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Speckle study constitutes a multidisciplinary area with inherent complexities. In order to conquer challenges such as the variability of samples and sensitive measurements, researchers must develop a theoretical and statistical understanding of both biological and non-biological metrology using dynamic speckle laser. Dynamic Laser Speckle and Applications discusses the main methodologies used to analyze biospeckle phenomena with a strong focus on experimentation. After establishing a theoretical background in both speckle and biospeckle, the book presents the main methodologies for statistical and image analysis. It then deals with the concept of frequency decomposition before moving on to a discussion of fuzzy methods to treat dynamic speckle data. The book dedicates two sections to applications, including agricultural approaches. Additional features include photo images of experiments and software to aid in easy start-up of dynamic speckle usage. A systematic approach to new dynamic speckle laser phenomena, this book provides the physical theory and statistical background needed to analyze images formed by laser illumination in biological and non-biological samples.
These proceedings reflect the work presented at the conference "Interferometry in Speckle Light: Theory and Applications", held at the Ecole Polytechnique Federale de Lausanne, (EPFL), the Swiss Federal Institute of Technology in Lausanne, Switzerland. The event took place from September 25 to September 28, 2000. Thanks to the diligence of the authors, this book has been published just in time for the conference. Writing this preface in July, in anticipation of the conference, we have tried to envisage how this book will benefit the quality of discourse between authors and attendees. "Interferometry in Speckle Light: Theory and Applications" results from a bottom-up approach and is original in several ways. This conference is not part of a series; on the contrary, it is a single event. The idea of gathering scientists and engineers for a general discussion on the theory and the practice of interferometry, involving rough, non-optically polished objects, was "in the air". An opportunity of this sort was not provided by any of the conferences scheduled when the present one was conceived. For this reason, it was easy to convince a small number of renowned researchers, all of them active in the field of holographic and speckle interferometry, to organize a conference. To be specific, they are the people listed below as members of the scientific and local committees. At the same time, a particular circumstance, namely the retirement of Professor L. Pflug, helped to detennine the location of the meeting.
This practical reference offers state-of-the-art coverage of speckle metrology and its value as a measuring technique in industry.;Examing every important aspect of the field, Speckle Metrology: surveys the origin of speckle displacement and decorrelation; presents procedures for deformation analysis and shape measurement of rough objects; explains particle image velocimetry (PIV), the processing of PIV records, and the design requirements of PIV equipment; discusses the applications of white light speckle methods and the production of artificial speckles; describes the measurement of surface roughness with laser speckles and polychromatic speckles; illustrates semiautomatic and automatic methods for the analysis of Young's fringes; calculates the variation of Young's fringes with the change in the microrelief of the rough surface; and explicates hololenses for imaging and provides design details with aberration corrections for hololense systems.;With over 1500 literature citations, tables, figures and display equations, Speckle Metrology is a resource for students and professionals in the fields of optical, mechanical, electrical and electronics engineering; applied physics; and stress analysis.
Electron Microscopy and Analysis 1997 celebrates the centenary anniversary of the discovery of the electron by J.J. Thomson in Cambridge and the fiftieth anniversary of this distinguished Institute group. The book includes papers on the early history of electron microscopy (from P. Hawkes), the development of the scanning electron microscope at Cambridge (from K. Smith), electron energy loss spectroscopy (from L.M. Brown), imaging methods (from J. Spence), and the future of electron microscopy (from C. Humphreys). Covering a wide range of applications of advanced techniques, it discusses electron imaging, electron energy-loss and x-ray analysis, and scanning probe and electron beam microscopies. This volume is a handy reference for professionals using microscopes in all areas of physics, materials science, metallurgy, and surface science to gain an overview of developments in our understanding of materials microstructure and of advances in microscope interrogation techniques.
Describing NDE issues associated with real-world applications, this comprehensive book details conventional and forthcoming NDE technologies. It instructs on current practices, common techniques and equipment applications, and the potentials and limitations of current NDE methods. Each chapter details a different method, providing an overview, an e
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