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This major textbook covers all the modules for ECDL Version 4. Written in a straightforward, easy-to-follow style and including sample test questions, this title should be a useful resource for all students studying for the ECDL (European Computer Driving Licence) qualification.
This textbook covers Module 7: Information and Communication for ECDL version 4. Written in a straightforward style, this book will be a useful guide for students studying for the ECDL (European Computer Driving Licence) qualification.
This updated version of an ECDL learning aid now covers the full ECDL 4 syllabus. Practical exercises for ECDL 4 reinforce students' learning and help them prepare for and pass the ECDL test. Providing a set of exercises for each module, the book tests students' knowledge of the syllabus. It progresses to a reasonably advanced level.
Pass ECDL5 Using Microsoft Office 2007, covers the full ECDL syllabus providing everything learners need in an accessible, user-friendly format. This title includes step-by-step instructions and screenshots that guide students through the learning points enabling them to develop all the skills they need to pass the test. Learning objectives of each module are outlined clearly in an introduction, and throughout the book Ask yourself' sections help students to check that they have met all the criteria. Mock tests offer practice and help to build students' confidence, and are also linked to the syllabus references making it easy for teachers to identify any weaker areas amongst their learners. A downloadable grid shows how the book matches the syllabus giving peace of mind that students are covering what they need to.
Focuses on the rapidly developing field of sensor technology for process monitoring and control during the fabrication of advanced materials and structures. Of high interest among the 39 papers are sensor-driven, closed-loop control of the fabrication process and product-state monitoring. Among the processes considered are several forms of vapor deposition, molecular beam epitaxy, rapid thermal processing, reactive-ion and plasma etching, electron beam evaporation, and sputtering. Monitoring variable such as temperature, composition, and thickness are described for a range of materials including electronic and optical thin-films, particles, and nanostructures. Annotation copyrighted by Book News, Inc., Portland, OR