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In the early days of digital design, we were concerned with the logical correctness of circuits. We knew that if we slowed down the clock signal sufficiently, the circuit would function correctly. With improvements in the semiconductor process technology, our expectations on speed have soared. A frequently asked question in the last decade has been how fast can the clock run. This puts significant demands on timing analysis and delay testing. Fueled by the above events, a tremendous growth has occurred in the research on delay testing. Recent work includes fault models, algorithms for test generation and fault simulation, and methods for design and synthesis for testability. The authors of this book, Angela Krstic and Tim Cheng, have personally contributed to this research. Now they do an even greater service to the profession by collecting the work of a large number of researchers. In addition to expounding such a great deal of information, they have delivered it with utmost clarity. To further the reader's understanding many key concepts are illustrated by simple examples. The basic ideas of delay testing have reached a level of maturity that makes them suitable for practice. In that sense, this book is the best x DELAY FAULT TESTING FOR VLSI CIRCUITS available guide for an engineer designing or testing VLSI systems. Tech niques for path delay testing and for use of slower test equipment to test high-speed circuits are of particular interest.
GPU Computing Gems Emerald Edition offers practical techniques in parallel computing using graphics processing units (GPUs) to enhance scientific research. The first volume in Morgan Kaufmann's Applications of GPU Computing Series, this book offers the latest insights and research in computer vision, electronic design automation, and emerging data-intensive applications. It also covers life sciences, medical imaging, ray tracing and rendering, scientific simulation, signal and audio processing, statistical modeling, video and image processing. This book is intended to help those who are facing the challenge of programming systems to effectively use GPUs to achieve efficiency and performance goals. It offers developers a window into diverse application areas, and the opportunity to gain insights from others' algorithm work that they may apply to their own projects. Readers will learn from the leading researchers in parallel programming, who have gathered their solutions and experience in one volume under the guidance of expert area editors. Each chapter is written to be accessible to researchers from other domains, allowing knowledge to cross-pollinate across the GPU spectrum. Many examples leverage NVIDIA's CUDA parallel computing architecture, the most widely-adopted massively parallel programming solution. The insights and ideas as well as practical hands-on skills in the book can be immediately put to use. Computer programmers, software engineers, hardware engineers, and computer science students will find this volume a helpful resource. For useful source codes discussed throughout the book, the editors invite readers to the following website: ..." - Covers the breadth of industry from scientific simulation and electronic design automation to audio / video processing, medical imaging, computer vision, and more - Many examples leverage NVIDIA's CUDA parallel computing architecture, the most widely-adopted massively parallel programming solution - Offers insights and ideas as well as practical "hands-on" skills you can immediately put to use
The Electronic Device Failure Analysis Society proudly announces the Seventh Edition of the Microelectronics Failure Analysis Desk Reference, published by ASM International. The new edition will help engineers improve their ability to verify, isolate, uncover, and identify the root cause of failures. Prepared by a team of experts, this updated reference offers the latest information on advanced failure analysis tools and techniques, illustrated with numerous real-life examples. This book is geared to practicing engineers and for studies in the major area of power plant engineering. For non-metallurgists, a chapter has been devoted to the basics of material science, metallurgy of steels, heat treatment, and structure-property correlation. A chapter on materials for boiler tubes covers composition and application of different grades of steels and high temperature alloys currently in use as boiler tubes and future materials to be used in supercritical, ultra-supercritical and advanced ultra-supercritical thermal power plants. A comprehensive discussion on different mechanisms of boiler tube failure is the heart of the book. Additional chapters detailing the role of advanced material characterization techniques in failure investigation and the role of water chemistry in tube failures are key contributions to the book.
This practical, tool-independent guide to designing digital circuits takes a unique, top-down approach, reflecting the nature of the design process in industry. Starting with architecture design, the book comprehensively explains the why and how of digital circuit design, using the physics designers need to know, and no more.
This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.
Covers the statistical analysis and optimization issues arising due to increased process variations in current technologies. Comprises a valuable reference for statistical analysis and optimization techniques in current and future VLSI design for CAD-Tool developers and for researchers interested in starting work in this very active area of research. Written by author who lead much research in this area who provide novel ideas and approaches to handle the addressed issues
Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.
Infrared thermography (IRT) is a non-contact, non-invasive methodology which allows for detection of thermal energy that is radiated from objects in the infrared band of the electromagnetic spectrum, for conversion of such energy into a visible image (such as a surface temperature map). This feature represents a great potential to be exploited in a vast variety of fields from aerospace to civil engineering, to medicine, to agriculture, etc. However, IRT is still not adequately enclosed in industrial instrumentation and there are still potential users who might benefit from the use of such a technique and who are not aware of their existence. This e-book conveys information about basic IRT theory, infrared detectors, signal digitalization and applications of infrared thermography in many fields such as medicine, foodstuff conservation, fluid-dynamics, architecture, anthropology, condition monitoring, non destructive testing and evaluation of materials and structures. The volume promotes an exchange of information between the academic world and industry, and shares methodologies which were independently developed and applied in specific disciplines.
The new RISC-V Edition of Computer Organization and Design features the RISC-V open source instruction set architecture, the first open source architecture designed to be used in modern computing environments such as cloud computing, mobile devices, and other embedded systems. With the post-PC era now upon us, Computer Organization and Design moves forward to explore this generational change with examples, exercises, and material highlighting the emergence of mobile computing and the Cloud. Updated content featuring tablet computers, Cloud infrastructure, and the x86 (cloud computing) and ARM (mobile computing devices) architectures is included. An online companion Web site provides advanced content for further study, appendices, glossary, references, and recommended reading. - Features RISC-V, the first such architecture designed to be used in modern computing environments, such as cloud computing, mobile devices, and other embedded systems - Includes relevant examples, exercises, and material highlighting the emergence of mobile computing and the cloud
Top-Down VLSI Design: From Architectures to Gate-Level Circuits and FPGAs represents a unique approach to learning digital design. Developed from more than 20 years teaching circuit design, Doctor Kaeslin's approach follows the natural VLSI design flow and makes circuit design accessible for professionals with a background in systems engineering or digital signal processing. It begins with hardware architecture and promotes a system-level view, first considering the type of intended application and letting that guide your design choices. Doctor Kaeslin presents modern considerations for handling circuit complexity, throughput, and energy efficiency while preserving functionality. The book focuses on application-specific integrated circuits (ASICs), which along with FPGAs are increasingly used to develop products with applications in telecommunications, IT security, biomedical, automotive, and computer vision industries. Topics include field-programmable logic, algorithms, verification, modeling hardware, synchronous clocking, and more. - Demonstrates a top-down approach to digital VLSI design. - Provides a systematic overview of architecture optimization techniques. - Features a chapter on field-programmable logic devices, their technologies and architectures. - Includes checklists, hints, and warnings for various design situations. - Emphasizes design flows that do not overlook important action items and which include alternative options when planning the development of microelectronic circuits.