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Focusing of Charged Particles, Volume II presents the aspects of particle optics, including the electron, the ion optical domains, and the accelerator field. This book provides a detailed analysis of the principles of the laws of propagation of beams. Comprised of three parts encompassing three chapters, this volume starts with an overview of how a beam of charged particles traverses a region that is at a uniform, constant, electrostatic potential. This book then discusses the principle of charge repulsion effect by which the space charge of the beam modifies the potential in the region that it traverses. Other chapters examine the general design techniques and performances obtainable for electron guns applicable for use in initiating a beam for linear beam tubes that is given in a condensed form. The last chapter deals with the two stable charged particles that can be accelerated, namely, protons and electrons. This book is a valuable resource to physicists, accelerator experts, and experimenters in search of interactions in the detector target.
Focusing of Charged Particles, Volume I, explains the focusing principles needed to guide the beams of fast particles over long distances and to increase the internal efficiency of particle accelerators. This book discusses the geometrical corpuscular optics as well as the methods for computing fields. Comprised of two parts encompassing two chapters, this volume starts with an overview of the general properties of potentials, fields, and trajectories. This book then examines the methods for resolving Laplace’s and Poisson’s equations, as well as computing trajectories with or without space charge. Other chapters describe the methods used for the measurement of magnetic field. This text discusses as well the optics of straight axis systems for focusing and producing low-intensity beams. The final chapter deals with the particular and very delicate problem of the production of electron microbes. Engineers, students, and researchers working with charged particles will find this book extremely useful.
Focusing of Charged Particles ...
Written by a pioneer in the field, this overview of charged particle optics provides a solid introduction to the subject area for all physicists wishing to design their own apparatus or better understand the instruments with which they work. It begins by introducing electrostatic lenses and fields used for acceleration, focusing and deflection of ions or electrons. Subsequent chapters give detailed descriptions of electrostatic deflection elements, uniform and non-uniform magnetic sector fields, image aberrations, and, finally, fringe field confinement.
Focusing of Charged Particles, Volume I deals with the various aspects of problems in corpuscular optics such as the need for new focusing principles to guide the beams of fast particles over long distances and to increase the internal efficiency of particle accelerators. This volume is comprised of articles from specialists who attempt to find solutions to various problems in geometrical corpuscular optics. The topics discussed in the book include the general properties of potentials, fields and trajectories, the methods for resolving Laplace's and Poisson's equations and computing trajectories with or without space charge, and a description of the methods used for the measurement of magnetic fields. The optics of straight axis systems for producing and focusing low-intensity beams: high-brightness electron guns, electrostatic and magnetic electron lenses, and strong focusing lenses for high-energy beams are covered as well. The text ends with the elucidation of the problem of the production of electron microprobes. Physicists, students, researchers, and engineers working with charged particles will find the book invaluable.
Optics of Charged Particles describes how charged particles move in the main and fringing fields of magnetic or electrostatic dipoles, quadrupoles, and hexapoles using the same type of formulation and consistent nomenclature throughout. This book not only describes the particle trajectories and beam shapes, but also provides guidelines for designing particle optical instruments. The topics discussed include Gaussian optics and transfer matrices, general relations for the motion of charged particles in electromagnetic fields, and quadrupole lenses. The sector field lenses, charged particle beams and phase space, and particle beams in periodic structures are also elaborated. This text likewise considers the fringing fields, image aberrations, and design of particle spectrometers and beam guide lines. This publication is suitable for undergraduate students in physics and mathematics.
Although particle accelerators are the book's main thrust, it offers a broad synoptic description of beams which applies to a wide range of other devices such as low-energy focusing and transport systems and high-power microwave sources. Develops material from first principles, basic equations and theorems in a systematic way. Assumptions and approximations are clearly indicated. Discusses underlying physics and validity of theoretical relationships, design formulas and scaling laws. Features a significant amount of recent work including image effects and the Boltzmann line charge density profiles in bunched beams.