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This book presents an Ultrafast Low-Energy Electron Diffraction (ULEED) system that reveals ultrafast structural changes on the atomic scale. The achievable temporal resolution in the low-energy regime is improved by several orders of magnitude and has enabled the melting of a highly-sensitive, molecularly thin layer of a polymer crystal to be resolved for the first time. This new experimental approach permits time-resolved structural investigations of systems that were previously partially or totally inaccessible, including surfaces, interfaces and atomically thin films. It will be of fundamental importance for understanding the properties of nanomaterials so as to tailor their properties.
Advances in Imaging & Electron Physics merges two long-running serials—Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. - Contains contributions from leading authorities on the subject matter - Informs and updates on all the latest developments in the field of imaging and electron physics - Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable resource - Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science. and digital image processing
TEM and SEM have contributed greatly to the progress of various research fields, which has been accelerated in the last few decades by highly functional electron microscopes and microscopy. In this tide of microscopy, various microscopic methods have been developed to make clear many unsolved problems, e.g. pulse beam TEM, environmental microscopy, correlative microscopy, etc. In this book, a number of reviews have been collected concerning these subjects. We think that the content in each chapter is impressive, and we hope this book will contribute to future advances in electron microscopy, materials science, and biomedicine.
Structural phase transitions, mechanical deformations, and the embryonic stages of melting and crystallization are examples of phenomena that can now be imaged in unprecedented structural detail with high spatial resolution, and ten orders of magnitude as fast as hitherto. No monograph in existence attempts to cover the revolutionary dimensions that EM in its various modes of operation nowadays makes possible. The authors of this book chart these developments, and also compare the merits of coherent electron waves with those of synchrotron radiation. They judge it prudent to recall some important basic procedural and theoretical aspects of imaging and diffraction so that the reader may better comprehend the significance of the new vistas and applications now afoot. This book is not a vade mecum - numerous other texts are available for the practitioner for that purpose.
?Density Waves in Solids is written for graduate students and scientists interested in solid-state sciences. It discusses the theoretical and experimental state of affairs of two novel types of broken symmetry ground states of metals, charge, and spin density waves. These states arise as the consequence of electron-phonon and electron-electron interactions in low-dimensional metals.Some fundamental aspects of the one-dimensional electron gas, and of the materials with anisotropic properties, are discussed first. This is followed by the mean field theory of the phases transitions?discussed using second quantized formalism?together with the various experimental observations on the transition and on the ground states. Fluctuation effects and the collective excitations are reviewed next, using the Ginzburg-Landau formalism, followed by the review of the interaction of these states with the underlying lattice and with impurities. The final chapters are devoted to the response of the ground states to external perturbations.
2.6.2 Electrodes for Electrochemistry
This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.
Handbook of Mineral Spectroscopy, Volume 1: X-ray Photoelectron Spectra presents a database of X-ray Photoelectron spectra showing both survey (with chemical analysis) and high-resolution spectra of more than 200 rock-forming and major ore minerals. XPS of minerals is a very powerful technique for analyzing not only the chemical composition of minerals – including, for other techniques, difficult elements such as F and Cl, but also the local environment of atoms in a crystal structure. The book includes a section on silicates and on non-silicates, and is further subdivided according to the normal mineral classes. - Brings together and expands upon the limited information available on the XPS of minerals into one handbook - Features 2,500 full color, X-ray Photoelectron survey and high-resolution Spectra for use by researchers in the lab and as a reference - Includes the chemical information of each mineral - Written by experts with more than 50 years of combined mineral spectroscopy experience
Revised and expanded second edition of the standard work on new techniques for studying solid surfaces.