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In this paper, we present results for significantly improving the performance of sequential circuit diagnostic test pattern generation (DATPG). Our improvements are achieved by developing results that permit dynamic, fully functional, collapsing of candidate faults. Fault collapsing permits the organization of faults into disjoint partitions based on the indistinguishability relation. These results are used to develop a diagnostic test pattern generation algorithm that has the same order of complexity as that of detection oriented test generation (ATPG). Techniques to identify untestable faults, based on exploiting indistinguishability identification, are also presented. Experimental results are presented on the ISCAS 89 benchmark circuits.
It has been recognized that productivity improvement is an important issue of the 80' s. It is regarded as the most efficient way to improve national economy and to enrich the quality of life. The key to productivity improvement is advanced automation, especially computer-integrated automation for engineering design and office operations as well as manufacturing processes. This is the theme of 1983 International Conference on Advanced Automation, ICAA-83. This book contains the articles which are the revised and updated version of the papers presented at the ICAA-83 Conference. Traditionally, automation is synonymous with mechanization; but this Conference has treated automation from a different point of view. We consider automation as a process to unify various automated information processing systems for performing business, administration, design, engineering and manufacturing functions, in addition to the traditional fixed automation in production. In other words, design automation and office automation form an inte gral part of factory automation to accomplish comprehensive computer-integrated manufacturing and production. In engineering and manufacturing today, quality design and high productivity are synonymous with the use of computers, robots, expert systems, and other computer-based technologies. The greater the degree of computer-based automation exploited and implemented, the greater a nation's ability to survive in tomorrow's extremely competitive world market.
Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Yet, as digital systems become more ubiquitous and complex, the challenge of testing them has become more difficult. As one development group designing a RISC stated, "the work required to . . . test a chip of this size approached the amount of effort required to design it." A valued reference for nearly two decades, Digital Logic Testing and Simulation has been significantly revised and updated for designers and test engineers who must meet this challenge. There is no single solution to the testing problem. Organized in an easy-to-follow, sequential format, this Second Edition familiarizes the reader with the many different strategies for testing and their applications, and assesses the strengths and weaknesses of the various approaches. The book reviews the building blocks of a successful testing strategy and guides the reader on choosing the best solution for a particular application. Digital Logic Testing and Simulation, Second Edition covers such key topics as: * Binary Decision Diagrams (BDDs) and cycle-based simulation * Tester architectures/Standard Test Interface Language (STIL) * Practical algorithms written in a Hardware Design Language (HDL) * Fault tolerance * Behavioral Automatic Test Pattern Generation (ATPG) * The development of the Test Design Expert (TDX), the many obstacles encountered and lessons learned in creating this novel testing approach Up-to-date and comprehensive, Digital Logic Testing and Simulation is an important resource for anyone charged with pinpointing faulty products and assuring quality, safety, and profitability.
Samples the present state-of-the-art in CAD for VLSI, covering both newly developed algorithms and applications of techniques from the artificial intelligence community. The material is based on a tutorial course run in conjunction with the 1991 European Conference on Circuit Theory and Design, and should interest engineers involved in the design and testing of integrated circuits and systems. Annotation copyrighted by Book News, Inc., Portland, OR