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This practical, tool-independent guide to designing digital circuits takes a unique, top-down approach, reflecting the nature of the design process in industry. Starting with architecture design, the book comprehensively explains the why and how of digital circuit design, using the physics designers need to know, and no more.
The book provides a comprehensive coverage of different aspects of low power circuit synthesis at various levels of design hierarchy; starting from the layout level to the system level. For a seamless understanding of the subject, basics of MOS circuits has been introduced at transistor, gate and circuit level; followed by various low-power design methodologies, such as supply voltage scaling, switched capacitance minimization techniques and leakage power minimization approaches. The content of this book will prove useful to students, researchers, as well as practicing engineers.
Analog Design Issues in Digital VLSI Circuits and Systems brings together in one place important contributions and up-to-date research results in this fast moving area. Analog Design Issues in Digital VLSI Circuits and Systems serves as an excellent reference, providing insight into some of the most challenging research issues in the field.
Practical Low Power Digital VLSI Design emphasizes the optimization and trade-off techniques that involve power dissipation, in the hope that the readers are better prepared the next time they are presented with a low power design problem. The book highlights the basic principles, methodologies and techniques that are common to most CMOS digital designs. The advantages and disadvantages of a particular low power technique are discussed. Besides the classical area-performance trade-off, the impact to design cycle time, complexity, risk, testability and reusability are discussed. The wide impacts to all aspects of design are what make low power problems challenging and interesting. Heavy emphasis is given to top-down structured design style, with occasional coverage in the semicustom design methodology. The examples and design techniques cited have been known to be applied to production scale designs or laboratory settings. The goal of Practical Low Power Digital VLSI Design is to permit the readers to practice the low power techniques using current generation design style and process technology. Practical Low Power Digital VLSI Design considers a wide range of design abstraction levels spanning circuit, logic, architecture and system. Substantial basic knowledge is provided for qualitative and quantitative analysis at the different design abstraction levels. Low power techniques are presented at the circuit, logic, architecture and system levels. Special techniques that are specific to some key areas of digital chip design are discussed as well as some of the low power techniques that are just appearing on the horizon. Practical Low Power Digital VLSI Design will be of benefit to VLSI design engineers and students who have a fundamental knowledge of CMOS digital design.
Power supply current monitoring to detect CMOS IC defects during production testing quietly laid down its roots in the mid-1970s. Both Sandia Labs and RCA in the United States and Philips Labs in the Netherlands practiced this procedure on their CMOS ICs. At that time, this practice stemmed simply from an intuitive sense that CMOS ICs showing abnormal quiescent power supply current (IDDQ) contained defects. Later, this intuition was supported by data and analysis in the 1980s by Levi (RACD, Malaiya and Su (SUNY-Binghamton), Soden and Hawkins (Sandia Labs and the University of New Mexico), Jacomino and co-workers (Laboratoire d'Automatique de Grenoble), and Maly and co-workers (Carnegie Mellon University). Interest in IDDQ testing has advanced beyond the data reported in the 1980s and is now focused on applications and evaluations involving larger volumes of ICs that improve quality beyond what can be achieved by previous conventional means. In the conventional style of testing one attempts to propagate the logic states of the suspended nodes to primary outputs. This is done for all or most nodes of the circuit. For sequential circuits, in particular, the complexity of finding suitable tests is very high. In comparison, the IDDQ test does not observe the logic states, but measures the integrated current that leaks through all gates. In other words, it is like measuring a patient's temperature to determine the state of health. Despite perceived advantages, during the years that followed its initial announcements, skepticism about the practicality of IDDQ testing prevailed. The idea, however, provided a great opportunity to researchers. New results on test generation, fault simulation, design for testability, built-in self-test, and diagnosis for this style of testing have since been reported. After a decade of research, we are definitely closer to practice.
Beginning with discussions on the operation of electronic devices and analysis of the nucleus of digital design, the text addresses: the impact of interconnect, design for low power, issues in timing and clocking, design methodologies, and the effect of design automation on the digital design perspective.
Aimed primarily for undergraduate students pursuing courses in VLSI design, the book emphasizes the physical understanding of underlying principles of the subject. It not only focuses on circuit design process obeying VLSI rules but also on technological aspects of Fabrication. VHDL modeling is discussed as the design engineer is expected to have good knowledge of it. Various Modeling issues of VLSI devices are focused which includes necessary device physics to the required level. With such an in-depth coverage and practical approach practising engineers can also use this as ready reference. Key features: Numerous practical examples. Questions with solutions that reflect the common doubts a beginner encounters. Device Fabrication Technology. Testing of CMOS device BiCMOS Technological issues. Industry trends. Emphasis on VHDL.
CMOS manufacturing environments are surrounded with symptoms that can indicate serious test, design, or reliability problems, which, in turn, can affect the financial as well as the engineering bottom line. This book educates readers, including non-engineers involved in CMOS manufacture, to identify and remedy these causes. This book instills the electronic knowledge that affects not just design but other important areas of manufacturing such as test, reliability, failure analysis, yield-quality issues, and problems. Designed specifically for the many non-electronic engineers employed in the semiconductor industry who need to reliably manufacture chips at a high rate in large quantities, this is a practical guide to how CMOS electronics work, how failures occur, and how to diagnose and avoid them. Key features: Builds a grasp of the basic electronics of CMOS integrated circuits and then leads the reader further to understand the mechanisms of failure. Unique descriptions of circuit failure mechanisms, some found previously only in research papers and others new to this publication. Targeted to the CMOS industry (or students headed there) and not a generic introduction to the broader field of electronics. Examples, exercises, and problems are provided to support the self-instruction of the reader.
Low Power Design Methodologies presents the first in-depth coverage of all the layers of the design hierarchy, ranging from the technology, circuit, logic and architectural levels, up to the system layer. The book gives insight into the mechanisms of power dissipation in digital circuits and presents state of the art approaches to power reduction. Finally, it introduces a global view of low power design methodologies and how these are being captured in the latest design automation environments. The individual chapters are written by the leading researchers in the area, drawn from both industry and academia. Extensive references are included at the end of each chapter. Audience: A broad introduction for anyone interested in low power design. Can also be used as a text book for an advanced graduate class. A starting point for any aspiring researcher.
This well-organised book provides an in-depth coverage of VLSI design engineering, which ranges from CMOS logic to physical design automation. The book begins with a discussion on the structure and operation of MOS as MOSFET is the basic building block for any VLSI design. Then, it goes on to explain the various fabrication methods of MOSFET and CMOS, implementation and properties of MOS inverter circuit, and parasitic parameters and resistances associated with MOSFET, which determine and ultimately limit the performance of a digital system. Besides, it describes design methodology and the concept of the combinational static logic circuits, sequential circuit design and CMOS dynamic circuits. Finally, the book examines semiconductor memory and the importance of adder and multiplier circuits for the VLSI designer. Primarily intended as a text for the undergraduate and postgraduate students of Electrical and Electronics Engineering, the book would also be of considerable value to designers both beginners and professionals. Key Features: Provides mathematical derivations for both noise margin and logic voltage. Explains all combinational and sequential logics separately. Contains a large number of solved and unsolved problems based on issues related to digital VLSI design.