the state-of-the-art, for anyone involved in analog circuit research and development.
Micro-electronics and so integrated circuit design are heavily driven by technology scaling. The main engine of scaling is an increased system performance at reduced manufacturing cost (per system). In most systems digital circuits dominate with respect to die area and functional complexity. Digital building blocks take full - vantage of reduced device geometries in terms of area, power per functionality, and switching speed. On the other hand, analog circuits rely not on the fast transition speed between a few discrete states but fairly on the actual shape of the trans- tor characteristic. Technology scaling continuously degrades these characteristics with respect to analog performance parameters like output resistance or intrinsic gain. Below the 100 nm technology node the design of analog and mixed-signal circuits becomes perceptibly more dif cult. This is particularly true for low supply voltages near to 1V or below. The result is not only an increased design effort but also a growing power consumption. The area shrinks considerably less than p- dicted by the digital scaling factor. Obviously, both effects are contradictory to the original goal of scaling. However, digital circuits become faster, smaller, and less power hungry. The fast switching transitions reduce the susceptibility to noise, e. g. icker noise in the transistors. There are also a few drawbacks like the generation of power supply noise or the lack of power supply rejection.
“Wireless is coming” was the message received by VLSI designers in the early 1990’s. They believed it. But they never imagined that the wireless wave would be coming with such intensity and speed. Today one of the most challenging areas for VLSI designers is VLSI circuit and system design for wireless applications. New generation of wireless systems, which includes multimedia, put severe constraints on performance, cost, size, power and energy. The challenge is immense and the need for new generation of VLSI designers, who are fluent in wireless communication and are masters of mixed signal design, is great. No single text or reference book contains the necessary material to educate such needed new generation of VLSIdesigners. There are gaps. Excellent books exist on communication theory and systems, including wireless applications and others treat well basic digital, analog and mixed signal VLSI design. We feel that this book is the first of its kind to fill that gap. In the first half of this book we offer the reader (the VLSI designer) enough material to understand wireless communication systems. We start with a historical account. And then we present an overview of wireless communication systems. This is followed by detailed treatment of related topics; the mobile radio, digital modulation and schemes, spread spectrum and receiver architectures. The second half of the book deals with VLSI design issues related to mixed-signal design. These include analog-to-digital conversion, transceiver design, digital low-power techniques, amplifier design, phase locked loops and frequency synthesizers.
The International Conference on Signals, Systems and Automation (ICSSA 2011) aims to spread awareness in the research and academic community regarding cutting-edge technological advancements revolutionizing the world. The main emphasis of this conference is on dissemination of information, experience, and research results on the current topics of interest through in-depth discussions and participation of researchers from all over the world. The objective is to provide a platform to scientists, research scholars, and industrialists for interacting and exchanging ideas in a number of research areas. This will facilitate communication among researchers in different fields of Electronics and Communication Engineering. The International Conference on Intelligent System and Data Processing (ICISD 2011) is organized to address various issues that will foster the creation of intelligent solutions in the future. The primary goal of the conference is to bring together worldwide leading researchers, developers, practitioners, and educators interested in advancing the state of the art in computational intelligence and data processing for exchanging knowledge that encompasses a broad range of disciplines among various distinct communities. Another goal is to promote scientific information interchange between researchers, developers, engineers, students, and practitioners working in India and abroad.