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Focusing of Charged Particles, Volume II presents the aspects of particle optics, including the electron, the ion optical domains, and the accelerator field. This book provides a detailed analysis of the principles of the laws of propagation of beams. Comprised of three parts encompassing three chapters, this volume starts with an overview of how a beam of charged particles traverses a region that is at a uniform, constant, electrostatic potential. This book then discusses the principle of charge repulsion effect by which the space charge of the beam modifies the potential in the region that it traverses. Other chapters examine the general design techniques and performances obtainable for electron guns applicable for use in initiating a beam for linear beam tubes that is given in a condensed form. The last chapter deals with the two stable charged particles that can be accelerated, namely, protons and electrons. This book is a valuable resource to physicists, accelerator experts, and experimenters in search of interactions in the detector target.
Focusing of Charged Particles, Volume I deals with the various aspects of problems in corpuscular optics such as the need for new focusing principles to guide the beams of fast particles over long distances and to increase the internal efficiency of particle accelerators. This volume is comprised of articles from specialists who attempt to find solutions to various problems in geometrical corpuscular optics. The topics discussed in the book include the general properties of potentials, fields and trajectories, the methods for resolving Laplace's and Poisson's equations and computing trajectories with or without space charge, and a description of the methods used for the measurement of magnetic fields. The optics of straight axis systems for producing and focusing low-intensity beams: high-brightness electron guns, electrostatic and magnetic electron lenses, and strong focusing lenses for high-energy beams are covered as well. The text ends with the elucidation of the problem of the production of electron microprobes. Physicists, students, researchers, and engineers working with charged particles will find the book invaluable.
Optics of Charged Particles describes how charged particles move in the main and fringing fields of magnetic or electrostatic dipoles, quadrupoles, and hexapoles using the same type of formulation and consistent nomenclature throughout. This book not only describes the particle trajectories and beam shapes, but also provides guidelines for designing particle optical instruments. The topics discussed include Gaussian optics and transfer matrices, general relations for the motion of charged particles in electromagnetic fields, and quadrupole lenses. The sector field lenses, charged particle beams and phase space, and particle beams in periodic structures are also elaborated. This text likewise considers the fringing fields, image aberrations, and design of particle spectrometers and beam guide lines. This publication is suitable for undergraduate students in physics and mathematics.
Principles of Electron Optics: Applied Geometrical Optics, Second Edition gives detailed information about the many optical elements that use the theory presented in Volume 1: electrostatic and magnetic lenses, quadrupoles, cathode-lens-based instruments including the new ultrafast microscopes, low-energy-electron microscopes and photoemission electron microscopes and the mirrors found in their systems, Wien filters and deflectors. The chapter on aberration correction is largely new. The long section on electron guns describes recent theories and covers multi-column systems and carbon nanotube emitters. Monochromators are included in the section on curved-axis systems. The lists of references include many articles that will enable the reader to go deeper into the subjects discussed in the text. The book is intended for postgraduate students and teachers in physics and electron optics, as well as researchers and scientists in academia and industry working in the field of electron optics, electron and ion microscopy and nanolithography. Offers a fully revised and expanded new edition based on the latest research developments in electron optics Written by the top experts in the field Covers every significant advance in electron optics since the subject originated Contains exceptionally complete and carefully selected references and notes Serves both as a reference and text
Although particle accelerators are the book's main thrust, it offers a broad synoptic description of beams which applies to a wide range of other devices such as low-energy focusing and transport systems and high-power microwave sources. Develops material from first principles, basic equations and theorems in a systematic way. Assumptions and approximations are clearly indicated. Discusses underlying physics and validity of theoretical relationships, design formulas and scaling laws. Features a significant amount of recent work including image effects and the Boltzmann line charge density profiles in bunched beams.
Written by a pioneer in the field, this overview of charged particle optics provides a solid introduction to the subject area for all physicists wishing to design their own apparatus or better understand the instruments with which they work. It begins by introducing electrostatic lenses and fields used for acceleration, focusing and deflection of ions or electrons. Subsequent chapters give detailed descriptions of electrostatic deflection elements, uniform and non-uniform magnetic sector fields, image aberrations, and, finally, fringe field confinement.