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Annotation Contains 24 papers from the November, 1998 symposium of the same name, sponsored by the ASTM Committee E8 on Fatigue and Fracture, and presented by Newman and Piascik (both of the NASA Langley Research Center). The papers focus on such areas as fatigue-crack growth threshold mechanisms, loading and specimen-type effects, analyses of fatigue-crack-growth-threshold behavior, and applications of threshold concepts and endurance limits to aerospace and structural materials. Annotation copyrighted by Book News, Inc., Portland, OR.
Various stochastic models for fatigue crack propagation under either constant amplitude or spectrum loadings have been investigated. These models are based on the assumption that the crack growth rate is a lognormal random process, including the general lognormal random process, lognormal white noise process, lognormal random variable, and second moment approximations, such as Weibull, gamma, lognormal and Gaussian closure approximations. Extensive experimental data have been used for the correlation study with various stochastic models. These include fastener hole specimens under fighter or bomber spectrum laodings and center-cracked specimens under constant amplitude loads. The data sets for the fastener hole specimens cover adequately different loading conditions, environments, load transfers and crack size range. It is shown that the white noise process is definitely not a valid model for fatigue crack propagation.
The importance of the nanoscale effects has been recognized in materials research for over fifty years, but it is only recently that advanced characterization and fabrication methods are enabling scientists to build structures atom-by-atom or molecule-by molecule. The understanding and control of the nanostructure has been, to a large extent, made possible by new atomistic analysis and characterization methods pioneered by transmission electron microscopy. Nano and Microstructural Design of Advanced Materials focuses on the effective use of such advanced analysis and characterization techniques in the design of materials. - Teaches effective use of advanced analysis and characterization methods at an atomistic level - Contains many supporting examples of materials in which such design concepts have been successfully applied
This book fulfills the need for a short, modern, introductory text on linear elastic fracture mechanics and its engineering applications. Suitable for use by engineering undergraduates, and other newcomers to the subject, it:- • Explains the main ideas underlying present day linear elastic fracture mechanics and how these have been developed. • Shows how the ideas can be used to carry out calculations answering the question 'Does this crack matter?' from the viewpoint of an engineering designer. • Provides an understanding of the basis of standard methods and software employed to carry out calculations. • Includes additional, more advanced material, where this will increase understanding of the sometimes formidable mathematics involved, and of the various simplifications and approximations used in practical applications. The author includes all the material central to an undergraduate introductory course and ends each chapter with an overview of the material covered to aid accessibility. Familiarity with the mechanical properties of metallic materials, and with the linear elastic stress analysis of uncracked bodies is assumed.
With the advent of the 80's there has been an increasing need for analytic and numerical techniques, based on a thorough understanding of microstructural processes, that express in a manner suitable for practicing engineers the reliability of components and structures that are being subjected to degradation situations. Such situations fall within the framework offracture mechanics, fatigue, corrosion fatigue and pitting corrosion. Luckily, such techniques are now being developed and it was felt timely to combine in one volume reports by the leaders in this field who are currently making great strides towards solving these problems. Hence the idea of this monograph was born and I am pleased to be associated both with it and the contributors whose chapters are included in this volume. A very large part of the credit for this monograph must go to the authors who have taken time out from their busy schedules to prepare their submissions. They have all worked diligently over the last few months in order to get their manuscripts to me on time and I sincerely thank them for their help throughout the preparation of this volume.