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An Advanced Study Institute on Fast Electrical and Optical Diagnostic Principles and Techniques was held at II Ciocco, Castelvecchio Pascoli, Italy, 10-24 July 1983. This publication is the Proceedings from that Institute. The Institute was attended by ninety-seven participants representing the United States, West Germany, the United Kingdom, Switzerland, Norway, the Netherlands, Italy, and France. The objective of the Institute was to provide a broad but comprehensive presentation of the various measurement and analy sis techniques that can be employed to investigate fast physical events, nominally in the sub-microsecond regime. This requires both an understanding of the basic principles underlying the diagnostic employed and its limitations, and a knowledge of the practical techniques available to obtain reliable and repeatable data. This Institute was thus structured to begin tutorially, followed by more practical techniques, demonstrations, and discussions. The Institute was divided into the following major sections: (1) Overview of Applications and Needs; (2) Voltage and Current Measurements; (3) Data Acquisition; (4) Grounding and Shield ing; (5) Fast Photography; (6) Refractive Index Measurements; (7) X-ray Diagnostics; (8) Spectroscopy; and (9) Active Opti cal Techniques. This Proceeding has been divided into two separate volumes. Volume 1, Current and Voltage Measurements, includes Sections (1) through (4) above; Volume 2, Optical Meas urements, includes Sections (5) through (9).
Practical Partial Discharge Measurement on Electrical Equipment Accessible reference dealing with (partial discharge) PD measurement in all types of high voltage equipment using modern digital PD detectors Practical Partial Discharge Measurement on Electrical Equipment is a timely update in the field of partial discharges (PD), covering both holistic concepts and specific modern applications in one volume. The first half of the book educates the reader on what PD is and the general principles of how it is measured and interpreted. The second half of the book is similar to a handbook, with a chapter devoted to PD measurements in each type of high voltage (HV) equipment. These chapters contain specific information of the insulation system design, causes of PD in that equipment, off-line and on-line measurement methods, interpretation methods, and relevant standards. The work is authored by four well-known experts in the field of PD measurement who have published hundreds of technical papers on the subject and performed thousands of PD measurements on all the different types of HV equipment covered in the book. The authors have also had relationships with PD detector manufacturers, giving them key insights into test instruments and practical measurements. Sample topics covered in the work include: Physics of PD, discharge phenomena (contact sparking and vibration sparking), and an introduction to PD measurement (electrical, optical, acoustic, and chemical) Electrical PD detection (types of sensors), RF PD detection (antenna, TEV), and PD instrumentation and display Off-line and on-line PD measurements, general principles of PD interpretation, and laboratory PD testing of lumped test objects PD in different types of HV equipment (power cables, power transformers, air insulated metal-clad switchgear, rotating machines, gas-insulated switchgear, and more) For HV equipment OEMs, users of HV equipment, or employees of companies that provide PD testing services to clients, Practical Partial Discharge Measurement on Electrical Equipment is an essential reference to help understand general concepts about the topic and receive expert guidance during specific practical applications.
Proceedings of the NATO Advanced Study Institute on Fast Electrical and Optical Diagnostic Principles and Techniques, Il Ciocco, Castelvecchio Pascoli, Italy, July 10-24, 1983
Describes and illustrates various modeling techniques which are applicable to the area of EMC and includes material previously available only in international reports or other hard-to-obtain references. Electromagnetic topology, lumped-parameter circuit models, the radiation process, scalar diffraction theory for apertures, transmission line modeling, and models for shielding are among the topics discussed. The accompanying disk contains four programs based on the models developed in the text and can be used to calculate diverse transmission line responses.
An Advanced Study Institute on Fast Electrical and Optical Diagnostic Principles and Techniques was held at II Ciocco, Castelvecchio Pascoli, Italy, 10-24 July 1983. This publication is the Proceedings from that Institute. The Institute was attended by ninety-seven participants representing the United States, West Germany, the United Kingdom, Switzerland, Norway, the Netherlands, Italy, and France. The objective of the Institute was to provide a broad but comprehensive presentation of the various measurement and analy sis techniques that can be employed to investigate fast physical events, nominally in the sub-microsecond regime. This requires both an understanding of the basic principles underlying the diagnostic employed and its limitations, and a knowledge of the practical techniques available to obtain reliable and repeatable data. This Institute was thus structured to begin tutorially, followed by more practical techniques, demonstrations, and discussions. The Institute was divided into the following major sections: (1) Overview of Applications and Needs; (2) Voltage and Current Measurements; (3) Data Acquisition; (4) Grounding and Shield ing; (5) Fast Photography; (6) Refractive Index Measurements; (7) X-ray Diagnostics; (8) Spectroscopy; and (9) Active Opti cal Techniques. This Proceeding has been divided into two separate volumes. Volume 1, Current and Voltage Measurements, includes Sections (1) through (4) above; Volume 2, Optical Meas urements, includes Sections (5) through (9).
The purpose of this book is two-fold. First, the various different methods of accessing the THz range are discussed, with a view to convince the reader that there have been qualitative and significant improvements over older, more conventional techniques. The text makes it clear that these improvements enable practical "real-world" applications of THz technology, in a manner which would not have been possible before. Second, the demonstrations and feasibility tests described serve as compelling evidence of the utility of such devices. Due to the unique characteristics of THz radiation and its interaction with materials, these devices have substantial advantages over other competing technologies in a number of different areas.