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This useful monograph presents a total of seven prototypes: two double-sampled S/H circuits, a time-interleaved ADC, an IF-sampling self-calibrated pipelined ADC, a current steering DAC with a deglitcher, and two pipelined ADCs employing the SO techniques.
Pipelined analog to digital converters (ADCs) have become the architecture of choice for high-speed and moderate- to high-resolution devices. Subsequently, different techniques of fault diagnosis by the built-in self-test (BIST) system have been developed. An ideal reference for graduate students and researchers within electrical, electronics and computer engineering, this book provides a rigorous, theoretical and mathematical analysis for the design of pipelined ADCs, along with detailed practical aspects of implementing it in very large-scale integration (VLSI). In each chapter a unique fault diagnosis technique for pipelined ADC has been proposed.
Analog-to-Digital Converters (ADCs) play an important role in most modern signal processing and wireless communication systems where extensive signal manipulation is necessary to be performed by complicated digital signal processing (DSP) circuitry. This trend also creates the possibility of fabricating all functional blocks of a system in a single chip (System On Chip - SoC), with great reductions in cost, chip area and power consumption. However, this tendency places an increasing challenge, in terms of speed, resolution, power consumption, and noise performance, in the design of the front-end ADC which is usually the bottleneck of the whole system, especially under the unavoidable low supply-voltage imposed by technology scaling, as well as the requirement of battery operated portable devices. Generalized Low-Voltage Circuit Techniques for Very High-Speed Time-Interleaved Analog-to-Digital Converters will present new techniques tailored for low-voltage and high-speed Switched-Capacitor (SC) ADC with various design-specific considerations.
With the fast advancement of CMOS fabrication technology, more and more signal-processing functions are implemented in the digital domain for a lower cost, lower power consumption, higher yield, and higher re-configurability. This has recently generated a great demand for low-power, low-voltage A/D converters that can be realized in a mainstream deep-submicron CMOS technology. However, the discrepancies between lithography wavelengths and circuit feature sizes are increasing. Lower power supply voltages significantly reduce noise margins and increase variations in process, device and design parameters. Consequently, it is steadily more difficult to control the fabrication process precisely enough to maintain uniformity. The inherent randomness of materials used in fabrication at nanoscopic scales means that performance will be increasingly variable, not only from die-to-die but also within each individual die. Parametric variability will be compounded by degradation in nanoscale integrated circuits resulting in instability of parameters over time, eventually leading to the development of faults. Process variation cannot be solved by improving manufacturing tolerances; variability must be reduced by new device technology or managed by design in order for scaling to continue. Similarly, within-die performance variation also imposes new challenges for test methods. In an attempt to address these issues, Low-Power High-Resolution Analog-to-Digital Converters specifically focus on: i) improving the power efficiency for the high-speed, and low spurious spectral A/D conversion performance by exploring the potential of low-voltage analog design and calibration techniques, respectively, and ii) development of circuit techniques and algorithms to enhance testing and debugging potential to detect errors dynamically, to isolate and confine faults, and to recover errors continuously. The feasibility of the described methods has been verified by measurements from the silicon prototypes fabricated in standard 180nm, 90nm and 65nm CMOS technology.
Pipelined architecture analog-to-digital converters (ADCs) have become the architecture of choice for high speed and moderate to high resolution devices. Subsequently, different techniques of the fault diagnosis by built in self-test (BIST) system have been developed. This book gives a rigorous, theoretical and mathematical analysis for the design of pipelined ADCs, along with detailed practical aspects of implementing it in very large-scale integration (VLSI). In each chapter a unique fault diagnosis technique for pipelined ADC has been proposed. Chapter 1 discusses a 1.8V 10-bit 500 mega samples-per-second parallel pipelined ADC, describing the design of high speed, low power, low voltage ADC in CMOS technology. Chapter 2 introduces a BIST system where both the circuit and its diagnosis tool are implemented on the same chip. Chapter 3 examines the design of an oscillation-based BIST system for a 1.8V 8-bit 125-mega samples per second pipelined ADC. Chapter 4 focuses on the evaluation of dynamic parameters of a pipelined ADC with an oscillation-based BIST. Chapter 5 covers reconfigurable BIST architecture for pipelined ADCs. The book is an ideal reference for graduate students and researchers within electrical, electronics and computer engineering.
High-speed, medium-resolution, analog-to-digital converters (ADCs) are important building blocks in a wide range of applications. High-speed, medium-resolution ADCs have been implemented by various ADC architectures such as a folding ADC, a subranging ADC, and a pipeline ADC. Among them, pipeline ADCs have proven to be efficient architectures for applications such as digital communication systems, data acquisition systems and video systems. Especially, power dissipation is a primary concern in applications requiring portability. Thus, the objective of this work is to design and build a low-voltage low-power medium-resolution (8-10bits) high-speed pipeline ADC in deep sub-micron CMOS technology. The non-idealities of the circuit realization are carefully investigated in order to identify the circuit requirements for a low power circuit design of a pipeline ADC. The resolution per stage plays an important role in determining overall power dissipation of a pipeline ADC. The pros and cons of both large and small number of bits per-stage are examined. A power optimization algorithm is developed to decide more accurately which approach is better for lower power dissipation. Both identical and non-identical number of bit per-stage approaches are considered and their differences are analyzed. A low-power, low-voltage 10-bit 100Msamples/s pipeline ADC was designed and implemented in a 0.18mm CMOS process. The power consumption was minimized with the right selection of the per-stage resolution based on the result of the power optimization algorithm and by the scaling down the sampling capacitor size in subsequent stages.
The realization of signal sampling and quantization at high sample rates with low power dissipation is an important goal in many applications, includ ing portable video devices such as camcorders, personal communication devices such as wireless LAN transceivers, in the read channels of magnetic storage devices using digital data detection, and many others. This paper describes architecture and circuit approaches for the design of high-speed, low-power pipeline analog-to-digital converters in CMOS. Here the term high speed is taken to imply sampling rates above 1 Mhz. In the first section the dif ferent conversion techniques applicable in this range of sample rates is dis cussed. Following that the particular problems associated with power minimization in video-rate pipeline ADCs is discussed. These include optimi zation of capacitor sizes, design of low-voltage transmission gates, and opti mization of switched capacitor gain blocks and operational amplifiers for minimum power dissipation. As an example of the application of these tech niques, the design of a power-optimized lO-bit pipeline AID converter (ADC) that achieves =1. 67 mW per MS/s of sampling rate from 1 MS/s to 20 MS/s is described. 2. Techniques for CMOS Video-Rate AID Conversion Analog-to-digital conversion techniques can be categorized in many ways. One convenient means of comparing techniques is to examine the number of "analog clock cycles" required to produce one effective output sample of the signal being quantized.
This book shows that digitally assisted analog to digital converters are not the only way to cope with poor analog performance caused by technology scaling. It describes various analog design techniques that enhance the area and power efficiency without employing any type of digital calibration circuitry. These techniques consist of self-biasing for PVT enhancement, inverter-based design for improved speed/power ratio, gain-of-two obtained by voltage sum instead of charge redistribution, and current-mode reference shifting instead of voltage reference shifting. Together, these techniques allow enhancing the area and power efficiency of the main building blocks of a multiplying digital-to-analog converter (MDAC) based stage, namely, the flash quantizer, the amplifier, and the switched capacitor network of the MDAC. Complementing the theoretical analyses of the various techniques, a power efficient operational transconductance amplifier is implemented and experimentally characterized. Furthermore, a medium-low resolution reference-free high-speed time-interleaved pipeline ADC employing all mentioned design techniques and circuits is presented, implemented and experimentally characterized. This ADC is said to be reference-free because it precludes any reference voltage, therefore saving power and area, as reference circuits are not necessary. Experimental results demonstrate the potential of the techniques which enabled the implementation of area and power efficient circuits.