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This volume collects the proceedings of the 23rd International Course of Crystallography, entitled "X-ray and Neutron Dynamical Diffraction, Theory and Applications," which took place in the fascinating setting of Erice in Sicily, Italy. It was run as a NATO Advanced Studies Institute with A. Authier (France) and S. Lagomarsino (Italy) as codirectors, and L. Riva di Sanseverino and P. Spadon (Italy) as local organizers, R. Colella (USA) and B. K. Tanner (UK) being the two other members of the organizing committee. It was attended by about one hundred participants from twenty four different countries. Two basic theories may be used to describe the diffraction of radiation by crystalline matter. The first one, the so-called geometrical, or kinematical theory, is approximate and is applicable to small, highly imperfect crystals. It is used for the determination of crystal structures and describes the diffraction of powders and polycrystalline materials. The other one, the so-called dynamical theory, is applicable to perfect or nearly perfect crystals. For that reason, dynamical diffraction of X-rays and neutrons constitutes the theoretical basis of a great variety of applications such as: • the techniques used for the characterization of nearly perfect high technology materials, semiconductors, piezoelectric, electrooptic, ferroelectric, magnetic crystals, • the X-ray optical devices used in all modem applications of Synchrotron Radiation (EXAFS, High Resolution X-ray Diffractometry, magnetic and nuclear resonant scattering, topography, etc. ), and • X-ray and neutron interferometry.
(Historical Survey) The discovery of X-ray diffraction in crystals by LAUE, FRIDRICH and KNIPPING in 1912 [1.1] served as the starting pOint for the development of scientific research along a number of important lines. We shall discuss just a few of them. The above discovery convincingly demonstrated the wave properties of X-rays. This, together with the previously established electromagnetic nature of radiation, confirmed the hypothesis that X-rays form the short-wave part of the electromagnetic spectrum. Further, this discovery was the first and decisive experimental proof of the periodic structure of crystals. In fact, theoretical crystallography had already arrived at this conclusion, mainly as an outcome of the theory of the space groups of symmetry elaborated by FEDOROV [1.2] and SCHOENFLIES [1.3]. From the optics of visible light we know that the radiation of a wave length of the same order as, and preferably less than, the period of a grat ing suffers diffraction on periodic objects of the type of optical grating. Thus, the discovery proved that the wavelength of an X-ray must be of the order of interatomic distances. It became clear why the visible light of wavelengths exceeding the crystal lattice periods by about 500 to 1000 times failed to reveal the periodic structure of crystals in diffraction experi ments.
X-Ray Diffraction Topography presents an elementary treatment of X-ray topography which is comprehensible to the non-specialist. It discusses the development of the principles and application of the subject matter. X-ray topography is the study of crystals which use x-ray diffraction. Some of the topics covered in the book are the basic dynamical x-ray diffraction theory, the Berg-Barrett method, Lang’s method, double crystal methods, the contrast on x-ray topography, and the analysis of crystal defects and distortions. The crystals grown from solution are covered. The naturally occurring crystals are discussed. The text defines the meaning of melt, solid state and vapour growth. An analysis of the properties of inorganic crystals is presented. A chapter of the volume is devoted to the characteristics of metals. Another section of the book focuses on the production of ice crystals and the utilization of oxides as laser materials. The book will provide useful information to chemists, scientists, students and researchers.
X-ray multiple-wave diffraction, sometimes called multiple diffraction or N-beam diffraction, results from the scattering of X-rays from periodic two or higher-dimensional structures, like 2-d and 3-d crystals and even quasi crystals. The interaction of the X-rays with the periodic arrangement of atoms usually provides structural information about the scatterer. Unlike the usual Bragg reflection, the so-called two-wave diffraction, the multiply diffracted intensities are sensitive to the phases of the structure factors in volved. This gives X-ray multiple-wave diffraction the chance to solve the X-ray phase problem. On the other hand, the condition for generating an X ray multiple-wave diffraction is much more strict than in two-wave cases. This makes X-ray multiple-wave diffraction a useful technique for precise measure ments of crystal lattice constants and the wavelength of radiation sources. Recent progress in the application of this particular diffraction technique to surfaces, thin films, and less ordered systems has demonstrated the diver sity and practicability of the technique for structural research in condensed matter physics, materials sciences, crystallography, and X-ray optics. The first book on this subject, Multiple Diffraction of X-Rays in Crystals, was published in 1984, and intended to give a contemporary review on the fundamental and application aspects of this diffraction.
Designed for the undergraduate and postgraduate students of physics, materials science and metallurgical engineering, this text explains the theory of X-ray diffraction starting from diffraction by an electron to that by an atom, a crystal, and finally ending with a diffraction by a conglomerate of atoms either in the single crystal or in the polycrystal stage. This Second Edition of the book includes a new chapter on Electron Diffraction as electron diffraction along with X-ray diffraction are complementary to each other and are also included in the curriculum. The book amply blends the theory with major applications of X-ray diffraction, including those of direct analysis of lattice defects by X-ray topography, orientation texture analysis, chemical analysis by diffraction as well as by fluorescence. KEY FEATURES : Set of numerical problems along with solutions Details of some different experimental techniques Unsolved problems and Review Questions to grasp the concepts.
Diffraction and Imaging Techniques in Material Science reviews recent developments in diffraction and imaging techniques used in the study of materials. It discusses advances in high-voltage electron microscopy, low-energy electron diffraction (LEED), X-ray and neutron diffraction, X-ray topography, mirror electron microscopy, and field emission microscopy. Organized into five parts encompassing nine chapters, this volume begins with an overview of the dynamical theory of the diffraction of high-energy electrons in crystals and methodically introduces the reader to dynamical diffraction in perfect and imperfect crystals, inelastic scattering of electrons in crystals, and X-ray production. It then explores back scattering effects, the technical features of high-voltage electron microscopes, and surface characterization by LEED. Other chapters focus on the kinematical theory of X-ray diffraction, techniques and interpretation in X-ray topography, and interpretation of the contrast of the images of defects on X-ray topographs. The book also describes theory and applications of mirror electron microscopy, surface studies by field emission of electrons, field ionization and field evaporation, and gas-surface interactions before concluding with a discussion on lattice imperfections. Scientists and students taking courses on diffraction and solid-state electron microscopy will benefit from this book.
Advances in Structure Research by Diffraction Methods reviews advances in the use of diffraction methods in structure research. Topics covered include the dynamical theory of X-ray diffraction, with emphasis on Ewald waves in theory and experiment; dynamical theory of electron diffraction; small angle scattering; and molecular packing. This book is comprised of four chapters and begins with an overview of the dynamical theory of X-ray diffraction, especially in terms of how it explains all the absorption and propagation properties of X-rays at the Bragg setting in a perfect crystal. The next chapter describes the dynamical theory of electron diffraction, paying particular attention to unconventional structure analysis in connection with the problems of absorption. The most important features of the background of small angle analysis are then examined, and some examples showing the direct analysis of small angle scattering (sometimes in combination with wide angle scattering) are provided. The last chapter deals with crystals built from molecules and their peculiar geometrical features. The principle of close packing of molecules in an organic crystal is also described, along with lattice dynamics, hydrogen bonds in crystals, and the rotational crystalline state. This monograph will be a useful resource for practitioners and researchers in physics and crystallography.